In situ high-temperature X-ray diffraction analysis of Mg2Si formation kinetics via reaction of Mg films with Si single crystal substrates

Journal Article · 28 February 2018 · Intermetallics

DOI: https://doi.org/10.1016/j.intermet.2018.01.003 · OSTI ID:1548717

Gordin, Ari S.; Sandhage, Kenneth H.

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• Sponsoring Organization: USDOE
• Grant/Contract Number: SC0014034
• OSTI ID: 1548717
• Journal Information: Intermetallics, Journal Name: Intermetallics Journal Issue: C Vol. 94; ISSN 0966-9795
• Publisher: ElsevierCopyright Statement
• Country of Publication: United Kingdom
• Language: English