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Title: A thermally cross-linked hole-transporting film with the remarkable solvent resistance for solution-processed OLEDs

Authors:
; ; ORCiD logo; ; ; ; ORCiD logo;
Publication Date:
Sponsoring Org.:
USDOE Office of Electricity Delivery and Energy Reliability (OE), Power Systems Engineering Research and Development (R&D) (OE-10)
OSTI Identifier:
1548565
Grant/Contract Number:  
2016YFB0401303
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Organic Electronics
Additional Journal Information:
Journal Name: Organic Electronics Journal Volume: 57 Journal Issue: C; Journal ID: ISSN 1566-1199
Publisher:
Elsevier
Country of Publication:
Netherlands
Language:
English

Citation Formats

Zhang, Yuteng, Wang, Xue, Li, Xianggao, Wang, Shirong, Pan, Yichen, Zhong, Zhiming, Ying, Lei, and Xiao, Yin. A thermally cross-linked hole-transporting film with the remarkable solvent resistance for solution-processed OLEDs. Netherlands: N. p., 2018. Web. doi:10.1016/j.orgel.2018.03.034.
Zhang, Yuteng, Wang, Xue, Li, Xianggao, Wang, Shirong, Pan, Yichen, Zhong, Zhiming, Ying, Lei, & Xiao, Yin. A thermally cross-linked hole-transporting film with the remarkable solvent resistance for solution-processed OLEDs. Netherlands. doi:10.1016/j.orgel.2018.03.034.
Zhang, Yuteng, Wang, Xue, Li, Xianggao, Wang, Shirong, Pan, Yichen, Zhong, Zhiming, Ying, Lei, and Xiao, Yin. Fri . "A thermally cross-linked hole-transporting film with the remarkable solvent resistance for solution-processed OLEDs". Netherlands. doi:10.1016/j.orgel.2018.03.034.
@article{osti_1548565,
title = {A thermally cross-linked hole-transporting film with the remarkable solvent resistance for solution-processed OLEDs},
author = {Zhang, Yuteng and Wang, Xue and Li, Xianggao and Wang, Shirong and Pan, Yichen and Zhong, Zhiming and Ying, Lei and Xiao, Yin},
abstractNote = {},
doi = {10.1016/j.orgel.2018.03.034},
journal = {Organic Electronics},
number = C,
volume = 57,
place = {Netherlands},
year = {2018},
month = {6}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1016/j.orgel.2018.03.034

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Cited by: 2 works
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