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Title: Intrinsic shape of free carrier absorption spectra in 4H-SiC

Abstract

Free carrier absorption spectra are measured along the different polarization directions with respect to the c-axis of 4H-SiC using ultrafast differential transmission spectroscopy. Probing of excited carrier spectra in an undoped material reveals intrinsic resonances within the conduction band. Widths of the detected resonance peaks are shown to be wider than their theoretical estimates and more comparable to the ones observed in a low doped material. Relative strength of the peaks, on the other hand, is shown to be nearly excitation independent in contrast to the doping induced absorption weakening for the same transitions in n-type samples. Finally, free carrier cross sections are extracted from the excitation dependency of the detected spectra and linked to the individual electron and hole contributions in the near infrared range.

Authors:
ORCiD logo [1];  [2];  [2];  [1];  [1];  [1];  [1];  [2]; ORCiD logo [2]
  1. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
  2. Vilnius Univ., Vilnius (Lithuania)
Publication Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1548396
Alternate Identifier(s):
OSTI ID: 1525494
Report Number(s):
LLNL-JRNL-761383
Journal ID: ISSN 0021-8979; 949302
Grant/Contract Number:  
AC52-07NA27344; 17-ERD-050
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 125; Journal Issue: 22; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS

Citation Formats

Grivickas, P., Redeckas, K., Gulbinas, K., Conway, A. M., Voss, L. F., Bora, M., Sampayan, S., Vengris, M., and Grivickas, V. Intrinsic shape of free carrier absorption spectra in 4H-SiC. United States: N. p., 2019. Web. doi:10.1063/1.5095161.
Grivickas, P., Redeckas, K., Gulbinas, K., Conway, A. M., Voss, L. F., Bora, M., Sampayan, S., Vengris, M., & Grivickas, V. Intrinsic shape of free carrier absorption spectra in 4H-SiC. United States. https://doi.org/10.1063/1.5095161
Grivickas, P., Redeckas, K., Gulbinas, K., Conway, A. M., Voss, L. F., Bora, M., Sampayan, S., Vengris, M., and Grivickas, V. Fri . "Intrinsic shape of free carrier absorption spectra in 4H-SiC". United States. https://doi.org/10.1063/1.5095161. https://www.osti.gov/servlets/purl/1548396.
@article{osti_1548396,
title = {Intrinsic shape of free carrier absorption spectra in 4H-SiC},
author = {Grivickas, P. and Redeckas, K. and Gulbinas, K. and Conway, A. M. and Voss, L. F. and Bora, M. and Sampayan, S. and Vengris, M. and Grivickas, V.},
abstractNote = {Free carrier absorption spectra are measured along the different polarization directions with respect to the c-axis of 4H-SiC using ultrafast differential transmission spectroscopy. Probing of excited carrier spectra in an undoped material reveals intrinsic resonances within the conduction band. Widths of the detected resonance peaks are shown to be wider than their theoretical estimates and more comparable to the ones observed in a low doped material. Relative strength of the peaks, on the other hand, is shown to be nearly excitation independent in contrast to the doping induced absorption weakening for the same transitions in n-type samples. Finally, free carrier cross sections are extracted from the excitation dependency of the detected spectra and linked to the individual electron and hole contributions in the near infrared range.},
doi = {10.1063/1.5095161},
journal = {Journal of Applied Physics},
number = 22,
volume = 125,
place = {United States},
year = {Fri Jun 14 00:00:00 EDT 2019},
month = {Fri Jun 14 00:00:00 EDT 2019}
}

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