Design considerations for three-dimensional betavoltaics

Murphy, John W.; Voss, Lars F.; Frye, Clint D.; Shao, Qinghui; Kazkaz, Kareem; Stoyer, Mark A.; Henderson, Roger A.; Nikolic, Rebecca J.

doi:10.1063/1.5097775

Title: Design considerations for three-dimensional betavoltaics

Journal Article · 14 June 2019 · AIP Advances

DOI: https://doi.org/10.1063/1.5097775 · OSTI ID:1548378

Murphy, John W. ^[1]; Voss, Lars F. ^[1];

^[1]; Shao, Qinghui ^[1]; Kazkaz, Kareem ^[1]; Stoyer, Mark A. ^[1]; Henderson, Roger A. ^[1]; Nikolic, Rebecca J. ^[1]

Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)

Betavoltaic devices are suitable for delivering low-power over periods of years. Typically, their power density is on the order of nano to micro-Watts per cubic centimeter. In this work we evaluate the potential for using high-aspect ratio three-dimensional semiconductor structures to enhance the power and efficiency of these devices. The Monte Carlo transport code MCNP6 is used to provide realistic estimates of the theoretical levels of charge generation, which is in turn used to make predictions about the power output from three-dimensional betavoltaics. The focus of this work is on silicon and promethium-147, but other semiconductors and radioisotopes are considered as well. In the case of silicon diodes with three-dimensional features that are comparable to what is commercially available we estimate that power densities in the range of 20-25 mW/cm³ can be achieved at efficiencies of 2.9-5.8% when coupled with promethium-147 oxide.

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Research Organization:: Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

Grant/Contract Number:: AC52-07NA27344; AC52-07NA27344,LLNL-ABS-747873

OSTI ID:: 1548378

Alternate ID(s):: OSTI ID: 1526337

Report Number(s):: LLNL-JRNL-763286; 951591

Journal Information:: AIP Advances, Vol. 9, Issue 6; ISSN 2158-3226

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 16 works

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