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Title: High x-ray resolving power utilizing asymmetric diffraction from a quartz transmission crystal measured in the 6 keV to 22 keV energy range

Abstract

We report a Cauchois-type spectrometer utilizing the (203) lattice planes at an oblique angle of 11.53° to the normal to the surface of a quartz transmission crystal recorded the Kα and Kβ spectral lines of six elements from Fe to Ag in the 6–22 keV energy range from a laboratory x-ray source. After deconvolving the natural lifetime widths and the image plate detector broadening from the observed spectral linewidths, the intrinsic crystal resolving power was determined to be 4000 at the lower energies and decreasing to 1000 at the higher energies. Previously, a Si wafer crystal exhibited twice this resolving power when the (331) planes had been used in asymmetric geometry. The investigation of diffraction with this quartz crystal, with a very similar lattice spacing and therefore spectral coverage, was motivated by the larger integrated reflectivity of quartz due to its well-known quasimosaicity upon elastic bending. The measured spectral linewidths were in good agreement with the widths calculated by accounting for various broadening mechanisms, including source size, crystal thickness, crystal height, crystal rocking curve width, geometrical aberrations, and possible spectrometer configuration errors. This is the first, to the best of our knowledge, demonstration of high resolving power achieved by asymmetricmore » diffraction over a wide energy range (6–22 keV) and with detailed comparisons with theoretical broadenings. Finally, based on these results, Cauchois spectrometers employing asymmetric planes of perfect quartz and silicon crystals can be reliably designed and optimized for high-resolution spectroscopy in the >6 keV energy range.« less

Authors:
 [1];  [2];  [1];  [1];  [3]
+ Show Author Affiliations
  1. National Inst. of Standards and Technology (NIST), Gaithersburg, MD (United States)
  2. SLAC National Accelerator Lab., Menlo Park, CA (United States)
  3. Artep Inc., Ellicott City, MD (United States)
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Fusion Energy Sciences (FES)
OSTI Identifier:
1546963
Alternate Identifier(s):
OSTI ID: 1529437
Grant/Contract Number:  
AC02-76SF00515; SF00515
Resource Type:
Accepted Manuscript
Journal Name:
Applied Optics
Additional Journal Information:
Journal Volume: 58; Journal Issue: 19; Journal ID: ISSN 1559-128X
Publisher:
Optical Society of America
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Seely, John F., Galtier, Eric, Hudson, Lawrence T., Henins, Albert, and Feldman, Uri. High x-ray resolving power utilizing asymmetric diffraction from a quartz transmission crystal measured in the 6 keV to 22 keV energy range. United States: N. p., 2019. Web. doi:10.1364/ao.58.005225.
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Seely, John F., Galtier, Eric, Hudson, Lawrence T., Henins, Albert, & Feldman, Uri. High x-ray resolving power utilizing asymmetric diffraction from a quartz transmission crystal measured in the 6 keV to 22 keV energy range. United States. https://doi.org/10.1364/ao.58.005225
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Seely, John F., Galtier, Eric, Hudson, Lawrence T., Henins, Albert, and Feldman, Uri. Thu . "High x-ray resolving power utilizing asymmetric diffraction from a quartz transmission crystal measured in the 6 keV to 22 keV energy range". United States. https://doi.org/10.1364/ao.58.005225. https://www.osti.gov/servlets/purl/1546963.
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@article{osti_1546963,
title = {High x-ray resolving power utilizing asymmetric diffraction from a quartz transmission crystal measured in the 6 keV to 22 keV energy range},
author = {Seely, John F. and Galtier, Eric and Hudson, Lawrence T. and Henins, Albert and Feldman, Uri},
abstractNote = {We report a Cauchois-type spectrometer utilizing the (203) lattice planes at an oblique angle of 11.53° to the normal to the surface of a quartz transmission crystal recorded the Kα and Kβ spectral lines of six elements from Fe to Ag in the 6–22 keV energy range from a laboratory x-ray source. After deconvolving the natural lifetime widths and the image plate detector broadening from the observed spectral linewidths, the intrinsic crystal resolving power was determined to be 4000 at the lower energies and decreasing to 1000 at the higher energies. Previously, a Si wafer crystal exhibited twice this resolving power when the (331) planes had been used in asymmetric geometry. The investigation of diffraction with this quartz crystal, with a very similar lattice spacing and therefore spectral coverage, was motivated by the larger integrated reflectivity of quartz due to its well-known quasimosaicity upon elastic bending. The measured spectral linewidths were in good agreement with the widths calculated by accounting for various broadening mechanisms, including source size, crystal thickness, crystal height, crystal rocking curve width, geometrical aberrations, and possible spectrometer configuration errors. This is the first, to the best of our knowledge, demonstration of high resolving power achieved by asymmetric diffraction over a wide energy range (6–22 keV) and with detailed comparisons with theoretical broadenings. Finally, based on these results, Cauchois spectrometers employing asymmetric planes of perfect quartz and silicon crystals can be reliably designed and optimized for high-resolution spectroscopy in the >6 keV energy range.},
doi = {10.1364/ao.58.005225},
journal = {Applied Optics},
number = 19,
volume = 58,
place = {United States},
year = {2019},
month = {6}
}
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Journal Article:
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Publisher's Version of Record
https://doi.org/10.1364/ao.58.005225
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Figures / Tables:

Fig. 1 Fig. 1: Schematic of the quartz crystal used in Cauchois geometry.
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Works referenced in this record:

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Tunable hard X-ray spectrometer utilizing asymmetric planes of a quartz transmission crystal
journal, May 2016

  • Seely, John F.; Henins, Albert; Feldman, Uri
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  • DOI: 10.1063/1.4947495

Enhanced x-ray resolving power achieved behind the focal circles of Cauchois spectrometers
journal, January 2008

  • Seely, John F.; Hudson, Lawrence T.; Holland, Glenn E.
  • Applied Optics, Vol. 47, Issue 15
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XOP v2.4: recent developments of the x-ray optics software toolkit
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  • Sánchez del Río, Manuel; Dejus, Roger J.
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    Figures / Tables found in this record:

    Fig. 1 (p. 2)figure
    Fig. 2 (p. 2)figure
    Table 1 (p. 2)table
    Fig. 3 (p. 3)figure
    Fig. 4 (p. 4)figure
    Table 2 (p. 4)table
    Fig. 5 (p. 5)figure
    Fig. 6 (p. 5)figure
    Table 3 (p. 5)table
    Fig. 7 (p. 6)figure
    Fig. 8 (p. 7)figure
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