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Title: Knife-edge based measurement of the 4D transverse phase space of electron beams with picometer-scale emittance

Abstract

Precise manipulation of high brightness electron beams requires detailed knowledge of the particle phase space shape and evolution. As ultrafast electron pulses become brighter, new operational regimes become accessible with emittance values in the picometer range, with enormous impact on potential scientific applications. Here we present a new characterization method for such beams and demonstrate experimentally its ability to reconstruct the 4D transverse beam matrix of strongly correlated electron beams with sub-nanometer emittance and sub-micrometer spot size, produced with the HiRES beamline at LBNL. Here, our work extends the reach of ultrafast electron accelerator diagnostics into picometer-range emittance values, opening the way to complex nanometer-scale electron beam manipulation techniques.

Authors:
 [1];  [2];  [2];  [3];  [3];  [1]
  1. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  2. Univ. of California, Los Angeles, CA (United States)
  3. Univ. of California, Berkeley, CA (United States); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Scientific User Facilities Division
OSTI Identifier:
1546837
Alternate Identifier(s):
OSTI ID: 1510771
Grant/Contract Number:  
AC02-05CH11231
Resource Type:
Published Article
Resource Relation:
Journal Volume: 22; Journal Issue: 8
Country of Publication:
United States
Language:
English

Citation Formats

Ji, Fuhao, Navarro, Jorge Giner, Musumeci, Pietro, Durham, Daniel, Minor, Andrew, and Filippetto, Daniele. Knife-edge based measurement of the 4D transverse phase space of electron beams with picometer-scale emittance. United States: N. p., 2019. Web. doi:10.1103/PhysRevAccelBeams.22.082801.
Ji, Fuhao, Navarro, Jorge Giner, Musumeci, Pietro, Durham, Daniel, Minor, Andrew, & Filippetto, Daniele. Knife-edge based measurement of the 4D transverse phase space of electron beams with picometer-scale emittance. United States. doi:10.1103/PhysRevAccelBeams.22.082801.
Ji, Fuhao, Navarro, Jorge Giner, Musumeci, Pietro, Durham, Daniel, Minor, Andrew, and Filippetto, Daniele. Tue . "Knife-edge based measurement of the 4D transverse phase space of electron beams with picometer-scale emittance". United States. doi:10.1103/PhysRevAccelBeams.22.082801.
@article{osti_1546837,
title = {Knife-edge based measurement of the 4D transverse phase space of electron beams with picometer-scale emittance},
author = {Ji, Fuhao and Navarro, Jorge Giner and Musumeci, Pietro and Durham, Daniel and Minor, Andrew and Filippetto, Daniele},
abstractNote = {Precise manipulation of high brightness electron beams requires detailed knowledge of the particle phase space shape and evolution. As ultrafast electron pulses become brighter, new operational regimes become accessible with emittance values in the picometer range, with enormous impact on potential scientific applications. Here we present a new characterization method for such beams and demonstrate experimentally its ability to reconstruct the 4D transverse beam matrix of strongly correlated electron beams with sub-nanometer emittance and sub-micrometer spot size, produced with the HiRES beamline at LBNL. Here, our work extends the reach of ultrafast electron accelerator diagnostics into picometer-range emittance values, opening the way to complex nanometer-scale electron beam manipulation techniques.},
doi = {10.1103/PhysRevAccelBeams.22.082801},
journal = {},
number = 8,
volume = 22,
place = {United States},
year = {2019},
month = {4}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1103/PhysRevAccelBeams.22.082801

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