Knife-edge based measurement of the 4D transverse phase space of electron beams with picometer-scale emittance
Abstract
Precise manipulation of high brightness electron beams requires detailed knowledge of the particle phase space shape and evolution. As ultrafast electron pulses become brighter, new operational regimes become accessible with emittance values in the picometer range, with enormous impact on potential scientific applications. Here we present a new characterization method for such beams and demonstrate experimentally its ability to reconstruct the 4D transverse beam matrix of strongly correlated electron beams with sub-nanometer emittance and sub-micrometer spot size, produced with the HiRES beamline at LBNL. Here, our work extends the reach of ultrafast electron accelerator diagnostics into picometer-range emittance values, opening the way to complex nanometer-scale electron beam manipulation techniques.
- Authors:
- Publication Date:
- Research Org.:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities Division
- OSTI Identifier:
- 1546837
- Alternate Identifier(s):
- OSTI ID: 1510771
- Grant/Contract Number:
- AC02-05CH11231
- Resource Type:
- Published Article
- Journal Name:
- Physical Review Accelerators and Beams
- Additional Journal Information:
- Journal Name: Physical Review Accelerators and Beams Journal Volume: 22 Journal Issue: 8; Journal ID: ISSN 2469-9888
- Publisher:
- American Physical Society
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 43 PARTICLE ACCELERATORS
Citation Formats
Ji, Fuhao, Navarro, Jorge Giner, Musumeci, Pietro, Durham, Daniel B., Minor, Andrew M., and Filippetto, Daniele. Knife-edge based measurement of the 4D transverse phase space of electron beams with picometer-scale emittance. United States: N. p., 2019.
Web. doi:10.1103/PhysRevAccelBeams.22.082801.
Ji, Fuhao, Navarro, Jorge Giner, Musumeci, Pietro, Durham, Daniel B., Minor, Andrew M., & Filippetto, Daniele. Knife-edge based measurement of the 4D transverse phase space of electron beams with picometer-scale emittance. United States. https://doi.org/10.1103/PhysRevAccelBeams.22.082801
Ji, Fuhao, Navarro, Jorge Giner, Musumeci, Pietro, Durham, Daniel B., Minor, Andrew M., and Filippetto, Daniele. Thu .
"Knife-edge based measurement of the 4D transverse phase space of electron beams with picometer-scale emittance". United States. https://doi.org/10.1103/PhysRevAccelBeams.22.082801.
@article{osti_1546837,
title = {Knife-edge based measurement of the 4D transverse phase space of electron beams with picometer-scale emittance},
author = {Ji, Fuhao and Navarro, Jorge Giner and Musumeci, Pietro and Durham, Daniel B. and Minor, Andrew M. and Filippetto, Daniele},
abstractNote = {Precise manipulation of high brightness electron beams requires detailed knowledge of the particle phase space shape and evolution. As ultrafast electron pulses become brighter, new operational regimes become accessible with emittance values in the picometer range, with enormous impact on potential scientific applications. Here we present a new characterization method for such beams and demonstrate experimentally its ability to reconstruct the 4D transverse beam matrix of strongly correlated electron beams with sub-nanometer emittance and sub-micrometer spot size, produced with the HiRES beamline at LBNL. Here, our work extends the reach of ultrafast electron accelerator diagnostics into picometer-range emittance values, opening the way to complex nanometer-scale electron beam manipulation techniques.},
doi = {10.1103/PhysRevAccelBeams.22.082801},
journal = {Physical Review Accelerators and Beams},
number = 8,
volume = 22,
place = {United States},
year = {2019},
month = {8}
}
Free Publicly Available Full Text
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https://doi.org/10.1103/PhysRevAccelBeams.22.082801
https://doi.org/10.1103/PhysRevAccelBeams.22.082801
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Cited by: 6 works
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Works referencing / citing this record:
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