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Title: Solid-state framing camera operating in interferometric mode

Abstract

A high speed solid-state framing camera has been created which can operate in interferometric mode. This camera measures the change in the index of refraction of a semiconductor when x-rays are incident upon it. This instrument uses an x-ray transmission grating/mask in front of the semiconductor to induce a corresponding phase grating in the semiconductor which can then be measured by an infrared probe beam. The probe beam scatters off of this grating, enabling a measure of the x-ray signal incident on the semiconductor. In this specific instrument, the zero-order reflected probe beam is attenuated and interfered with the diffracted orders to produce an interferometric image on a charge coupled device camera of the phase change induced inside the semiconductor by the incident x-rays.

Authors:
 [1];  [1];  [1];  [1];  [1]; ORCiD logo [1]
  1. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Publication Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC); USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1545487
Grant/Contract Number:  
[AC52-07NA27344]
Resource Type:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
[ Journal Volume: 89; Journal Issue: 10; Conference: 22. Proceedings of the Topical Conference on High-Temperature Plasma Diagnostics, San Diego, CA (United States), Apr 2018]; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
74 ATOMIC AND MOLECULAR PHYSICS

Citation Formats

Baker, K. L., Steele, P. T., Stewart, R. E., Vernon, S. P., Hsing, W. W., and Remington, B. A. Solid-state framing camera operating in interferometric mode. United States: N. p., 2018. Web. doi:10.1063/1.5038108.
Baker, K. L., Steele, P. T., Stewart, R. E., Vernon, S. P., Hsing, W. W., & Remington, B. A. Solid-state framing camera operating in interferometric mode. United States. doi:10.1063/1.5038108.
Baker, K. L., Steele, P. T., Stewart, R. E., Vernon, S. P., Hsing, W. W., and Remington, B. A. Fri . "Solid-state framing camera operating in interferometric mode". United States. doi:10.1063/1.5038108. https://www.osti.gov/servlets/purl/1545487.
@article{osti_1545487,
title = {Solid-state framing camera operating in interferometric mode},
author = {Baker, K. L. and Steele, P. T. and Stewart, R. E. and Vernon, S. P. and Hsing, W. W. and Remington, B. A.},
abstractNote = {A high speed solid-state framing camera has been created which can operate in interferometric mode. This camera measures the change in the index of refraction of a semiconductor when x-rays are incident upon it. This instrument uses an x-ray transmission grating/mask in front of the semiconductor to induce a corresponding phase grating in the semiconductor which can then be measured by an infrared probe beam. The probe beam scatters off of this grating, enabling a measure of the x-ray signal incident on the semiconductor. In this specific instrument, the zero-order reflected probe beam is attenuated and interfered with the diffracted orders to produce an interferometric image on a charge coupled device camera of the phase change induced inside the semiconductor by the incident x-rays.},
doi = {10.1063/1.5038108},
journal = {Review of Scientific Instruments},
number = [10],
volume = [89],
place = {United States},
year = {2018},
month = {8}
}

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Works referenced in this record:

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