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Title: A Model for the Characterization of the Polarizability of Thin Films Independently of the Thickness of the Film

Abstract

It is known that the dielectric properties of thin films can be modified relative to the bulk material because the interaction between film and substrate influences the mobility of the atoms or molecules in the first layers. Here we show that a strong scale effect occurs in nanometer size octadecylammine thin films. Here, this effect is attributed to the different distribution of molecules depending on the size of the film. To accurately describe this effect, we have developed a model which is a reinterpretation of the linearized Thomas-Fermi approximation. Within this model, we have been able to characterize the polarizability of thin films independently of the thickness of the film.

Authors:
ORCiD logo [1];  [2]; ORCiD logo [3]
  1. Univ. Autónoma de Madrid, Madrid (Spain)
  2. Institut de Ciència de Materials de Barcelona ICMAB-CSIC, Bellaterra (Spain)
  3. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1545137
Grant/Contract Number:  
[AC02-05CH11231]
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Physical Chemistry. B, Condensed Matter, Materials, Surfaces, Interfaces and Biophysical Chemistry
Additional Journal Information:
[ Journal Volume: 122; Journal Issue: 2]; Journal ID: ISSN 1520-6106
Publisher:
American Chemical Society
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY

Citation Formats

Sacha, G. M., Verdaguer, A., and Salmeron, M. A Model for the Characterization of the Polarizability of Thin Films Independently of the Thickness of the Film. United States: N. p., 2017. Web. doi:10.1021/acs.jpcb.7b06975.
Sacha, G. M., Verdaguer, A., & Salmeron, M. A Model for the Characterization of the Polarizability of Thin Films Independently of the Thickness of the Film. United States. doi:10.1021/acs.jpcb.7b06975.
Sacha, G. M., Verdaguer, A., and Salmeron, M. Tue . "A Model for the Characterization of the Polarizability of Thin Films Independently of the Thickness of the Film". United States. doi:10.1021/acs.jpcb.7b06975. https://www.osti.gov/servlets/purl/1545137.
@article{osti_1545137,
title = {A Model for the Characterization of the Polarizability of Thin Films Independently of the Thickness of the Film},
author = {Sacha, G. M. and Verdaguer, A. and Salmeron, M.},
abstractNote = {It is known that the dielectric properties of thin films can be modified relative to the bulk material because the interaction between film and substrate influences the mobility of the atoms or molecules in the first layers. Here we show that a strong scale effect occurs in nanometer size octadecylammine thin films. Here, this effect is attributed to the different distribution of molecules depending on the size of the film. To accurately describe this effect, we have developed a model which is a reinterpretation of the linearized Thomas-Fermi approximation. Within this model, we have been able to characterize the polarizability of thin films independently of the thickness of the film.},
doi = {10.1021/acs.jpcb.7b06975},
journal = {Journal of Physical Chemistry. B, Condensed Matter, Materials, Surfaces, Interfaces and Biophysical Chemistry},
number = [2],
volume = [122],
place = {United States},
year = {2017},
month = {10}
}

Journal Article:
Free Publicly Available Full Text
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Cited by: 1 work
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