skip to main content
DOE PAGES title logo U.S. Department of Energy
Office of Scientific and Technical Information

This content will become publicly available on June 19, 2020

Title: Bi-continuous pattern formation in thin films via solid-state interfacial dealloying studied by multimodal characterization

Abstract

Solid-state interfacial dealloying creates bi-continuous nanostructured thin films with 3D interconnected morphology, revealed by multimodal characterization, offering potential applications in catalysis, biomedical sensing and energy storage.

Authors:
ORCiD logo [1];  [2];  [2];  [2];  [2];  [1];  [2]; ORCiD logo [2];  [2];  [3]; ORCiD logo [2]; ORCiD logo [4]
  1. Stony Brook Univ., Stony Brook, NY (United States)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States)
  3. National Inst. of Standards and Technology (NIST), Gaithersburg, MD (United States)
  4. Stony Brook Univ., Stony Brook, NY (United States); Brookhaven National Lab. (BNL), Upton, NY (United States)
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1542282
Alternate Identifier(s):
OSTI ID: 1529999
Report Number(s):
BNL-211848-2019-JAAM
Journal ID: ISSN 2051-6347; MHAOAL
Grant/Contract Number:  
SC0012704
Resource Type:
Accepted Manuscript
Journal Name:
Materials Horizons
Additional Journal Information:
Journal Name: Materials Horizons; Journal ID: ISSN 2051-6347
Publisher:
Royal Society of Chemistry
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Zhao, Chonghang, Kisslinger, Kim, Huang, Xiaojing, Lu, Ming, Camino, Fernando, Lin, Cheng -Hung, Yan, Hanfei, Nazaretski, Evgeny, Chu, Yong, Ravel, Bruce, Liu, Mingzhao, and Chen-Wiegart, Yu-chen Karen. Bi-continuous pattern formation in thin films via solid-state interfacial dealloying studied by multimodal characterization. United States: N. p., 2019. Web. doi:10.1039/C9MH00669A.
Zhao, Chonghang, Kisslinger, Kim, Huang, Xiaojing, Lu, Ming, Camino, Fernando, Lin, Cheng -Hung, Yan, Hanfei, Nazaretski, Evgeny, Chu, Yong, Ravel, Bruce, Liu, Mingzhao, & Chen-Wiegart, Yu-chen Karen. Bi-continuous pattern formation in thin films via solid-state interfacial dealloying studied by multimodal characterization. United States. doi:10.1039/C9MH00669A.
Zhao, Chonghang, Kisslinger, Kim, Huang, Xiaojing, Lu, Ming, Camino, Fernando, Lin, Cheng -Hung, Yan, Hanfei, Nazaretski, Evgeny, Chu, Yong, Ravel, Bruce, Liu, Mingzhao, and Chen-Wiegart, Yu-chen Karen. Wed . "Bi-continuous pattern formation in thin films via solid-state interfacial dealloying studied by multimodal characterization". United States. doi:10.1039/C9MH00669A.
@article{osti_1542282,
title = {Bi-continuous pattern formation in thin films via solid-state interfacial dealloying studied by multimodal characterization},
author = {Zhao, Chonghang and Kisslinger, Kim and Huang, Xiaojing and Lu, Ming and Camino, Fernando and Lin, Cheng -Hung and Yan, Hanfei and Nazaretski, Evgeny and Chu, Yong and Ravel, Bruce and Liu, Mingzhao and Chen-Wiegart, Yu-chen Karen},
abstractNote = {Solid-state interfacial dealloying creates bi-continuous nanostructured thin films with 3D interconnected morphology, revealed by multimodal characterization, offering potential applications in catalysis, biomedical sensing and energy storage.},
doi = {10.1039/C9MH00669A},
journal = {Materials Horizons},
number = ,
volume = ,
place = {United States},
year = {2019},
month = {6}
}

Journal Article:
Free Publicly Available Full Text
This content will become publicly available on June 19, 2020
Publisher's Version of Record

Save / Share:

Works referenced in this record:

Evolution of nanoporosity in dealloying
journal, March 2001

  • Erlebacher, Jonah; Aziz, Michael J.; Karma, Alain
  • Nature, Vol. 410, Issue 6827, p. 450-453
  • DOI: 10.1038/35068529

Investigation of high-temperature degradation of platinum thin films with an in situ resistance measurement apparatus
journal, March 1998

  • Firebaugh, S. L.; Jensen, K. F.; Schmidt, M. A.
  • Journal of Microelectromechanical Systems, Vol. 7, Issue 1, p. 128-135
  • DOI: 10.1109/84.661395