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Title: Quantitative Electromechanical Atomic Force Microscopy

Abstract

The ability to probe a materials electromechanical functionality on the nanoscale is significant to applications from energy storage and computing to biology and medicine. Voltage modulated atomic force microscopy (VM-AFM) has become a mainstay characterization tool for investigating these materials due to its ability to locally probe electromechanically responsive materials with spatial resolution from microns to nanometers. However, with the wide popularity of VM-AFM techniques such as piezoresponse force microscopy (PFM) and electrochemical strain microscopy (ESM) there has been a rise in reports of nanoscale electromechanical functionality, including hysteresis, in materials that should be incapable of exhibiting piezo- or ferroelectricity. Explanations for the origins of unexpected nanoscale phenomena have included new material properties, surface-mediated polarization changes and/or spatially resolved behavior that is not present in bulk measurements. At the same time, it is well known that VM-AFM measurements are vulnerable to numerous forms of crosstalk and, despite efforts within the AFM community, a global approach for eliminating this has remained elusive. Here, we develop a method for easily demonstrating the presence of hysteretic (i.e. “false ferroelectric”) long-range interactions between the sample and cantilever body. This approach should be easy to implement in any VM-AFM measurement. We then go on tomore » demonstrate fully quantitative and repeatable nanoelectromechanical characterization using an interferometer. These quantitative measurements are critical for a wide range of devices including mems actuators and sensors, memristor, energy storage and memory.« less

Authors:
ORCiD logo [1]; ORCiD logo [2]; ORCiD logo [1]; ORCiD logo [3]
  1. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
  2. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Univ. of Tennessee, Knoxville, TN (United States)
  3. Oxford Instruments, Santa Barbara, CA (United States). Asylum Research
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1542217
Grant/Contract Number:  
AC05-00OR22725
Resource Type:
Accepted Manuscript
Journal Name:
ACS Nano
Additional Journal Information:
Journal Volume: 13; Journal Issue: 7; Journal ID: ISSN 1936-0851
Publisher:
American Chemical Society (ACS)
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; atomic force microscopy; piezoresponse force microscopy; electrochemical strain microscopy; hysteresis; nonlocal effects

Citation Formats

Collins, Liam, Liu, Yongtao, Ovchinnikova, Olga S., and Proksch, Roger. Quantitative Electromechanical Atomic Force Microscopy. United States: N. p., 2019. Web. doi:10.1021/acsnano.9b02883.
Collins, Liam, Liu, Yongtao, Ovchinnikova, Olga S., & Proksch, Roger. Quantitative Electromechanical Atomic Force Microscopy. United States. doi:10.1021/acsnano.9b02883.
Collins, Liam, Liu, Yongtao, Ovchinnikova, Olga S., and Proksch, Roger. Wed . "Quantitative Electromechanical Atomic Force Microscopy". United States. doi:10.1021/acsnano.9b02883. https://www.osti.gov/servlets/purl/1542217.
@article{osti_1542217,
title = {Quantitative Electromechanical Atomic Force Microscopy},
author = {Collins, Liam and Liu, Yongtao and Ovchinnikova, Olga S. and Proksch, Roger},
abstractNote = {The ability to probe a materials electromechanical functionality on the nanoscale is significant to applications from energy storage and computing to biology and medicine. Voltage modulated atomic force microscopy (VM-AFM) has become a mainstay characterization tool for investigating these materials due to its ability to locally probe electromechanically responsive materials with spatial resolution from microns to nanometers. However, with the wide popularity of VM-AFM techniques such as piezoresponse force microscopy (PFM) and electrochemical strain microscopy (ESM) there has been a rise in reports of nanoscale electromechanical functionality, including hysteresis, in materials that should be incapable of exhibiting piezo- or ferroelectricity. Explanations for the origins of unexpected nanoscale phenomena have included new material properties, surface-mediated polarization changes and/or spatially resolved behavior that is not present in bulk measurements. At the same time, it is well known that VM-AFM measurements are vulnerable to numerous forms of crosstalk and, despite efforts within the AFM community, a global approach for eliminating this has remained elusive. Here, we develop a method for easily demonstrating the presence of hysteretic (i.e. “false ferroelectric”) long-range interactions between the sample and cantilever body. This approach should be easy to implement in any VM-AFM measurement. We then go on to demonstrate fully quantitative and repeatable nanoelectromechanical characterization using an interferometer. These quantitative measurements are critical for a wide range of devices including mems actuators and sensors, memristor, energy storage and memory.},
doi = {10.1021/acsnano.9b02883},
journal = {ACS Nano},
number = 7,
volume = 13,
place = {United States},
year = {2019},
month = {7}
}

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Cited by: 14 works
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Works referencing / citing this record:

Self‐Assembled Room Temperature Multiferroic BiFeO 3 ‐LiFe 5 O 8 Nanocomposites
journal, October 2019

  • Sharma, Yogesh; Agarwal, Radhe; Collins, Liam
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Ferroelectric Poling of Methylammonium Lead Iodide Thin Films
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  • Röhm, Holger; Leonhard, Tobias; Hoffmann, Michael J.
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Light‐Ferroic Interaction in Hybrid Organic–Inorganic Perovskites
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  • Advanced Optical Materials, Vol. 7, Issue 23
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Mechanical breathing in organic electrochromics
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Reply to: On the ferroelectricity of CH3NH3PbI3 perovskites
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Twin domains modulate light-matter interactions in metal halide perovskites
journal, January 2020

  • Liu, Yongtao; Li, Mingxing; Wang, Miaosheng
  • APL Materials, Vol. 8, Issue 1
  • DOI: 10.1063/1.5127866