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Title: Aberration-free imaging of inelastic-scattering spectra with x-ray echo spectrometers

Abstract

We study here conditions for aberration-free imaging of inelastic x-ray-scattering (IXS) spectra with x-ray echo spectrometers. Aberration-free imaging is essential for achieving instrumental functions with high resolution and high contrast. Computational ray tracing is applied to a thorough analysis of a $$0.1\mathrm{meV}/0.07{-}{\mathrm{nm}}^{{-}1}$$-resolution echo-type IXS spectrometer operating with 9-keV x rays. We show that IXS spectra imaged by the x-ray echo spectrometer that uses lenses for the collimating and focusing optics are free of aberrations. When grazing incidence mirrors (paraboloidal, parabolic Kirkpatrick-Baez, or parabolic Montel) are used instead of the lenses, the imaging system reveals some defocus aberration that depends on the inelastic energy transfer. However, the aberration-free images can be still recorded in a plane that is tilted with respect to the optical axis. This distortion can be thus fully compensated by inclining appropriately the x-ray imaging detector, which simultaneously improves its spatial resolution. A full simulation of imaging IXS spectra from a realistic sample demonstrates the excellent performance of the proposed designs.

Authors:
 [1];  [2]
  1. European Synchrotron Radiation Facility (ESRF), Grenoble (France)
  2. Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1542153
Alternate Identifier(s):
OSTI ID: 1515603
Grant/Contract Number:  
AC02-06CH11357
Resource Type:
Accepted Manuscript
Journal Name:
Physical Review A
Additional Journal Information:
Journal Volume: 99; Journal Issue: 5; Journal ID: ISSN 2469-9926
Publisher:
American Physical Society (APS)
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Sánchez del Río, Manuel, and Shvyd'ko, Yuri. Aberration-free imaging of inelastic-scattering spectra with x-ray echo spectrometers. United States: N. p., 2019. Web. doi:10.1103/PhysRevA.99.053839.
Sánchez del Río, Manuel, & Shvyd'ko, Yuri. Aberration-free imaging of inelastic-scattering spectra with x-ray echo spectrometers. United States. doi:10.1103/PhysRevA.99.053839.
Sánchez del Río, Manuel, and Shvyd'ko, Yuri. Fri . "Aberration-free imaging of inelastic-scattering spectra with x-ray echo spectrometers". United States. doi:10.1103/PhysRevA.99.053839.
@article{osti_1542153,
title = {Aberration-free imaging of inelastic-scattering spectra with x-ray echo spectrometers},
author = {Sánchez del Río, Manuel and Shvyd'ko, Yuri},
abstractNote = {We study here conditions for aberration-free imaging of inelastic x-ray-scattering (IXS) spectra with x-ray echo spectrometers. Aberration-free imaging is essential for achieving instrumental functions with high resolution and high contrast. Computational ray tracing is applied to a thorough analysis of a $0.1\mathrm{meV}/0.07{-}{\mathrm{nm}}^{{-}1}$-resolution echo-type IXS spectrometer operating with 9-keV x rays. We show that IXS spectra imaged by the x-ray echo spectrometer that uses lenses for the collimating and focusing optics are free of aberrations. When grazing incidence mirrors (paraboloidal, parabolic Kirkpatrick-Baez, or parabolic Montel) are used instead of the lenses, the imaging system reveals some defocus aberration that depends on the inelastic energy transfer. However, the aberration-free images can be still recorded in a plane that is tilted with respect to the optical axis. This distortion can be thus fully compensated by inclining appropriately the x-ray imaging detector, which simultaneously improves its spatial resolution. A full simulation of imaging IXS spectra from a realistic sample demonstrates the excellent performance of the proposed designs.},
doi = {10.1103/PhysRevA.99.053839},
journal = {Physical Review A},
number = 5,
volume = 99,
place = {United States},
year = {2019},
month = {5}
}

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Works referenced in this record:

Characterization of Pixirad-1 photon counting detector for X-ray imaging
journal, January 2016


Hard-x-ray spectrographs with resolution beyond 100 μ eV
journal, April 2013


Laser Beams and Resonators
journal, January 1966


Theory of angular-dispersive, imaging hard-x-ray spectrographs
journal, May 2015


ShadowOui : a new visual environment for X-ray optics and synchrotron beamline simulations
journal, October 2016


High-contrast sub-millivolt inelastic X-ray scattering for nano- and mesoscale science
journal, June 2014

  • Shvyd’ko, Yuri; Stoupin, Stanislav; Shu, Deming
  • Nature Communications, Vol. 5, Issue 1
  • DOI: 10.1038/ncomms5219

SAXES, a high resolution spectrometer for resonant x-ray emission in the 400–1600eV energy range
journal, November 2006

  • Ghiringhelli, G.; Piazzalunga, A.; Dallera, C.
  • Review of Scientific Instruments, Vol. 77, Issue 11
  • DOI: 10.1063/1.2372731

Resonant inelastic x-ray scattering studies of elementary excitations
journal, June 2011

  • Ament, Luuk J. P.; van Veenendaal, Michel; Devereaux, Thomas P.
  • Reviews of Modern Physics, Vol. 83, Issue 2
  • DOI: 10.1103/RevModPhys.83.705

Formation of Optical Images by X-Rays
journal, January 1948

  • Kirkpatrick, Paul; Baez, A. V.
  • Journal of the Optical Society of America, Vol. 38, Issue 9
  • DOI: 10.1364/JOSA.38.000766

Theory and optical design of x-ray echo spectrometers
journal, August 2017


Highly efficient beamline and spectrometer for inelastic soft X-ray scattering at high resolution
journal, January 2014


Asymmetrically cut crystals for synchrotron radiation monochromators
journal, January 1992

  • Sánchez del Río, M.; Cerrina, F.
  • Review of Scientific Instruments, Vol. 63, Issue 1
  • DOI: 10.1063/1.1143785

Performance of a collimating L-shaped laterally graded multilayer mirror for the IXS analyzer system at NSLS-II
journal, March 2014

  • Suvorov, Alexey; Coburn, David S.; Cunsolo, Alessandro
  • Journal of Synchrotron Radiation, Vol. 21, Issue 3
  • DOI: 10.1107/S1600577514002999

Spiegelsysteme streifenden Einfalls als abbildende Optiken für Röntgenstrahlen
journal, January 1952


Imaging by parabolic refractive lenses in the hard X-ray range
journal, November 1999

  • Lengeler, Bruno; Schroer, Christian; Tümmler, Johannes
  • Journal of Synchrotron Radiation, Vol. 6, Issue 6
  • DOI: 10.1107/S0909049599009747

X-ray Echo Spectroscopy
journal, February 2016


SHADOW3 : a new version of the synchrotron X-ray optics modelling package
journal, July 2011

  • Sanchez del Rio, Manuel; Canestrari, Niccolo; Jiang, Fan
  • Journal of Synchrotron Radiation, Vol. 18, Issue 5
  • DOI: 10.1107/S0909049511026306

Ellipsoidal mirror for two-dimensional 100-nm focusing in hard X-ray region
journal, November 2017


Viscoelastic behavior of water in the terahertz-frequency range: An inelastic x-ray scattering study
journal, November 1999


Plane grating monochromators for synchrotron radiation
journal, November 1980


Tests and characterization of a laterally graded multilayer Montel mirror
journal, November 2013