Paschen's curve in microgaps with an electrode surface protrusion

Fu, Yangyang; Zhang, Peng; Verboncoeur, John P.

doi:10.1063/1.5045182

Title: Paschen's curve in microgaps with an electrode surface protrusion

Journal Article · 02 August 2018 · Applied Physics Letters

DOI: https://doi.org/10.1063/1.5045182 · OSTI ID:1540248

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Michigan State Univ., East Lansing, MI (United States); DOE/OSTI
Michigan State Univ., East Lansing, MI (United States)

Paschen's curve in microgaps with a hemi-ellipsoidal protrusion on the electrode surface is examined using a two-dimensional fluid model. The breakdown voltage is identified when the discharge enters the subnormal region, according to voltage-current characteristics. It is discovered that the breakdown in a microgap with a surface protrusion on the electrode can result in a combined Paschen's curve, which transits from long-gap (distance between the cathode and anode without the presence of protrusion) behavior at low pressure to short-gap (distance between the protrusion apex to the opposite electrode) behavior at high pressure. As gas pressure decreases, the length of the optimal discharge path increases, automatically moving from the top of the protrusion to its side surface and then to the wider non-protrusion electrode gap. The effects of the protrusion height and radius as well as the discharge polarity on the Paschen's curve are viewed in detail. The effects of the protrusion aspect ratio on field enhancement are also considered. Our report provides insights into the design of microgaps with controlled breakdown voltage across many orders in pressure via engineered electrode morphology.

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Research Organization:: Univ. of Michigan, Ann Arbor, MI (United States)

Sponsoring Organization:: Air Force Office of Scientific Research (AFOSR); USDOE; USDOE Office of Science (SC)

Grant/Contract Number:: SC0001939

OSTI ID:: 1540248

Journal Information:: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 5 Vol. 113; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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