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Title: Reduced-order model for microstructure evolution prediction in the electrodes of solid oxide fuel cell with dynamic discrepancy reduced modeling

Journal Article · · Journal of Power Sources
ORCiD logo [1];  [2];  [3];  [4]
  1. National Energy Technology Lab. (NETL), Albany, OR (United States); Oak Ridge Institute for Science and Education, Oak Ridge, TN (United States)
  2. National Energy Technology Lab. (NETL), Albany, OR (United States); AECOM, South Park, PA (United States)
  3. West Virginia Univ., Morgantown, WV (United States)
  4. National Energy Technology Lab. (NETL), Albany, OR (United States)

Microstructure evolution in the electrodes of solid oxide fuel cell is an important degradation mechanism which reduces active sites for redox reaction and the electric conductivity. Phase field models for microstructure evolution simulation are usually expensive for large scale simulations. In this paper, a reduced-order coarsening model is developed using dynamic discrepancy reduced modeling, which reduces the model order by inserting Gaussian process stochastic functions into the dynamic equations of Ostwald ripening. The reduced order model has been calibrated on a dataset generated by a phase field model that has been well validated to experiments. A validating dataset has also been generated with which the model prediction show good agreement. This model is further applied to predict long term microstructure evolution in different SOFC electrodes. Finally, this work is the first attempt of building a degradation model of SOFC using data science techniques.

Research Organization:
National Energy Technology Laboratory (NETL), Pittsburgh, PA, Morgantown, WV, and Albany, OR (United States)
Sponsoring Organization:
USDOE; USDOE Office of Fossil Energy (FE)
Grant/Contract Number:
FE0004000
OSTI ID:
1532662
Report Number(s):
NETL-PUB--22082
Journal Information:
Journal of Power Sources, Journal Name: Journal of Power Sources Journal Issue: C Vol. 416; ISSN 0378-7753
Publisher:
ElsevierCopyright Statement
Country of Publication:
United States
Language:
English