In Situ Optical Absorption Studies of Point Defect Kinetics and Thermodynamics in Oxide Thin Films
Abstract
The authors discuss the use of in situ optical absorption to probe point defect equilibria and kinetics in oxides, with particular attention to thin films and high-temperature measurements evaluating changes in oxygen content. The introduction notes the effect of point defects on oxide behavior, including differences in thin films versus bulk materials, and describes methods to evaluate point defect equilibria and kinetics; advantages of optical absorption among these methods are highlighted. Section 2 provides an overview of how optical absorption and point defect concentrations are related, including various possible structural and electronic origins of defect-mediated absorption changes corresponding to oxygen content changes. Section 3 traces the development of historical understanding of optical absorption in nonstoichiometric oxides and emergence of thin film applications and measurement approaches that resulted. Section 4 details the procedure for determining surface exchange coefficients from optical transmission relaxation measurements and provides specific examples of how this approach uniquely has enabled new insights into thin film surface exchange behavior with and without current collectors. Section 5 provides examples of optically derived diffusivity measurements and comparisons of bulk and thin film defect equilibria. Section 7 outlines potential opportunities and future developments in this area, and Section 7 concludes themore »
- Authors:
-
- Univ. of Illinois at Urbana-Champaign, IL (United States)
- Publication Date:
- Research Org.:
- Univ. of Illinois at Urbana-Champaign, IL (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1599746
- Alternate Identifier(s):
- OSTI ID: 1532421
- Grant/Contract Number:
- SC0018963
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Advanced Materials Interfaces
- Additional Journal Information:
- Journal Volume: 6; Journal Issue: 15; Journal ID: ISSN 2196-7350
- Publisher:
- Wiley-VCH
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; diffusion; high‐temperature materials; nonstoichiometry; optical absorption; point defects; surface exchange kinetics; thin films
Citation Formats
Buckner, Haley B., and Perry, Nicola H. In Situ Optical Absorption Studies of Point Defect Kinetics and Thermodynamics in Oxide Thin Films. United States: N. p., 2019.
Web. doi:10.1002/admi.201900496.
Buckner, Haley B., & Perry, Nicola H. In Situ Optical Absorption Studies of Point Defect Kinetics and Thermodynamics in Oxide Thin Films. United States. https://doi.org/10.1002/admi.201900496
Buckner, Haley B., and Perry, Nicola H. Mon .
"In Situ Optical Absorption Studies of Point Defect Kinetics and Thermodynamics in Oxide Thin Films". United States. https://doi.org/10.1002/admi.201900496. https://www.osti.gov/servlets/purl/1599746.
@article{osti_1599746,
title = {In Situ Optical Absorption Studies of Point Defect Kinetics and Thermodynamics in Oxide Thin Films},
author = {Buckner, Haley B. and Perry, Nicola H.},
abstractNote = {The authors discuss the use of in situ optical absorption to probe point defect equilibria and kinetics in oxides, with particular attention to thin films and high-temperature measurements evaluating changes in oxygen content. The introduction notes the effect of point defects on oxide behavior, including differences in thin films versus bulk materials, and describes methods to evaluate point defect equilibria and kinetics; advantages of optical absorption among these methods are highlighted. Section 2 provides an overview of how optical absorption and point defect concentrations are related, including various possible structural and electronic origins of defect-mediated absorption changes corresponding to oxygen content changes. Section 3 traces the development of historical understanding of optical absorption in nonstoichiometric oxides and emergence of thin film applications and measurement approaches that resulted. Section 4 details the procedure for determining surface exchange coefficients from optical transmission relaxation measurements and provides specific examples of how this approach uniquely has enabled new insights into thin film surface exchange behavior with and without current collectors. Section 5 provides examples of optically derived diffusivity measurements and comparisons of bulk and thin film defect equilibria. Section 7 outlines potential opportunities and future developments in this area, and Section 7 concludes the manuscript.},
doi = {10.1002/admi.201900496},
journal = {Advanced Materials Interfaces},
number = 15,
volume = 6,
place = {United States},
year = {Mon Jul 08 00:00:00 EDT 2019},
month = {Mon Jul 08 00:00:00 EDT 2019}
}
Web of Science
Figures / Tables:
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