Visualization of ultrafast melting initiated from radiation-driven defects in solids

Mo, Mianzhen; Murphy, Samuel; Chen, Zhijiang; Fossati, Paul; Li, Renkai; Wang, Yongqiang; Wang, Xijie; Glenzer, Siegfried

doi:10.1126/sciadv.aaw0392

Title: Visualization of ultrafast melting initiated from radiation-driven defects in solids

Journal Article · 23 May 2019 · Science Advances

DOI: https://doi.org/10.1126/sciadv.aaw0392 · OSTI ID:1532401

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SLAC National Accelerator Lab., Menlo Park, CA (United States)
Lancaster Univ., Lancaster (United Kingdom)
Imperial College London, London (United Kingdom); Univ. Paris Saclay, Gif-sur-Yvette (France)
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)

Materials exposed to extreme radiation environments such as fusion reactors or deep spaces accumulate substantial defect populations that alter their properties and subsequently the melting behavior. The quantitative characterization requires visualization with femtosecond temporal resolution on the atomic-scale length through measurements of the pair correlation function. Here, we demonstrate experimentally that electron diffraction at relativistic energies opens a new approach for studies of melting kinetics. Our measurements in radiation-damaged tungsten show that the tungsten target subjected to 10 displacements per atom of damage undergoes a melting transition below the melting temperature. Two-temperature molecular dynamics simulations reveal the crucial role of defect clusters, particularly nanovoids, in driving the ultrafast melting process observed on the time scale of less than 10 ps. These results provide new atomic-level insights into the ultrafast melting processes of materials in extreme environments.

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Research Organization:: SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)

Sponsoring Organization:: USDOE

Grant/Contract Number:: AC02-76SF00515

OSTI ID:: 1532401

Alternate ID(s):: OSTI ID: 1532727; OSTI ID: 23138048

Journal Information:: Science Advances, Journal Name: Science Advances Journal Issue: 5 Vol. 5; ISSN 2375-2548

Publisher:: AAASCopyright Statement

Country of Publication:: United States

Language:: English

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