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Title: Free-electron laser inverse-Compton interaction x-ray source

Abstract

Free-electron lasers (FEL) and synchrotron sources of high brilliance x-rays have been confirmed to be of tremendous value in basic and applied research. Inverse-Compton sources (ICS) can achieve brilliance matching the requirements of many applications pioneered at those FEL and synchrotron facilities—including phase contrast imaging, macromolecular x-ray crystallography, and x-ray microscopy—but with size, cost, and complexity compatible with a small laboratory. The free-electron laser inverse-Compton interaction compact x-ray source at the University of Hawaii at Manoa is a unique approach to an ICS which employs an FEL as the laser source. We have measured a total average flux of 3.0 × 10 5 photons / second with an average brilliance of 2.0 × 10 7 photons / s mm 2 mrad 2 0.1% of bandwidth (BW) with a peak energy of 10.9 keV from the source. While these results are modest in comparison to the standards set by other IC sources, upgrades to the system have the potential to increase the total average flux to 9.2 × 10 11 photons / second with an average brilliance of 1.9 × 10 12 photons / s mm 2 mrad 2 0.1% BW: comparing more favorably to other sources. We discuss the scientificmore » program, the progress made in design and development, and the achievements of the source to date. We also outline future upgrades and integration needed to yield an enabling source for emerging high brilliance x-ray applications.« less

Authors:
 [1];  [2];  [3];  [4];  [2];  [2];  [2];  [2];  [2];  [2]
  1. Univ. of Hawaii, Honolulu, HI (United States); Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  2. Univ. of Hawaii, Honolulu, HI (United States)
  3. Univ. of Hawaii, Honolulu, HI (United States); Oceanit, Honolulu, HI (United States)
  4. Univ. of Hawaii, Honolulu, HI (United States); SLAC National Accelerator Lab., Menlo Park, CA (United States)
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE; National Science Foundation (NSF); Department of Homeland Security Academic Research Initiative
OSTI Identifier:
1532398
Grant/Contract Number:  
AC02-76SF00515; 2010-DN-077-AR1045-02; 2011-DN-077-AR1055-02
Resource Type:
Accepted Manuscript
Journal Name:
Physical Review Accelerators and Beams
Additional Journal Information:
Journal Volume: 22; Journal Issue: 4; Journal ID: ISSN 2469-9888
Publisher:
American Physical Society (APS)
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS

Citation Formats

Niknejadi, Pardis, Kowalczyk, Jeremy M. D., Hadmack, Michael R., Jacobson, Bryce T., Howe, Ian, Kan, Shidong, Smith, Steven, Szarmes, Eric B., Varner, Gary, and Madey, John M. J. Free-electron laser inverse-Compton interaction x-ray source. United States: N. p., 2019. Web. doi:10.1103/physrevaccelbeams.22.040704.
Niknejadi, Pardis, Kowalczyk, Jeremy M. D., Hadmack, Michael R., Jacobson, Bryce T., Howe, Ian, Kan, Shidong, Smith, Steven, Szarmes, Eric B., Varner, Gary, & Madey, John M. J. Free-electron laser inverse-Compton interaction x-ray source. United States. doi:10.1103/physrevaccelbeams.22.040704.
Niknejadi, Pardis, Kowalczyk, Jeremy M. D., Hadmack, Michael R., Jacobson, Bryce T., Howe, Ian, Kan, Shidong, Smith, Steven, Szarmes, Eric B., Varner, Gary, and Madey, John M. J. Mon . "Free-electron laser inverse-Compton interaction x-ray source". United States. doi:10.1103/physrevaccelbeams.22.040704. https://www.osti.gov/servlets/purl/1532398.
@article{osti_1532398,
title = {Free-electron laser inverse-Compton interaction x-ray source},
author = {Niknejadi, Pardis and Kowalczyk, Jeremy M. D. and Hadmack, Michael R. and Jacobson, Bryce T. and Howe, Ian and Kan, Shidong and Smith, Steven and Szarmes, Eric B. and Varner, Gary and Madey, John M. J.},
abstractNote = {Free-electron lasers (FEL) and synchrotron sources of high brilliance x-rays have been confirmed to be of tremendous value in basic and applied research. Inverse-Compton sources (ICS) can achieve brilliance matching the requirements of many applications pioneered at those FEL and synchrotron facilities—including phase contrast imaging, macromolecular x-ray crystallography, and x-ray microscopy—but with size, cost, and complexity compatible with a small laboratory. The free-electron laser inverse-Compton interaction compact x-ray source at the University of Hawaii at Manoa is a unique approach to an ICS which employs an FEL as the laser source. We have measured a total average flux of 3.0 × 105 photons / second with an average brilliance of 2.0 × 107 photons / s mm2 mrad2 0.1% of bandwidth (BW) with a peak energy of 10.9 keV from the source. While these results are modest in comparison to the standards set by other IC sources, upgrades to the system have the potential to increase the total average flux to 9.2 × 1011 photons / second with an average brilliance of 1.9 × 1012 photons / s mm2 mrad2 0.1% BW: comparing more favorably to other sources. We discuss the scientific program, the progress made in design and development, and the achievements of the source to date. We also outline future upgrades and integration needed to yield an enabling source for emerging high brilliance x-ray applications.},
doi = {10.1103/physrevaccelbeams.22.040704},
journal = {Physical Review Accelerators and Beams},
number = 4,
volume = 22,
place = {United States},
year = {2019},
month = {4}
}

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Works referenced in this record:

Nanoscale X-ray imaging
journal, December 2010