DOE PAGES title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: High resolution phase space measurements with Allison-type emittance scanners

Abstract

Allison-type emittance scanners are widely used to measure projected 2D phase space distributions of low energy beams. This paper extends the conventional data analysis model to introduce three significant corrections that commonly arise in the pursuit of high resolution measurements. First, effective longitudinal asymmetry in the E-dipole placement (typically resulting from directional choice of relief cuts in thick slit-plates) causes deviation from the ideal voltage-to-angle conversion relation. Second, finite slit thickness generates variation in weights of data points that should be compensated. Third, when the interval between data points is smaller than the device resolution (ordinary in the angular data accumulation), a detailed account of the phase space region contributing to each data point can be used to resolve the beam distribution more accurately. These findings are illustrated by simulations with numerically generated phase space distributions. The improved model is applied to experimental measurements of an Ar ion beam with an Allison scanner operating at the front-end of the Facility for Rare Isotope Beams (FRIB) at Michigan State University. Results show that the improved model obtains better agreement among a set of measurements and modifies beam moments significantly (can be ~ 10 % relative to conventional methods, with larger deviationsmore » at increasing angular divergence), thus rendering the corrections important for accurate high resolution phase-space characterizations. Python code tools that implement the improved analysis described are made available. These tools are readily applicable to any Allison scanner given a specification of the device geometry and scan ranges associated with each measurement.« less

Authors:
; ;
Publication Date:
Research Org.:
Michigan State Univ., East Lansing, MI (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Nuclear Physics (NP); National Science Foundation (NSF)
OSTI Identifier:
1530639
Alternate Identifier(s):
OSTI ID: 1610443
Grant/Contract Number:  
SC0000661; PHY-1565546
Resource Type:
Published Article
Journal Name:
Physical Review Accelerators and Beams
Additional Journal Information:
Journal Name: Physical Review Accelerators and Beams Journal Volume: 22 Journal Issue: 7; Journal ID: ISSN 2469-9888
Publisher:
American Physical Society (APS)
Country of Publication:
United States
Language:
English
Subject:
72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; Physics

Citation Formats

Wong, Jonathan C., Lund, Steven M., and Maruta, Tomofumi. High resolution phase space measurements with Allison-type emittance scanners. United States: N. p., 2019. Web. doi:10.1103/PhysRevAccelBeams.22.072801.
Wong, Jonathan C., Lund, Steven M., & Maruta, Tomofumi. High resolution phase space measurements with Allison-type emittance scanners. United States. https://doi.org/10.1103/PhysRevAccelBeams.22.072801
Wong, Jonathan C., Lund, Steven M., and Maruta, Tomofumi. Tue . "High resolution phase space measurements with Allison-type emittance scanners". United States. https://doi.org/10.1103/PhysRevAccelBeams.22.072801.
@article{osti_1530639,
title = {High resolution phase space measurements with Allison-type emittance scanners},
author = {Wong, Jonathan C. and Lund, Steven M. and Maruta, Tomofumi},
abstractNote = {Allison-type emittance scanners are widely used to measure projected 2D phase space distributions of low energy beams. This paper extends the conventional data analysis model to introduce three significant corrections that commonly arise in the pursuit of high resolution measurements. First, effective longitudinal asymmetry in the E-dipole placement (typically resulting from directional choice of relief cuts in thick slit-plates) causes deviation from the ideal voltage-to-angle conversion relation. Second, finite slit thickness generates variation in weights of data points that should be compensated. Third, when the interval between data points is smaller than the device resolution (ordinary in the angular data accumulation), a detailed account of the phase space region contributing to each data point can be used to resolve the beam distribution more accurately. These findings are illustrated by simulations with numerically generated phase space distributions. The improved model is applied to experimental measurements of an Ar ion beam with an Allison scanner operating at the front-end of the Facility for Rare Isotope Beams (FRIB) at Michigan State University. Results show that the improved model obtains better agreement among a set of measurements and modifies beam moments significantly (can be ~ 10 % relative to conventional methods, with larger deviations at increasing angular divergence), thus rendering the corrections important for accurate high resolution phase-space characterizations. Python code tools that implement the improved analysis described are made available. These tools are readily applicable to any Allison scanner given a specification of the device geometry and scan ranges associated with each measurement.},
doi = {10.1103/PhysRevAccelBeams.22.072801},
journal = {Physical Review Accelerators and Beams},
number = 7,
volume = 22,
place = {United States},
year = {Tue Jul 02 00:00:00 EDT 2019},
month = {Tue Jul 02 00:00:00 EDT 2019}
}

Journal Article:
Free Publicly Available Full Text

Citation Metrics:
Cited by: 2 works
Citation information provided by
Web of Science

Save / Share:

Works referenced in this record:

Emittance studies with an Allison scanner
journal, March 2006

  • Stockli, M. P.; Welton, R. F.; Keller, R.
  • Review of Scientific Instruments, Vol. 77, Issue 3
  • DOI: 10.1063/1.2169812

Plasma Physics via Computer Simulation
book, January 1991


Four-dimensional transverse beam matrix measurement using the multiple-quadrupole scan technique
journal, May 2014


ARTEMIS-B: A room-temperature test electron cyclotron resonance ion source for the National Superconducting Cyclotron Laboratory at Michigan State University
journal, March 2006

  • Machicoane, G.; Cole, D.; Ottarson, J.
  • Review of Scientific Instruments, Vol. 77, Issue 3
  • DOI: 10.1063/1.2165749

Applied Numerical Linear Algebra
book, January 1997


Characterisation of the PXIE Allison-type emittance scanner
journal, April 2016

  • D׳Arcy, R.; Alvarez, M.; Gaynier, J.
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 815
  • DOI: 10.1016/j.nima.2016.01.039

Generation of initial kinetic distributions for simulation of long-pulse charged particle beams with high space-charge intensity
journal, November 2009

  • Lund, Steven M.; Kikuchi, Takashi; Davidson, Ronald C.
  • Physical Review Special Topics - Accelerators and Beams, Vol. 12, Issue 11
  • DOI: 10.1103/PhysRevSTAB.12.114801

Rotating system for four-dimensional transverse rms-emittance measurements
journal, July 2016


Beam Dumping Ghost Signals in Electric Sweep Scanners
conference, January 2005

  • Stockli, M. P.
  • PRODUCTION AND NEUTRALIZATION OF NEGATIVE IONS AND BEAMS: 10th International Symposium on Production and Neutralization of Negative Ions and Beams, AIP Conference Proceedings
  • DOI: 10.1063/1.1908290