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Title: Wavefront sensing at X-ray free-electron lasers

Abstract

Here a direct comparison is made between various X-ray wavefront sensing methods with application to optics alignment and focus characterization at X-ray free-electron lasers (XFELs). Focus optimization at XFEL beamlines presents unique challenges due to high peak powers as well as beam pointing instability, meaning that techniques capable of single-shot measurement and that probe the wavefront at an out-of-focus location are desirable. The techniques chosen for the comparison include single-phase-grating Talbot interferometry (shearing interferometry), dual-grating Talbot interferometry (moiré deflectometry) and speckle tracking. All three methods were implemented during a single beam time at the Linac Coherent Light Source, at the X-ray Pump Probe beamline, in order to make a direct comparison. Each method was used to characterize the wavefront resulting from a stack of beryllium compound refractive lenses followed by a corrective phase plate. In addition, difference wavefront measurements with and without the phase plate agreed with its design to within λ/20, which enabled a direct quantitative comparison between methods. Finally, a path toward automated alignment at XFEL beamlines using a wavefront sensor to close the loop is presented.

Authors:
 [1];  [2];  [2];  [2];  [3];  [3];  [4];  [1];  [1];  [1];  [1];  [3];  [3];  [3];  [3];  [3];  [1];  [5];  [5];  [6] more »;  [7];  [8]; ORCiD logo [9] « less
  1. SLAC National Accelerator Lab., Menlo Park, CA (United States)
  2. European Synchrotron Radiation Facility (France)
  3. Paul Scherrer Institut (Switzerland)
  4. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  5. European XFEL GmbH, Schenefeld (Germany)
  6. RIKEN SPring-8 Center, Sayo-cho, Sayo-gun (Japan); Japan Synchrotron Radiation Research Institute (JASRI), Sayo-cho, Sayo-gun (Japan)
  7. European XFEL GmbH, Schenefeld (Germany); La Trobe Univ., Melbourne, VIC (Australia)
  8. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); Univ. of Hamburg (Germany)
  9. European XFEL GmbH, Schenefeld (Germany); Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); Academy of Sciences of the Czech Republic (ASCR), Prague (Czech Republic)
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1527375
Grant/Contract Number:  
AC02-76SF00515
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Synchrotron Radiation (Online)
Additional Journal Information:
Journal Name: Journal of Synchrotron Radiation (Online); Journal Volume: 26; Journal Issue: 4; Journal ID: ISSN 1600-5775
Publisher:
International Union of Crystallography
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; 42 ENGINEERING; X-ray free-electron lasers; wavefront sensing; grating interferometry; speckle tracking

Citation Formats

Seaberg, Matthew, Cojocaru, Ruxandra, Berujon, Sebastien, Ziegler, Eric, Jaggi, Andreas, Krempasky, Juraj, Seiboth, Frank, Aquila, Andrew, Liu, Yanwei, Sakdinawat, Anne, Lee, Hae Ja, Flechsig, Uwe, Patthey, Luc, Koch, Frieder, Seniutinas, Gediminas, David, Christian, Zhu, Diling, Mikeš, Ladislav, Makita, Mikako, Koyama, Takahisa, Mancuso, Adrian P., Chapman, Henry, and Vagovič, Patrik. Wavefront sensing at X-ray free-electron lasers. United States: N. p., 2019. Web. doi:10.1107/S1600577519005721.
Seaberg, Matthew, Cojocaru, Ruxandra, Berujon, Sebastien, Ziegler, Eric, Jaggi, Andreas, Krempasky, Juraj, Seiboth, Frank, Aquila, Andrew, Liu, Yanwei, Sakdinawat, Anne, Lee, Hae Ja, Flechsig, Uwe, Patthey, Luc, Koch, Frieder, Seniutinas, Gediminas, David, Christian, Zhu, Diling, Mikeš, Ladislav, Makita, Mikako, Koyama, Takahisa, Mancuso, Adrian P., Chapman, Henry, & Vagovič, Patrik. Wavefront sensing at X-ray free-electron lasers. United States. doi:10.1107/S1600577519005721.
Seaberg, Matthew, Cojocaru, Ruxandra, Berujon, Sebastien, Ziegler, Eric, Jaggi, Andreas, Krempasky, Juraj, Seiboth, Frank, Aquila, Andrew, Liu, Yanwei, Sakdinawat, Anne, Lee, Hae Ja, Flechsig, Uwe, Patthey, Luc, Koch, Frieder, Seniutinas, Gediminas, David, Christian, Zhu, Diling, Mikeš, Ladislav, Makita, Mikako, Koyama, Takahisa, Mancuso, Adrian P., Chapman, Henry, and Vagovič, Patrik. Wed . "Wavefront sensing at X-ray free-electron lasers". United States. doi:10.1107/S1600577519005721. https://www.osti.gov/servlets/purl/1527375.
@article{osti_1527375,
title = {Wavefront sensing at X-ray free-electron lasers},
author = {Seaberg, Matthew and Cojocaru, Ruxandra and Berujon, Sebastien and Ziegler, Eric and Jaggi, Andreas and Krempasky, Juraj and Seiboth, Frank and Aquila, Andrew and Liu, Yanwei and Sakdinawat, Anne and Lee, Hae Ja and Flechsig, Uwe and Patthey, Luc and Koch, Frieder and Seniutinas, Gediminas and David, Christian and Zhu, Diling and Mikeš, Ladislav and Makita, Mikako and Koyama, Takahisa and Mancuso, Adrian P. and Chapman, Henry and Vagovič, Patrik},
abstractNote = {Here a direct comparison is made between various X-ray wavefront sensing methods with application to optics alignment and focus characterization at X-ray free-electron lasers (XFELs). Focus optimization at XFEL beamlines presents unique challenges due to high peak powers as well as beam pointing instability, meaning that techniques capable of single-shot measurement and that probe the wavefront at an out-of-focus location are desirable. The techniques chosen for the comparison include single-phase-grating Talbot interferometry (shearing interferometry), dual-grating Talbot interferometry (moiré deflectometry) and speckle tracking. All three methods were implemented during a single beam time at the Linac Coherent Light Source, at the X-ray Pump Probe beamline, in order to make a direct comparison. Each method was used to characterize the wavefront resulting from a stack of beryllium compound refractive lenses followed by a corrective phase plate. In addition, difference wavefront measurements with and without the phase plate agreed with its design to within λ/20, which enabled a direct quantitative comparison between methods. Finally, a path toward automated alignment at XFEL beamlines using a wavefront sensor to close the loop is presented.},
doi = {10.1107/S1600577519005721},
journal = {Journal of Synchrotron Radiation (Online)},
number = 4,
volume = 26,
place = {United States},
year = {2019},
month = {6}
}

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