Thermal-field and photoemission from meso- and micro-scale features: Effects of screening and roughness on characterization and simulation
- Authors:
-
- Naval Research Laboratory, Washington, DC 20375, USA
- Deparment of Physics, Arizona State University, Tempe, Arizona 85287, USA
- Directed Energy Directorate, Air Force Research Laboratory, Albuquerque, New Mexico 87117, USA
- Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA
- Leidos, Billerica, Massachusetts 01821, USA
- Publication Date:
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1527207
- Grant/Contract Number:
- 20150394DR
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Journal of Applied Physics
- Additional Journal Information:
- Journal Name: Journal of Applied Physics Journal Volume: 125 Journal Issue: 23; Journal ID: ISSN 0021-8979
- Publisher:
- American Institute of Physics
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Jensen, Kevin L., McDonald, Michael, Chubenko, Oksana, Harris, John R., Shiffler, Donald A., Moody, Nathan A., Petillo, John J., and Jensen, Aaron J. Thermal-field and photoemission from meso- and micro-scale features: Effects of screening and roughness on characterization and simulation. United States: N. p., 2019.
Web. doi:10.1063/1.5097149.
Jensen, Kevin L., McDonald, Michael, Chubenko, Oksana, Harris, John R., Shiffler, Donald A., Moody, Nathan A., Petillo, John J., & Jensen, Aaron J. Thermal-field and photoemission from meso- and micro-scale features: Effects of screening and roughness on characterization and simulation. United States. https://doi.org/10.1063/1.5097149
Jensen, Kevin L., McDonald, Michael, Chubenko, Oksana, Harris, John R., Shiffler, Donald A., Moody, Nathan A., Petillo, John J., and Jensen, Aaron J. Fri .
"Thermal-field and photoemission from meso- and micro-scale features: Effects of screening and roughness on characterization and simulation". United States. https://doi.org/10.1063/1.5097149.
@article{osti_1527207,
title = {Thermal-field and photoemission from meso- and micro-scale features: Effects of screening and roughness on characterization and simulation},
author = {Jensen, Kevin L. and McDonald, Michael and Chubenko, Oksana and Harris, John R. and Shiffler, Donald A. and Moody, Nathan A. and Petillo, John J. and Jensen, Aaron J.},
abstractNote = {},
doi = {10.1063/1.5097149},
journal = {Journal of Applied Physics},
number = 23,
volume = 125,
place = {United States},
year = {Fri Jun 21 00:00:00 EDT 2019},
month = {Fri Jun 21 00:00:00 EDT 2019}
}
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https://doi.org/10.1063/1.5097149
https://doi.org/10.1063/1.5097149
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Cited by: 18 works
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