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Title: A compact multi-plane broadband (0.5-17 keV) spectrometer using a single acid phthalate crystal

Abstract

Acid phthalate crystals such as KAP crystals are a method of choice to record x-ray spectra in the soft x-ray regime (E ~ 1 keV) using the large (001) 2d = 26.63 Å spacing. Reflection from many other planes is possible, and knowledge of the 2d spacing, reflectivity, and resolution for these reflections is necessary to evaluate whether they hinder or help the measurements. Burkhalter et al. [J. Appl. Phys., 52, 4379 (1981)] showed that the (013) reflection has efficiency comparable to the 2nd order reflection (002), and it can overlap the main first order reflection when the crystal bending axis (b-axis) is contained in the dispersion plane, thus contaminating the main (001) measurement in a convex crystal geometry. We present a novel spectrograph concept that makes these asymmetric reflections helpful by setting the crystal b-axis perpendicular to the dispersion plane. In such an instance, asymmetric reflections do not overlap with the main (001) reflection and each reflection can be used as an independent spectrograph. In this work we demonstrate an achieved spectral range of 0.8-13 keV with a prototype setup. The detector measurements were reproduced with a 3D ray-tracing code.

Authors:
 [1];  [1];  [1];  [1];  [1];  [1];  [1]
  1. Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1526910
Report Number(s):
SAND-2019-6099J
Journal ID: ISSN 0034-6748; 676177
Grant/Contract Number:  
AC04-94AL85000
Resource Type:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 89; Journal Issue: 10; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Loisel, Guillaume Pascal, Lake, Patrick W., Nielsen-Weber, Linda Beth, Wu, Ming, Dunham, Greg S, Bailey, James E., and Rochau, Gregory A. A compact multi-plane broadband (0.5-17 keV) spectrometer using a single acid phthalate crystal. United States: N. p., 2018. Web. doi:/10.1063/1.5039371.
Loisel, Guillaume Pascal, Lake, Patrick W., Nielsen-Weber, Linda Beth, Wu, Ming, Dunham, Greg S, Bailey, James E., & Rochau, Gregory A. A compact multi-plane broadband (0.5-17 keV) spectrometer using a single acid phthalate crystal. United States. doi:/10.1063/1.5039371.
Loisel, Guillaume Pascal, Lake, Patrick W., Nielsen-Weber, Linda Beth, Wu, Ming, Dunham, Greg S, Bailey, James E., and Rochau, Gregory A. Mon . "A compact multi-plane broadband (0.5-17 keV) spectrometer using a single acid phthalate crystal". United States. doi:/10.1063/1.5039371. https://www.osti.gov/servlets/purl/1526910.
@article{osti_1526910,
title = {A compact multi-plane broadband (0.5-17 keV) spectrometer using a single acid phthalate crystal},
author = {Loisel, Guillaume Pascal and Lake, Patrick W. and Nielsen-Weber, Linda Beth and Wu, Ming and Dunham, Greg S and Bailey, James E. and Rochau, Gregory A.},
abstractNote = {Acid phthalate crystals such as KAP crystals are a method of choice to record x-ray spectra in the soft x-ray regime (E ~ 1 keV) using the large (001) 2d = 26.63 Å spacing. Reflection from many other planes is possible, and knowledge of the 2d spacing, reflectivity, and resolution for these reflections is necessary to evaluate whether they hinder or help the measurements. Burkhalter et al. [J. Appl. Phys., 52, 4379 (1981)] showed that the (013) reflection has efficiency comparable to the 2nd order reflection (002), and it can overlap the main first order reflection when the crystal bending axis (b-axis) is contained in the dispersion plane, thus contaminating the main (001) measurement in a convex crystal geometry. We present a novel spectrograph concept that makes these asymmetric reflections helpful by setting the crystal b-axis perpendicular to the dispersion plane. In such an instance, asymmetric reflections do not overlap with the main (001) reflection and each reflection can be used as an independent spectrograph. In this work we demonstrate an achieved spectral range of 0.8-13 keV with a prototype setup. The detector measurements were reproduced with a 3D ray-tracing code.},
doi = {/10.1063/1.5039371},
journal = {Review of Scientific Instruments},
number = 10,
volume = 89,
place = {United States},
year = {2018},
month = {10}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record

Figures / Tables:

Fig. 1 Fig. 1: (a) Schematics of the prototype setup, the crystal is cylindrically bent around the $b$-axis and the crystal surface normal is along the $c$-axis. The projections of the three (001), (013) and (0-13) reflections onto the planar detector are shown in black, red and blue respectively. Along the crystalmore » thickness the orientations of the (0±13) lattices are shown with a ±24.8° angle with respect to the surface itself parallel to the (001) lattice. (b) Black: the measured source spectrum with the SDD and in red, the deconvolved absolute spectrum used by the ray-tracing model. (c) Side and (d) top pictures of the crystal and slit assembly, the source to crystal center axis (x-ray main direction) is represented with an arrow.« less

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