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Title: Soft x-ray ptychography studies of nanoscale magnetic and structural correlations in thin SmCo 5 films

Abstract

High spatial resolution magnetic x-ray spectromicroscopy at x-ray photon energies near the cobalt L 3 resonance was applied to probe an amorphous 50 nm thin SmCo 5 film prepared by off-axis pulsed laser deposition onto an x-ray transparent 200 nm thin Si 3N 4 membrane. Alternating gradient magnetometry shows a strong in-plane anisotropy and an only weak perpendicular magnetic anisotropy, which is confirmed by magnetic transmission soft x-ray microscopy images showing over a field of view of 10 μm a primarily stripe-like domain pattern but with local labyrinth-like domains. Soft x-ray ptychography in amplitude and phase contrast was used to identify and characterize local magnetic and structural features over a field of view of 1 μm with a spatial resolution of about 10 nm. There, the magnetic labyrinth domain patterns are accompanied by nanoscale structural inclusions that are primarily located in close proximity to the magnetic domain walls. In conclusion, our analysis suggests that these inclusions are nanocrystalline Sm 2Co 17 phases with nominally in-plane magnetic anisotropy.

Authors:
 [1];  [2];  [3]; ORCiD logo [3];  [1];  [4];  [4];  [4];  [5];  [4];  [4]; ORCiD logo [1]
  1. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Univ. of Oregon, Eugene, OR (United States)
  2. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Univ. of California, Santa Cruz, CA (United States)
  3. IFW Dresden, Dresden (Germany)
  4. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  5. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); National Synchrotron Radiation Research Center (NSRRC), Hsinchu (Taiwan)
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1525133
Alternate Identifier(s):
OSTI ID: 1240034
Grant/Contract Number:  
AC02-05CH11231; FG02-11ER46831; AC02-05-CH11231
Resource Type:
Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 108; Journal Issue: 9; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS

Citation Formats

Shi, X., Fischer, P., Neu, V., Elefant, D., Lee, J. C. T., Shapiro, D. A., Farmand, M., Tyliszczak, T., Shiu, H. -W., Marchesini, S., Roy, S., and Kevan, S. D. Soft x-ray ptychography studies of nanoscale magnetic and structural correlations in thin SmCo5 films. United States: N. p., 2016. Web. doi:10.1063/1.4942776.
Shi, X., Fischer, P., Neu, V., Elefant, D., Lee, J. C. T., Shapiro, D. A., Farmand, M., Tyliszczak, T., Shiu, H. -W., Marchesini, S., Roy, S., & Kevan, S. D. Soft x-ray ptychography studies of nanoscale magnetic and structural correlations in thin SmCo5 films. United States. doi:10.1063/1.4942776.
Shi, X., Fischer, P., Neu, V., Elefant, D., Lee, J. C. T., Shapiro, D. A., Farmand, M., Tyliszczak, T., Shiu, H. -W., Marchesini, S., Roy, S., and Kevan, S. D. Wed . "Soft x-ray ptychography studies of nanoscale magnetic and structural correlations in thin SmCo5 films". United States. doi:10.1063/1.4942776. https://www.osti.gov/servlets/purl/1525133.
@article{osti_1525133,
title = {Soft x-ray ptychography studies of nanoscale magnetic and structural correlations in thin SmCo5 films},
author = {Shi, X. and Fischer, P. and Neu, V. and Elefant, D. and Lee, J. C. T. and Shapiro, D. A. and Farmand, M. and Tyliszczak, T. and Shiu, H. -W. and Marchesini, S. and Roy, S. and Kevan, S. D.},
abstractNote = {High spatial resolution magnetic x-ray spectromicroscopy at x-ray photon energies near the cobalt L3 resonance was applied to probe an amorphous 50 nm thin SmCo5 film prepared by off-axis pulsed laser deposition onto an x-ray transparent 200 nm thin Si3N4 membrane. Alternating gradient magnetometry shows a strong in-plane anisotropy and an only weak perpendicular magnetic anisotropy, which is confirmed by magnetic transmission soft x-ray microscopy images showing over a field of view of 10 μm a primarily stripe-like domain pattern but with local labyrinth-like domains. Soft x-ray ptychography in amplitude and phase contrast was used to identify and characterize local magnetic and structural features over a field of view of 1 μm with a spatial resolution of about 10 nm. There, the magnetic labyrinth domain patterns are accompanied by nanoscale structural inclusions that are primarily located in close proximity to the magnetic domain walls. In conclusion, our analysis suggests that these inclusions are nanocrystalline Sm2Co17 phases with nominally in-plane magnetic anisotropy.},
doi = {10.1063/1.4942776},
journal = {Applied Physics Letters},
number = 9,
volume = 108,
place = {United States},
year = {2016},
month = {3}
}

Journal Article:
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Cited by: 11 works
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Figures / Tables:

FIG. 1. FIG. 1.: (a) Magnetic hysteresis loop of the SmCo5 film for in-plane and out-ofplane contributions. (b) Magnetic transmission soft x-ray microscopy image taken at BL 6.1.2 at the Advanced Light Source in Berkeley showing stripe-like domains with local distortions into labyrinth domains as well as dark inclusions. (c) Schematics ofmore » the ptychography setup at beamline 11.0.2 at the STXM branch at the Advanced Light Source. A Fresnel-Zone-Plate (FZP) focuses the x-ray beam through an order-sorting-aperture (OSA) onto the SmCo5 thin film sample. Coherent diffraction patterns are collected on a charge coupled device detector. (d) Example of a single diffraction pattern showing experimental data of SmCo5 sample.« less

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