Title: The single-line-of-sight, time-resolved x-ray imager diagnostic on OMEGA

Authors:

Theobald, W. ^[1]; Sorce, C. ^[1]; Bedzyk, M. ^[1]; Ivancic, S. T. ^[1]; Marshall, F. J. ^[1]; Stoeckl, C. ^[1]; Shah, R. C. ^[1]; Lawrie, M. ^[1]; Regan, S. P. ^[1]; Sangster, T. C.  ^[1];

• Search DOE PAGES for author "Sangster, T. C."
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Campbell, E. M. ^[1]; Hilsabeck, T. J. ^[2]; Englehorn, K. ^[2]; Kilkenny, J. D. ^[2]; Morris, D. ^[2]; Chung, T. M.  ^[3];

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Hares, J. D.  ^[4];

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• Search DOE PAGES for ORCID "0000-0002-5625-7214"

Dymoke-Bradshaw, A. K. L. ^[4]; Bell, P. ^[5]; Celeste, J. ^[5] more »; Carpenter, A. C. ^[5]; Dayton, M. ^[5]; Bradley, D. K. ^[5]; Jackson, M. C. ^[5]; Pickworth, L.  ^[5];

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Nagel, S. R.  ^[5];

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• Search DOE PAGES for ORCID "0000-0002-7768-6819"

Rochau, G. ^[6]; Porter, J. ^[6]; Sanchez, M. ^[6]; Claus, L. ^[6]; Robertson, G. ^[6]; Looker, Q. ^[6] « less

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+ Show Author Affiliations

1. Univ. of Rochester, NY (United States). Lab. for Laser Energetics
2. General Atomics, San Diego, CA (United States)
3. TMC2 Innovations LLC, Murrieta, CA (United States)
4. Kentech Instruments Ltd., Howbery Park, Wallingford, Oxfordshire (United Kingdom)
5. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
6. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

Publication Date:

Mon Oct 08 00:00:00 EDT 2018

Research Org.:

Univ. of Rochester, NY (United States). Lab. for Laser Energetics; Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)

Sponsoring Org.:

USDOE National Nuclear Security Administration (NNSA)

OSTI Identifier:

1477184

Alternate Identifier(s):

OSTI ID: 1476688; OSTI ID: 1513107

Report Number(s):

2017-268,1440; LLNL-JRNL-754192
Journal ID: ISSN 0034-6748; 2017-268, 1440, 2398

Grant/Contract Number:  

NA0001944; FC02-04ER54789; AC52-07NA27344

Resource Type:

Accepted Manuscript

Journal Name:

Review of Scientific Instruments

Additional Journal Information:

Journal Volume: 89; Journal Issue: 10; Conference: 22nd Topical Conference on High Temperature Plasma Diagnostics, San Diego, CA, 16-19 April 2018; Journal ID: ISSN 0034-6748

Publisher:

American Institute of Physics (AIP)

Country of Publication:

United States

Language:

English

Subject:

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; Lasers

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Theobald, W., Sorce, C., Bedzyk, M., Ivancic, S. T., Marshall, F. J., Stoeckl, C., Shah, R. C., Lawrie, M., Regan, S. P., Sangster, T. C., Campbell, E. M., Hilsabeck, T. J., Englehorn, K., Kilkenny, J. D., Morris, D., Chung, T. M., Hares, J. D., Dymoke-Bradshaw, A. K. L., Bell, P., Celeste, J., Carpenter, A. C., Dayton, M., Bradley, D. K., Jackson, M. C., Pickworth, L., Nagel, S. R., Rochau, G., Porter, J., Sanchez, M., Claus, L., Robertson, G., and Looker, Q. The single-line-of-sight, time-resolved x-ray imager diagnostic on OMEGA. United States: N. p., 2018. Web. doi:10.1063/1.5036767.

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Theobald, W., Sorce, C., Bedzyk, M., Ivancic, S. T., Marshall, F. J., Stoeckl, C., Shah, R. C., Lawrie, M., Regan, S. P., Sangster, T. C., Campbell, E. M., Hilsabeck, T. J., Englehorn, K., Kilkenny, J. D., Morris, D., Chung, T. M., Hares, J. D., Dymoke-Bradshaw, A. K. L., Bell, P., Celeste, J., Carpenter, A. C., Dayton, M., Bradley, D. K., Jackson, M. C., Pickworth, L., Nagel, S. R., Rochau, G., Porter, J., Sanchez, M., Claus, L., Robertson, G., & Looker, Q. The single-line-of-sight, time-resolved x-ray imager diagnostic on OMEGA. United States. https://doi.org/10.1063/1.5036767

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Theobald, W., Sorce, C., Bedzyk, M., Ivancic, S. T., Marshall, F. J., Stoeckl, C., Shah, R. C., Lawrie, M., Regan, S. P., Sangster, T. C., Campbell, E. M., Hilsabeck, T. J., Englehorn, K., Kilkenny, J. D., Morris, D., Chung, T. M., Hares, J. D., Dymoke-Bradshaw, A. K. L., Bell, P., Celeste, J., Carpenter, A. C., Dayton, M., Bradley, D. K., Jackson, M. C., Pickworth, L., Nagel, S. R., Rochau, G., Porter, J., Sanchez, M., Claus, L., Robertson, G., and Looker, Q. Mon . "The single-line-of-sight, time-resolved x-ray imager diagnostic on OMEGA". United States. https://doi.org/10.1063/1.5036767. https://www.osti.gov/servlets/purl/1477184.

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@article{osti_1477184,
title = {The single-line-of-sight, time-resolved x-ray imager diagnostic on OMEGA},
author = {Theobald, W. and Sorce, C. and Bedzyk, M. and Ivancic, S. T. and Marshall, F. J. and Stoeckl, C. and Shah, R. C. and Lawrie, M. and Regan, S. P. and Sangster, T. C. and Campbell, E. M. and Hilsabeck, T. J. and Englehorn, K. and Kilkenny, J. D. and Morris, D. and Chung, T. M. and Hares, J. D. and Dymoke-Bradshaw, A. K. L. and Bell, P. and Celeste, J. and Carpenter, A. C. and Dayton, M. and Bradley, D. K. and Jackson, M. C. and Pickworth, L. and Nagel, S. R. and Rochau, G. and Porter, J. and Sanchez, M. and Claus, L. and Robertson, G. and Looker, Q.},
abstractNote = {},
doi = {10.1063/1.5036767},
journal = {Review of Scientific Instruments},
number = 10,
volume = 89,
place = {United States},
year = {Mon Oct 08 00:00:00 EDT 2018},
month = {Mon Oct 08 00:00:00 EDT 2018}
}

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---

Journal Article:

Free Publicly Available Full Text

Accepted Manuscript (Publisher)

Accepted Manuscript (DOE)

Publisher's Version of Record

https://doi.org/10.1063/1.5036767

Copyright Statement

Other availability

Search WorldCat to find libraries that may hold this journal

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Citation Metrics:

Cited by: 19 works

Citation information provided by
Web of Science

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Figures / Tables:

FIG. 1: Schematic of the single-line-of sight, time-resolved x-ray imager on OMEGA in its initial configuration. A pinhole is used to image the x rays from the hot spot onto a photocathode. A pulse-dilation tube stretches the secondary electron pulse in time and forms an image of the hot spotmore » on a time-gated, solid-state detector (hCMOS). The pinhole will later be replaced with an advanced optic to provide improved spatial resolution.« less

All figures and tables (8 total)

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Works referenced in this record:

Electron-dispersion technique for observation of fast transient signals (c.r.o. display appl.)
journal, January 1976

• Prosser, R. D.
• Journal of Physics E: Scientific Instruments, Vol. 9, Issue 1
• DOI: 10.1088/0022-3735/9/1/018

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Initial performance results of the OMEGA laser system
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• Boehly, T. R.; Brown, D. L.; Craxton, R. S.
• Optics Communications, Vol. 133, Issue 1-6
• DOI: 10.1016/s0030-4018(96)00325-2

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Sub-nanosecond single line-of-sight (SLOS) x-ray imagers (invited)
journal, October 2018

• Engelhorn, K.; Hilsabeck, T. J.; Kilkenny, J.
• Review of Scientific Instruments, Vol. 89, Issue 10
• DOI: 10.1063/1.5039648

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An overview of the Ultrafast X-ray Imager (UXI) program at Sandia Labs
conference, August 2015

• Claus, L.; Fang, L.; Kay, R.
• SPIE Optical Engineering + Applications
• DOI: 10.1117/12.2188336

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Pulse-dilation enhanced gated optical imager with 5 ps resolution (invited)
journal, October 2010

• Hilsabeck, T. J.; Hares, J. D.; Kilkenny, J. D.
• Review of Scientific Instruments, Vol. 81, Issue 10
• DOI: 10.1063/1.3479111

---

A framed, 16-image Kirkpatrick–Baez x-ray microscope
journal, September 2017

• Marshall, F. J.; Bahr, R. E.; Goncharov, V. N.
• Review of Scientific Instruments, Vol. 88, Issue 9
• DOI: 10.1063/1.5000737

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Single Line of Sight CMOS radiation tolerant camera system design overview
conference, September 2016

• Carpenter, A. C.; Dayton, M.; Kimbrough, J.
• SPIE Optical Engineering + Applications, SPIE Proceedings
• DOI: 10.1117/12.2237876

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Works referencing / citing this record:

Sub-nanosecond single line-of-sight (SLOS) x-ray imagers (invited)
journal, October 2018

• Engelhorn, K.; Hilsabeck, T. J.; Kilkenny, J.
• Review of Scientific Instruments, Vol. 89, Issue 10
• DOI: 10.1063/1.5039648

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Inferred UV fluence focal-spot profiles from soft x-ray pinhole-camera measurements on OMEGA
journal, February 2020

• Theobald, W.; Sorce, C.; Donaldson, W. R.
• Review of Scientific Instruments, Vol. 91, Issue 2
• DOI: 10.1063/1.5120708

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The National Direct-Drive Inertial Confinement Fusion Program
journal, December 2018

• Regan, S. P.; Goncharov, V. N.; Sangster, T. C.
• Nuclear Fusion, Vol. 59, Issue 3
• DOI: 10.1088/1741-4326/aae9b5

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