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Title: The effect of electron transport on the characterization of x-ray free-electron laser pulses via ablation

Abstract

The spatial intensity distribution of x-ray free-electron laser (XFEL) pulses in-focus is commonly characterized by performing ablative imprints in thin gold films on silica substrates. In many cases, the range of the electrons generated in the gold by x-ray absorption far exceeds the beam size, and so, it is not clear if the results of imprint studies are compromised by electron transport. Thermal conduction could further modify the energy density profile in the material. We used here a combination of Monte-Carlo transport and continuum models to quantify the accuracy of the imprint method for characterizing XFEL beam profiles. We found that for x-ray energies in the range of 1 to 10 keV, the actual and the measured beam diameters agree within 12% or better for beam diameters between 0.1 and 1 μm.

Authors:
 [1];  [1]
  1. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Publication Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1512632
Report Number(s):
LLNL-JRNL-733619
Journal ID: ISSN 0003-6951; 885501
Grant/Contract Number:  
AC52-07NA27344
Resource Type:
Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 111; Journal Issue: 14; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; free electron lasers; electronic transport; electromagnetic optics; stopping power; transition metals; thin films; Auger effect; hard X-rays; thermodynamic states and processes

Citation Formats

Hau-Riege, Stefan P., and Pardini, Tom. The effect of electron transport on the characterization of x-ray free-electron laser pulses via ablation. United States: N. p., 2017. Web. doi:10.1063/1.4996190.
Hau-Riege, Stefan P., & Pardini, Tom. The effect of electron transport on the characterization of x-ray free-electron laser pulses via ablation. United States. doi:10.1063/1.4996190.
Hau-Riege, Stefan P., and Pardini, Tom. Tue . "The effect of electron transport on the characterization of x-ray free-electron laser pulses via ablation". United States. doi:10.1063/1.4996190. https://www.osti.gov/servlets/purl/1512632.
@article{osti_1512632,
title = {The effect of electron transport on the characterization of x-ray free-electron laser pulses via ablation},
author = {Hau-Riege, Stefan P. and Pardini, Tom},
abstractNote = {The spatial intensity distribution of x-ray free-electron laser (XFEL) pulses in-focus is commonly characterized by performing ablative imprints in thin gold films on silica substrates. In many cases, the range of the electrons generated in the gold by x-ray absorption far exceeds the beam size, and so, it is not clear if the results of imprint studies are compromised by electron transport. Thermal conduction could further modify the energy density profile in the material. We used here a combination of Monte-Carlo transport and continuum models to quantify the accuracy of the imprint method for characterizing XFEL beam profiles. We found that for x-ray energies in the range of 1 to 10 keV, the actual and the measured beam diameters agree within 12% or better for beam diameters between 0.1 and 1 μm.},
doi = {10.1063/1.4996190},
journal = {Applied Physics Letters},
number = 14,
volume = 111,
place = {United States},
year = {2017},
month = {10}
}

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