The effect of electron transport on the characterization of x-ray free-electron laser pulses via ablation
Abstract
The spatial intensity distribution of x-ray free-electron laser (XFEL) pulses in-focus is commonly characterized by performing ablative imprints in thin gold films on silica substrates. In many cases, the range of the electrons generated in the gold by x-ray absorption far exceeds the beam size, and so, it is not clear if the results of imprint studies are compromised by electron transport. Thermal conduction could further modify the energy density profile in the material. We used here a combination of Monte-Carlo transport and continuum models to quantify the accuracy of the imprint method for characterizing XFEL beam profiles. We found that for x-ray energies in the range of 1 to 10 keV, the actual and the measured beam diameters agree within 12% or better for beam diameters between 0.1 and 1 μm.
- Authors:
-
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Publication Date:
- Research Org.:
- Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1512632
- Report Number(s):
- LLNL-JRNL-733619
Journal ID: ISSN 0003-6951; 885501
- Grant/Contract Number:
- AC52-07NA27344
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Applied Physics Letters
- Additional Journal Information:
- Journal Volume: 111; Journal Issue: 14; Journal ID: ISSN 0003-6951
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; free electron lasers; electronic transport; electromagnetic optics; stopping power; transition metals; thin films; Auger effect; hard X-rays; thermodynamic states and processes
Citation Formats
Hau-Riege, Stefan P., and Pardini, Tom. The effect of electron transport on the characterization of x-ray free-electron laser pulses via ablation. United States: N. p., 2017.
Web. doi:10.1063/1.4996190.
Hau-Riege, Stefan P., & Pardini, Tom. The effect of electron transport on the characterization of x-ray free-electron laser pulses via ablation. United States. https://doi.org/10.1063/1.4996190
Hau-Riege, Stefan P., and Pardini, Tom. Tue .
"The effect of electron transport on the characterization of x-ray free-electron laser pulses via ablation". United States. https://doi.org/10.1063/1.4996190. https://www.osti.gov/servlets/purl/1512632.
@article{osti_1512632,
title = {The effect of electron transport on the characterization of x-ray free-electron laser pulses via ablation},
author = {Hau-Riege, Stefan P. and Pardini, Tom},
abstractNote = {The spatial intensity distribution of x-ray free-electron laser (XFEL) pulses in-focus is commonly characterized by performing ablative imprints in thin gold films on silica substrates. In many cases, the range of the electrons generated in the gold by x-ray absorption far exceeds the beam size, and so, it is not clear if the results of imprint studies are compromised by electron transport. Thermal conduction could further modify the energy density profile in the material. We used here a combination of Monte-Carlo transport and continuum models to quantify the accuracy of the imprint method for characterizing XFEL beam profiles. We found that for x-ray energies in the range of 1 to 10 keV, the actual and the measured beam diameters agree within 12% or better for beam diameters between 0.1 and 1 μm.},
doi = {10.1063/1.4996190},
journal = {Applied Physics Letters},
number = 14,
volume = 111,
place = {United States},
year = {Tue Oct 03 00:00:00 EDT 2017},
month = {Tue Oct 03 00:00:00 EDT 2017}
}
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Figures / Tables:
FIG. 1: Energy density profile in eV/atom for an XFEL beam with FWHM of 110 nm, a peak x-ray dose of 0.95 eV/atom in gold, corresponding to the boiling point of gold, and x-ray energies of (a) 1 keV, (b) 4 keV, (c) 7 keV, and (d) 10 keV.
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Current Status of Single Particle Imaging with X-ray Lasers
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