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Title: Spectroscopic ellipsometry extraction of optical constants for materials from oxide covered samples: Application to the plutonium/oxides system

Authors:
 [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1]
  1. Lawrence Livermore National Laboratory, Livermore, California 94551, USA
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1512338
Grant/Contract Number:  
AC52-07NA27344.
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Name: Journal of Applied Physics Journal Volume: 125 Journal Issue: 18; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English

Citation Formats

Dinh, L. N., Stanford, J. A., Saw, C. K., Nelson, A. J., Gollott, R., Haschke, J. M., Allen, P. G., Gardner, C., Hrousis, C., Siekhaus, W. J., and McLean, II, W. Spectroscopic ellipsometry extraction of optical constants for materials from oxide covered samples: Application to the plutonium/oxides system. United States: N. p., 2019. Web. doi:10.1063/1.5092129.
Dinh, L. N., Stanford, J. A., Saw, C. K., Nelson, A. J., Gollott, R., Haschke, J. M., Allen, P. G., Gardner, C., Hrousis, C., Siekhaus, W. J., & McLean, II, W. Spectroscopic ellipsometry extraction of optical constants for materials from oxide covered samples: Application to the plutonium/oxides system. United States. doi:10.1063/1.5092129.
Dinh, L. N., Stanford, J. A., Saw, C. K., Nelson, A. J., Gollott, R., Haschke, J. M., Allen, P. G., Gardner, C., Hrousis, C., Siekhaus, W. J., and McLean, II, W. Tue . "Spectroscopic ellipsometry extraction of optical constants for materials from oxide covered samples: Application to the plutonium/oxides system". United States. doi:10.1063/1.5092129.
@article{osti_1512338,
title = {Spectroscopic ellipsometry extraction of optical constants for materials from oxide covered samples: Application to the plutonium/oxides system},
author = {Dinh, L. N. and Stanford, J. A. and Saw, C. K. and Nelson, A. J. and Gollott, R. and Haschke, J. M. and Allen, P. G. and Gardner, C. and Hrousis, C. and Siekhaus, W. J. and McLean, II, W.},
abstractNote = {},
doi = {10.1063/1.5092129},
journal = {Journal of Applied Physics},
number = 18,
volume = 125,
place = {United States},
year = {2019},
month = {5}
}

Journal Article:
Free Publicly Available Full Text
This content will become publicly available on May 13, 2020
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