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Title: Application of wavelet analysis on transient reflectivity in ultra-thin films

Abstract

Applications of wavelet analysis in ultra-thin film transient reflectivity (TR) measurements have been investigated. Advantages of utilizing different localized wavelet bases, in position and time, have been addressed on the residual TR signals. Morse wavelets have been used to obtain information from the abrupt oscillatory modes in the signal, which are not distinguishable with conventional methods such as Fourier transforms. These abrupt oscillatory modes are caused by the surface, interface, or any short-lived oscillatory modes which are suppressed in the TR signal in ultra-thin films. It is demonstrated that by choosing different Morse wavelets, information regarding different oscillatory modes in the TR signal of a heterostructure thin film is achievable. Moreover, by performing wavelet analysis on multiferroic heterostructures, oscillators modes with very close energy ranges are easily distinguishable. For illustration, residuals of the TR signals have been obtained by a pump-probe set up in reflectivity mode on La0.7Sr0.3MnO3/SrTiO3 and BaTiO3/La0.7Sr0.3MnO3/SrTiO3 samples where sufficient signal to noise ratios have been achieved by taking multiple scans. The residual signals have been analyzed with Morse wavelets, and multiple oscillatory modes with close energy ranges have been observed and distinguished. This approach can isolate the location of various oscillatory modes at the surface interfacemore » and in the bulk of the heterostructure sample« less

Authors:
ORCiD logo; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
West Virginia Univ., Morgantown, WV (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); National Science Foundation (NSF)
OSTI Identifier:
1511084
Alternate Identifier(s):
OSTI ID: 1594028
Grant/Contract Number:  
SC0016176; DMR-1608656
Resource Type:
Published Article
Journal Name:
Optics Express
Additional Journal Information:
Journal Name: Optics Express Journal Volume: 27 Journal Issue: 10; Journal ID: ISSN 1094-4087
Publisher:
Optical Society of America (OSA)
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING

Citation Formats

Sarraf, S. Yousefi, Trappen, R., Kumari, S., Bhandari, G., Mottaghi, N., Huang, C. Y., Cabrera, G. B., Bristow, A. D., and Holcomb, M. B. Application of wavelet analysis on transient reflectivity in ultra-thin films. United States: N. p., 2019. Web. doi:10.1364/OE.27.014684.
Sarraf, S. Yousefi, Trappen, R., Kumari, S., Bhandari, G., Mottaghi, N., Huang, C. Y., Cabrera, G. B., Bristow, A. D., & Holcomb, M. B. Application of wavelet analysis on transient reflectivity in ultra-thin films. United States. doi:10.1364/OE.27.014684.
Sarraf, S. Yousefi, Trappen, R., Kumari, S., Bhandari, G., Mottaghi, N., Huang, C. Y., Cabrera, G. B., Bristow, A. D., and Holcomb, M. B. Mon . "Application of wavelet analysis on transient reflectivity in ultra-thin films". United States. doi:10.1364/OE.27.014684.
@article{osti_1511084,
title = {Application of wavelet analysis on transient reflectivity in ultra-thin films},
author = {Sarraf, S. Yousefi and Trappen, R. and Kumari, S. and Bhandari, G. and Mottaghi, N. and Huang, C. Y. and Cabrera, G. B. and Bristow, A. D. and Holcomb, M. B.},
abstractNote = {Applications of wavelet analysis in ultra-thin film transient reflectivity (TR) measurements have been investigated. Advantages of utilizing different localized wavelet bases, in position and time, have been addressed on the residual TR signals. Morse wavelets have been used to obtain information from the abrupt oscillatory modes in the signal, which are not distinguishable with conventional methods such as Fourier transforms. These abrupt oscillatory modes are caused by the surface, interface, or any short-lived oscillatory modes which are suppressed in the TR signal in ultra-thin films. It is demonstrated that by choosing different Morse wavelets, information regarding different oscillatory modes in the TR signal of a heterostructure thin film is achievable. Moreover, by performing wavelet analysis on multiferroic heterostructures, oscillators modes with very close energy ranges are easily distinguishable. For illustration, residuals of the TR signals have been obtained by a pump-probe set up in reflectivity mode on La0.7Sr0.3MnO3/SrTiO3 and BaTiO3/La0.7Sr0.3MnO3/SrTiO3 samples where sufficient signal to noise ratios have been achieved by taking multiple scans. The residual signals have been analyzed with Morse wavelets, and multiple oscillatory modes with close energy ranges have been observed and distinguished. This approach can isolate the location of various oscillatory modes at the surface interface and in the bulk of the heterostructure sample},
doi = {10.1364/OE.27.014684},
journal = {Optics Express},
number = 10,
volume = 27,
place = {United States},
year = {2019},
month = {5}
}

Journal Article:
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DOI: 10.1364/OE.27.014684

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