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Title: Application of wavelet analysis on transient reflectivity in ultra-thin films

Authors:
ORCiD logo; ; ; ; ; ; ; ;
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1511084
Grant/Contract Number:  
SC0016176
Resource Type:
Published Article
Journal Name:
Optics Express
Additional Journal Information:
Journal Name: Optics Express Journal Volume: 27 Journal Issue: 10; Journal ID: ISSN 1094-4087
Publisher:
Optical Society of America
Country of Publication:
United States
Language:
English

Citation Formats

Sarraf, S. Yousefi, Trappen, R., Kumari, S., Bhandari, G., Mottaghi, N., Huang, C. Y., Cabrera, G. B., Bristow, A. D., and Holcomb, M. B. Application of wavelet analysis on transient reflectivity in ultra-thin films. United States: N. p., 2019. Web. doi:10.1364/OE.27.014684.
Sarraf, S. Yousefi, Trappen, R., Kumari, S., Bhandari, G., Mottaghi, N., Huang, C. Y., Cabrera, G. B., Bristow, A. D., & Holcomb, M. B. Application of wavelet analysis on transient reflectivity in ultra-thin films. United States. doi:10.1364/OE.27.014684.
Sarraf, S. Yousefi, Trappen, R., Kumari, S., Bhandari, G., Mottaghi, N., Huang, C. Y., Cabrera, G. B., Bristow, A. D., and Holcomb, M. B. Mon . "Application of wavelet analysis on transient reflectivity in ultra-thin films". United States. doi:10.1364/OE.27.014684.
@article{osti_1511084,
title = {Application of wavelet analysis on transient reflectivity in ultra-thin films},
author = {Sarraf, S. Yousefi and Trappen, R. and Kumari, S. and Bhandari, G. and Mottaghi, N. and Huang, C. Y. and Cabrera, G. B. and Bristow, A. D. and Holcomb, M. B.},
abstractNote = {},
doi = {10.1364/OE.27.014684},
journal = {Optics Express},
number = 10,
volume = 27,
place = {United States},
year = {2019},
month = {5}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1364/OE.27.014684

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