Comparative operando XPS studies of quasi-Fermi level splitting and open-circuit voltage in CZTSe/CdS and CIGS/CdS junctions and device structures
Abstract
This contribution describes operando x-ray photoelectron spectroscopy (opXPS) studies of Cu(In,Ga)Se2 (CIGS) and Cu2ZnSnSe4 (CZTSe) absorber layers and device structures. X-ray-excited valence-band and core-level spectra were acquired on bare absorber surfaces and after CdS and ZnO:Al depositions in standard absorber/CdS/ZnO/ZnO:Al device stacks. OpXPS data sets were acquired at various x-ray fluxes, with and without white-light illumination. From these measurements, quasi-Fermi level splitting (ΔEF) values in the absorber/CdS junctions were measured directly as a function of excitation conditions. For both CIGS and CZTSe, results show that ..delta..EF proportional to the full open-circuit voltage (VOC) of the completed devices is present after the deposition of the CdS layer - i.e., EF = qVOC - demonstrating that the so-called VOC deficit in CZTSe solar cells is also present at this stage of processing. The authors find that photoexcitation due to x-rays or stray visible light during XPS or similar measurements can produce measurable photovoltages in materials, absorber/CdS junctions, and finished devices. In situ current density versus voltage measurements on a typical CIGS device reveal that x-ray-induced photoexcitation associated with typical XPS measurement conditions is equivalent to ~3 x 10-3 suns, which in this study produced VOC = 440 mV. These findings demonstrate thatmore »
- Authors:
-
- National Renewable Energy Lab. (NREL), Golden, CO (United States)
- Stion Corporation, San Jose, CA (United States)
- Publication Date:
- Research Org.:
- National Renewable Energy Lab. (NREL), Golden, CO (United States)
- Sponsoring Org.:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
- OSTI Identifier:
- 1515765
- Alternate Identifier(s):
- OSTI ID: 1510830
- Report Number(s):
- NREL/JA-5K00-63930
Journal ID: ISSN 0734-2101
- Grant/Contract Number:
- AC36-08GO28308
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Journal of Vacuum Science and Technology A
- Additional Journal Information:
- Journal Volume: 37; Journal Issue: 3; Journal ID: ISSN 0734-2101
- Publisher:
- American Vacuum Society
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; X-ray photoelectron spectroscopy; transition metal chalcogenides; electronic bandstructure; photoexcitations; electrical properties and parameters
Citation Formats
Teeter, Glenn R., Harvey, Steven P., Perkins, Craig, Ramanathan, Kannan, and Repins, Ingrid L. Comparative operando XPS studies of quasi-Fermi level splitting and open-circuit voltage in CZTSe/CdS and CIGS/CdS junctions and device structures. United States: N. p., 2019.
Web. doi:10.1116/1.5090345.
Teeter, Glenn R., Harvey, Steven P., Perkins, Craig, Ramanathan, Kannan, & Repins, Ingrid L. Comparative operando XPS studies of quasi-Fermi level splitting and open-circuit voltage in CZTSe/CdS and CIGS/CdS junctions and device structures. United States. https://doi.org/10.1116/1.5090345
Teeter, Glenn R., Harvey, Steven P., Perkins, Craig, Ramanathan, Kannan, and Repins, Ingrid L. Mon .
"Comparative operando XPS studies of quasi-Fermi level splitting and open-circuit voltage in CZTSe/CdS and CIGS/CdS junctions and device structures". United States. https://doi.org/10.1116/1.5090345. https://www.osti.gov/servlets/purl/1515765.
@article{osti_1515765,
title = {Comparative operando XPS studies of quasi-Fermi level splitting and open-circuit voltage in CZTSe/CdS and CIGS/CdS junctions and device structures},
author = {Teeter, Glenn R. and Harvey, Steven P. and Perkins, Craig and Ramanathan, Kannan and Repins, Ingrid L.},
abstractNote = {This contribution describes operando x-ray photoelectron spectroscopy (opXPS) studies of Cu(In,Ga)Se2 (CIGS) and Cu2ZnSnSe4 (CZTSe) absorber layers and device structures. X-ray-excited valence-band and core-level spectra were acquired on bare absorber surfaces and after CdS and ZnO:Al depositions in standard absorber/CdS/ZnO/ZnO:Al device stacks. OpXPS data sets were acquired at various x-ray fluxes, with and without white-light illumination. From these measurements, quasi-Fermi level splitting (ΔEF) values in the absorber/CdS junctions were measured directly as a function of excitation conditions. For both CIGS and CZTSe, results show that ..delta..EF proportional to the full open-circuit voltage (VOC) of the completed devices is present after the deposition of the CdS layer - i.e., EF = qVOC - demonstrating that the so-called VOC deficit in CZTSe solar cells is also present at this stage of processing. The authors find that photoexcitation due to x-rays or stray visible light during XPS or similar measurements can produce measurable photovoltages in materials, absorber/CdS junctions, and finished devices. In situ current density versus voltage measurements on a typical CIGS device reveal that x-ray-induced photoexcitation associated with typical XPS measurement conditions is equivalent to ~3 x 10-3 suns, which in this study produced VOC = 440 mV. These findings demonstrate that accounting for photoexcitation conditions during XPS or similar measurements can improve band-offset determinations and produce more reliable values for the junction built-in voltage. The implications of the study findings on the CZTSe VOC deficit and device performance are discussed.},
doi = {10.1116/1.5090345},
journal = {Journal of Vacuum Science and Technology A},
number = 3,
volume = 37,
place = {United States},
year = {Mon May 06 00:00:00 EDT 2019},
month = {Mon May 06 00:00:00 EDT 2019}
}
Web of Science