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Title: Comparative operando XPS studies of quasi-Fermi level splitting and open-circuit voltage in CZTSe/CdS and CIGS/CdS junctions and device structures

Abstract

This contribution describes operando x-ray photoelectron spectroscopy (opXPS) studies of Cu(In,Ga)Se2 (CIGS) and Cu2ZnSnSe4 (CZTSe) absorber layers and device structures. X-ray-excited valence-band and core-level spectra were acquired on bare absorber surfaces and after CdS and ZnO:Al depositions in standard absorber/CdS/ZnO/ZnO:Al device stacks. OpXPS data sets were acquired at various x-ray fluxes, with and without white-light illumination. From these measurements, quasi-Fermi level splitting (ΔEF) values in the absorber/CdS junctions were measured directly as a function of excitation conditions. For both CIGS and CZTSe, results show that ..delta..EF proportional to the full open-circuit voltage (VOC) of the completed devices is present after the deposition of the CdS layer - i.e., EF = qVOC - demonstrating that the so-called VOC deficit in CZTSe solar cells is also present at this stage of processing. The authors find that photoexcitation due to x-rays or stray visible light during XPS or similar measurements can produce measurable photovoltages in materials, absorber/CdS junctions, and finished devices. In situ current density versus voltage measurements on a typical CIGS device reveal that x-ray-induced photoexcitation associated with typical XPS measurement conditions is equivalent to ~3 x 10-3 suns, which in this study produced VOC = 440 mV. These findings demonstrate thatmore » accounting for photoexcitation conditions during XPS or similar measurements can improve band-offset determinations and produce more reliable values for the junction built-in voltage. The implications of the study findings on the CZTSe VOC deficit and device performance are discussed.« less

Authors:
 [1]; ORCiD logo [1];  [1];  [2];  [1]
  1. National Renewable Energy Lab. (NREL), Golden, CO (United States)
  2. Stion Corporation, San Jose, CA (United States)
Publication Date:
Research Org.:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
OSTI Identifier:
1515765
Alternate Identifier(s):
OSTI ID: 1510830
Report Number(s):
NREL/JA-5K00-63930
Journal ID: ISSN 0734-2101
Grant/Contract Number:  
AC36-08GO28308
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Vacuum Science and Technology A
Additional Journal Information:
Journal Volume: 37; Journal Issue: 3; Journal ID: ISSN 0734-2101
Publisher:
American Vacuum Society
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; X-ray photoelectron spectroscopy; transition metal chalcogenides; electronic bandstructure; photoexcitations; electrical properties and parameters

Citation Formats

Teeter, Glenn R., Harvey, Steven P., Perkins, Craig, Ramanathan, Kannan, and Repins, Ingrid L. Comparative operando XPS studies of quasi-Fermi level splitting and open-circuit voltage in CZTSe/CdS and CIGS/CdS junctions and device structures. United States: N. p., 2019. Web. doi:10.1116/1.5090345.
Teeter, Glenn R., Harvey, Steven P., Perkins, Craig, Ramanathan, Kannan, & Repins, Ingrid L. Comparative operando XPS studies of quasi-Fermi level splitting and open-circuit voltage in CZTSe/CdS and CIGS/CdS junctions and device structures. United States. https://doi.org/10.1116/1.5090345
Teeter, Glenn R., Harvey, Steven P., Perkins, Craig, Ramanathan, Kannan, and Repins, Ingrid L. Mon . "Comparative operando XPS studies of quasi-Fermi level splitting and open-circuit voltage in CZTSe/CdS and CIGS/CdS junctions and device structures". United States. https://doi.org/10.1116/1.5090345. https://www.osti.gov/servlets/purl/1515765.
@article{osti_1515765,
title = {Comparative operando XPS studies of quasi-Fermi level splitting and open-circuit voltage in CZTSe/CdS and CIGS/CdS junctions and device structures},
author = {Teeter, Glenn R. and Harvey, Steven P. and Perkins, Craig and Ramanathan, Kannan and Repins, Ingrid L.},
abstractNote = {This contribution describes operando x-ray photoelectron spectroscopy (opXPS) studies of Cu(In,Ga)Se2 (CIGS) and Cu2ZnSnSe4 (CZTSe) absorber layers and device structures. X-ray-excited valence-band and core-level spectra were acquired on bare absorber surfaces and after CdS and ZnO:Al depositions in standard absorber/CdS/ZnO/ZnO:Al device stacks. OpXPS data sets were acquired at various x-ray fluxes, with and without white-light illumination. From these measurements, quasi-Fermi level splitting (ΔEF) values in the absorber/CdS junctions were measured directly as a function of excitation conditions. For both CIGS and CZTSe, results show that ..delta..EF proportional to the full open-circuit voltage (VOC) of the completed devices is present after the deposition of the CdS layer - i.e., EF = qVOC - demonstrating that the so-called VOC deficit in CZTSe solar cells is also present at this stage of processing. The authors find that photoexcitation due to x-rays or stray visible light during XPS or similar measurements can produce measurable photovoltages in materials, absorber/CdS junctions, and finished devices. In situ current density versus voltage measurements on a typical CIGS device reveal that x-ray-induced photoexcitation associated with typical XPS measurement conditions is equivalent to ~3 x 10-3 suns, which in this study produced VOC = 440 mV. These findings demonstrate that accounting for photoexcitation conditions during XPS or similar measurements can improve band-offset determinations and produce more reliable values for the junction built-in voltage. The implications of the study findings on the CZTSe VOC deficit and device performance are discussed.},
doi = {10.1116/1.5090345},
journal = {Journal of Vacuum Science and Technology A},
number = 3,
volume = 37,
place = {United States},
year = {Mon May 06 00:00:00 EDT 2019},
month = {Mon May 06 00:00:00 EDT 2019}
}

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