Nanoscale elastic strain mapping of polycrystalline materials
Abstract
Measuring elastic strain with nanoscale resolution has historically been very difficult and required a marriage of simulations and experiments. Nano precession electron diffraction provides excellent strain and spatial resolution but has traditionally only been applied to single-crystalline semiconductors. The present study illustrates that the technique can also be applied to polycrystalline materials. The strain resolution was determined to be 0.15% and 0.10% for polycrystalline copper and boron carbide, respectively. Local strain maps were obtained near grain boundaries in boron carbide and dislocations in magnesium and shown to correlate with expected values, thus demonstrating the efficacy of this technique. This study demonstrates that nano precession electron diffraction can be extended from semiconductor devices to polycrystalline metals and ceramics to map nanoscale elastic strain fields with high strain resolution.
- Publication Date:
- Research Org.:
- Johns Hopkins Univ., Baltimore, MD (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1510472
- Grant/Contract Number:
- FG02-07ER46437
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Materials Research Letters
- Additional Journal Information:
- Journal Volume: 6; Journal Issue: 4; Journal ID: ISSN 2166-3831
- Publisher:
- Taylor and Francis
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE
Citation Formats
Rottmann, Paul F., and Hemker, Kevin J.. Nanoscale elastic strain mapping of polycrystalline materials. United States: N. p., 2018.
Web. doi:10.1080/21663831.2018.1436609.
Rottmann, Paul F., & Hemker, Kevin J.. Nanoscale elastic strain mapping of polycrystalline materials. United States. https://doi.org/10.1080/21663831.2018.1436609
Rottmann, Paul F., and Hemker, Kevin J.. Tue .
"Nanoscale elastic strain mapping of polycrystalline materials". United States. https://doi.org/10.1080/21663831.2018.1436609. https://www.osti.gov/servlets/purl/1510472.
@article{osti_1510472,
title = {Nanoscale elastic strain mapping of polycrystalline materials},
author = {Rottmann, Paul F. and Hemker, Kevin J.},
abstractNote = {Measuring elastic strain with nanoscale resolution has historically been very difficult and required a marriage of simulations and experiments. Nano precession electron diffraction provides excellent strain and spatial resolution but has traditionally only been applied to single-crystalline semiconductors. The present study illustrates that the technique can also be applied to polycrystalline materials. The strain resolution was determined to be 0.15% and 0.10% for polycrystalline copper and boron carbide, respectively. Local strain maps were obtained near grain boundaries in boron carbide and dislocations in magnesium and shown to correlate with expected values, thus demonstrating the efficacy of this technique. This study demonstrates that nano precession electron diffraction can be extended from semiconductor devices to polycrystalline metals and ceramics to map nanoscale elastic strain fields with high strain resolution.},
doi = {10.1080/21663831.2018.1436609},
journal = {Materials Research Letters},
number = 4,
volume = 6,
place = {United States},
year = {2018},
month = {2}
}
Free Publicly Available Full Text
Publisher's Version of Record
Other availability
Search WorldCat to find libraries that may hold this journal
Cited by: 17 works
Citation information provided by
Web of Science
Web of Science
Figures / Tables:
Figure 1: Virtual STEM images and respective ϵyy maps recorded from (a) boron carbide and (b) copper. Diffraction patterns were recorded from highlighted regions in STEM images and strain was calculated relative to horizontal and vertical directions using the central most DP as a strain reference.
All figures and tables
(6 total)
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.
Works referenced in this record:
Plastic Strain Mapping with Sub-micron Resolution Using Digital Image Correlation
journal, October 2012
- Di Gioacchino, F.; Quinta da Fonseca, J.
- Experimental Mechanics, Vol. 53, Issue 5
Precession Electron Diffraction Assisted Orientation Mapping in the Transmission Electron Microscope
journal, March 2010
- Portillo, Joaquim; Rauch, Edgar F.; Nicolopoulos, Stavros
- Materials Science Forum, Vol. 644
Microstructural Characterization of a Commercial Hot-Pressed Boron Carbide Armor Plate
journal, May 2016
- Xie, Kelvin Y.; Kuwelkar, Kanak; Haber, Richard A.
- Journal of the American Ceramic Society, Vol. 99, Issue 8
Phase, grain structure, stress, and resistivity of sputter-deposited tungsten films
journal, September 2011
- Choi, Dooho; Wang, Bincheng; Chung, Suk
- Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 29, Issue 5
Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction
journal, November 2015
- Mahr, Christoph; Müller-Caspary, Knut; Grieb, Tim
- Ultramicroscopy, Vol. 158
Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope
journal, January 2016
- Cooper, David; Denneulin, Thibaud; Bernier, Nicolas
- Micron, Vol. 80
A direct method for the determination of the mean orientation-dependent elastic strains and stresses in polycrystalline materials from strain pole figures
journal, May 2006
- Bernier, Joel V.; Miller, Matthew P.
- Journal of Applied Crystallography, Vol. 39, Issue 3
Strain evaluation of strained-Si layers on SiGe by the nano-beam electron diffraction (NBD) method
journal, February 2005
- Usuda, Koji; Numata, Toshinori; Takagi, Shinichi
- Materials Science in Semiconductor Processing, Vol. 8, Issue 1-3
Residual stress. Part 1 – Measurement techniques
journal, April 2001
- Withers, P. J.; Bhadeshia, H. K. D. H.
- Materials Science and Technology, Vol. 17, Issue 4
Piezoresistance Effect in Germanium and Silicon
journal, April 1954
- Smith, Charles S.
- Physical Review, Vol. 94, Issue 1
Strain Measurement in Semiconductor Heterostructures by Scanning Transmission Electron Microscopy
journal, October 2012
- Müller, Knut; Rosenauer, Andreas; Schowalter, Marco
- Microscopy and Microanalysis, Vol. 18, Issue 5
Improved precision in strain measurement using nanobeam electron diffraction
journal, September 2009
- Béché, A.; Rouvière, J. L.; Clément, L.
- Applied Physics Letters, Vol. 95, Issue 12
Direct measurement of local lattice distortions in strained layer structures by HREM
journal, February 1993
- Bierwolf, R.; Hohenstein, M.; Phillipp, F.
- Ultramicroscopy, Vol. 49, Issue 1-4
An efficient, simple, and precise way to map strain with nanometer resolution in semiconductor devices
journal, March 2010
- Koch, Christoph T.; Özdöl, V. Burak; van Aken, Peter A.
- Applied Physics Letters, Vol. 96, Issue 9
Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping
journal, May 2017
- Pekin, Thomas C.; Gammer, Christoph; Ciston, Jim
- Ultramicroscopy, Vol. 176
Evaluation of two-dimensional strain distribution by STEM/NBD
journal, July 2011
- Uesugi, Fumihiko; Hokazono, Akira; Takeno, Shiro
- Ultramicroscopy, Vol. 111, Issue 8
Improved strain precision with high spatial resolution using nanobeam precession electron diffraction
journal, December 2013
- Rouviere, Jean-Luc; Béché, Armand; Martin, Yannick
- Applied Physics Letters, Vol. 103, Issue 24
Breaking the icosahedra in boron carbide
journal, October 2016
- Xie, Kelvin Y.; An, Qi; Sato, Takanori
- Proceedings of the National Academy of Sciences, Vol. 113, Issue 43
Strain mapping at nanometer resolution using advanced nano-beam electron diffraction
journal, June 2015
- Ozdol, V. B.; Gammer, C.; Jin, X. G.
- Applied Physics Letters, Vol. 106, Issue 25
Applications of Automated High Resolution Strain Mapping in TEM on the Study of Strain Distribution in MOSFETs
journal, August 2014
- Darbal, A. D.; Narayan, R. D.; Vartuli, C.
- Microscopy and Microanalysis, Vol. 20, Issue S3
Measuring and modeling distributions of stress state in deforming polycrystals
journal, September 2008
- Miller, M. P.; Park, J. -S.; Dawson, P. R.
- Acta Materialia, Vol. 56, Issue 15
Orientation and phase mapping in the transmission electron microscope using precession-assisted diffraction spot recognition: state-of-the-art results: REVIEW OF PACOM (ASTAR) APPLICATION
journal, July 2013
- Viladot, D.; VÉRon, M.; Gemmi, M.
- Journal of Microscopy, Vol. 252, Issue 1
Strain mapping at the nanoscale using precession electron diffraction in transmission electron microscope with off axis camera
journal, November 2014
- Vigouroux, M. P.; Delaye, V.; Bernier, N.
- Applied Physics Letters, Vol. 105, Issue 19
Thermal expansion of nanocrystalline boron carbide
journal, July 2012
- Pilladi, Trinadha Raja; Panneerselvam, G.; Anthonysamy, S.
- Ceramics International, Vol. 38, Issue 5
Cross-sectional stress distribution in Al x Ga 1-x N heterostructure on Si(111) substrate characterized by ion beam layer removal method and precession electron diffraction
journal, September 2016
- Reisinger, M.; Zalesak, J.; Daniel, R.
- Materials & Design, Vol. 106
Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films
journal, February 2003
- Tamura, N.; MacDowell, A. A.; Spolenak, R.
- Journal of Synchrotron Radiation, Vol. 10, Issue 2
Strength and Creep in Boron Carbide (B4C) and Aluminum Dodecaboride (α-AlB12)
journal, October 2000
- Abzianidze, T. G.; Eristavi, A. M.; Shalamberidze, S. O.
- Journal of Solid State Chemistry, Vol. 154, Issue 1
Fundamentals of silicon material properties for successful exploitation of strain engineering in modern CMOS manufacturing
journal, May 2006
- Chidambaram, P. R.; Bowen, C.; Chakravarthi, S.
- IEEE Transactions on Electron Devices, Vol. 53, Issue 5
Automated crystal orientation and phase mapping in TEM
journal, December 2014
- Rauch, E. F.; Véron, M.
- Materials Characterization, Vol. 98
Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography
journal, August 2013
- Béché, A.; Rouvière, J. L.; Barnes, J. P.
- Ultramicroscopy, Vol. 131
Residual stresses in annealed zircaloy
journal, March 1989
- MacEwen, S. R.; Tome, C.; Faber, J.
- Acta Metallurgica, Vol. 37, Issue 3
Diffraction imaging of nanocrystalline structures in organic semiconductor molecular thin films
journal, June 2019
- Panova, Ouliana; Ophus, Colin; Takacs, Christopher J.
- Nature Materials, Vol. 18, Issue 8
Strain Measurement in Semiconductor Heterostructures by Scanning Transmission Electron Microscopy
text, January 2012
- Müller, K.; Rosenauer, A.; Schowalter, M.
- Universität Regensburg
Works referencing / citing this record:
Application of Scanning Precession Electron Diffraction in the Transmission Electron Microscope to the Characterization of Deformation in Wadsleyite and Ringwoodite
journal, April 2018
- Nzogang, Billy; Thilliez, Simon; Mussi, Alexandre
- Minerals, Vol. 8, Issue 4
Figures / Tables found in this record:
Figures/Tables have been extracted from DOE-funded journal article accepted manuscripts.