Nanoscale elastic strain mapping of polycrystalline materials

Rottmann, Paul F.; Hemker, Kevin J.

doi:10.1080/21663831.2018.1436609

Title: Nanoscale elastic strain mapping of polycrystalline materials

Journal Article · 20 February 2018 · Materials Research Letters

DOI: https://doi.org/10.1080/21663831.2018.1436609 · OSTI ID:1510472

^[1]; Hemker, Kevin J. ^[1]

Johns Hopkins Univ., Baltimore, MD (United States)

Measuring elastic strain with nanoscale resolution has historically been very difficult and required a marriage of simulations and experiments. Nano precession electron diffraction provides excellent strain and spatial resolution but has traditionally only been applied to single-crystalline semiconductors. The present study illustrates that the technique can also be applied to polycrystalline materials. The strain resolution was determined to be 0.15% and 0.10% for polycrystalline copper and boron carbide, respectively. Local strain maps were obtained near grain boundaries in boron carbide and dislocations in magnesium and shown to correlate with expected values, thus demonstrating the efficacy of this technique. This study demonstrates that nano precession electron diffraction can be extended from semiconductor devices to polycrystalline metals and ceramics to map nanoscale elastic strain fields with high strain resolution.

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Research Organization:: Johns Hopkins Univ., Baltimore, MD (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: FG02-07ER46437

OSTI ID:: 1510472

Journal Information:: Materials Research Letters, Vol. 6, Issue 4; ISSN 2166-3831

Publisher:: Taylor and FrancisCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 19 works

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Nanoscale elastic strain mapping of polycrystalline materials Rottmann, Paul F.; Hemker, Kevin J. https://doi.org/10.6084/m9.figshare.5908984 The current record is a supplement to this text	text	January 2018
Nanoscale elastic strain mapping of polycrystalline materials Rottmann, Paul F.; Hemker, Kevin J. https://doi.org/10.6084/m9.figshare.5908984 The current record is supplemented by this text	text	January 2018