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Title: Nanoscale elastic strain mapping of polycrystalline materials

Abstract

Measuring elastic strain with nanoscale resolution has historically been very difficult and required a marriage of simulations and experiments. Nano precession electron diffraction provides excellent strain and spatial resolution but has traditionally only been applied to single-crystalline semiconductors. The present study illustrates that the technique can also be applied to polycrystalline materials. The strain resolution was determined to be 0.15% and 0.10% for polycrystalline copper and boron carbide, respectively. Local strain maps were obtained near grain boundaries in boron carbide and dislocations in magnesium and shown to correlate with expected values, thus demonstrating the efficacy of this technique. This study demonstrates that nano precession electron diffraction can be extended from semiconductor devices to polycrystalline metals and ceramics to map nanoscale elastic strain fields with high strain resolution.

Authors:
ORCiD logo [1];  [1]
  1. Johns Hopkins Univ., Baltimore, MD (United States)
Publication Date:
Research Org.:
Johns Hopkins Univ., Baltimore, MD (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1510472
Grant/Contract Number:  
FG02-07ER46437
Resource Type:
Accepted Manuscript
Journal Name:
Materials Research Letters
Additional Journal Information:
Journal Volume: 6; Journal Issue: 4; Journal ID: ISSN 2166-3831
Publisher:
Taylor and Francis
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Rottmann, Paul F., and Hemker, Kevin J. Nanoscale elastic strain mapping of polycrystalline materials. United States: N. p., 2018. Web. doi:10.1080/21663831.2018.1436609.
Rottmann, Paul F., & Hemker, Kevin J. Nanoscale elastic strain mapping of polycrystalline materials. United States. doi:10.1080/21663831.2018.1436609.
Rottmann, Paul F., and Hemker, Kevin J. Tue . "Nanoscale elastic strain mapping of polycrystalline materials". United States. doi:10.1080/21663831.2018.1436609. https://www.osti.gov/servlets/purl/1510472.
@article{osti_1510472,
title = {Nanoscale elastic strain mapping of polycrystalline materials},
author = {Rottmann, Paul F. and Hemker, Kevin J.},
abstractNote = {Measuring elastic strain with nanoscale resolution has historically been very difficult and required a marriage of simulations and experiments. Nano precession electron diffraction provides excellent strain and spatial resolution but has traditionally only been applied to single-crystalline semiconductors. The present study illustrates that the technique can also be applied to polycrystalline materials. The strain resolution was determined to be 0.15% and 0.10% for polycrystalline copper and boron carbide, respectively. Local strain maps were obtained near grain boundaries in boron carbide and dislocations in magnesium and shown to correlate with expected values, thus demonstrating the efficacy of this technique. This study demonstrates that nano precession electron diffraction can be extended from semiconductor devices to polycrystalline metals and ceramics to map nanoscale elastic strain fields with high strain resolution.},
doi = {10.1080/21663831.2018.1436609},
journal = {Materials Research Letters},
number = 4,
volume = 6,
place = {United States},
year = {2018},
month = {2}
}

Journal Article:
Free Publicly Available Full Text
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Cited by: 3 works
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Figures / Tables:

Figure 1 Figure 1: Virtual STEM images and respective ϵyy maps recorded from (a) boron carbide and (b) copper. Diffraction patterns were recorded from highlighted regions in STEM images and strain was calculated relative to horizontal and vertical directions using the central most DP as a strain reference.

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Works referenced in this record:

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    Works referencing / citing this record:

    Strength and Creep in Boron Carbide (B4C) and Aluminum Dodecaboride (α-AlB12)
    journal, October 2000

    • Abzianidze, T. G.; Eristavi, A. M.; Shalamberidze, S. O.
    • Journal of Solid State Chemistry, Vol. 154, Issue 1
    • DOI: 10.1006/jssc.2000.8834

    Plastic Strain Mapping with Sub-micron Resolution Using Digital Image Correlation
    journal, October 2012


    Residual stresses in annealed zircaloy
    journal, March 1989


    Measuring and modeling distributions of stress state in deforming polycrystals
    journal, September 2008


    Thermal expansion of nanocrystalline boron carbide
    journal, July 2012


    Automated crystal orientation and phase mapping in TEM
    journal, December 2014


    Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope
    journal, January 2016


    Strain evaluation of strained-Si layers on SiGe by the nano-beam electron diffraction (NBD) method
    journal, February 2005

    • Usuda, Koji; Numata, Toshinori; Takagi, Shinichi
    • Materials Science in Semiconductor Processing, Vol. 8, Issue 1-3
    • DOI: 10.1016/j.mssp.2004.09.105

    Evaluation of two-dimensional strain distribution by STEM/NBD
    journal, July 2011


    Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction
    journal, November 2015


    Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping
    journal, May 2017


    Improved precision in strain measurement using nanobeam electron diffraction
    journal, September 2009

    • Béché, A.; Rouvière, J. L.; Clément, L.
    • Applied Physics Letters, Vol. 95, Issue 12
    • DOI: 10.1063/1.3224886

    An efficient, simple, and precise way to map strain with nanometer resolution in semiconductor devices
    journal, March 2010

    • Koch, Christoph T.; Özdöl, V. Burak; van Aken, Peter A.
    • Applied Physics Letters, Vol. 96, Issue 9
    • DOI: 10.1063/1.3337090

    Improved strain precision with high spatial resolution using nanobeam precession electron diffraction
    journal, December 2013

    • Rouviere, Jean-Luc; Béché, Armand; Martin, Yannick
    • Applied Physics Letters, Vol. 103, Issue 24
    • DOI: 10.1063/1.4829154

    Strain mapping at the nanoscale using precession electron diffraction in transmission electron microscope with off axis camera
    journal, November 2014

    • Vigouroux, M. P.; Delaye, V.; Bernier, N.
    • Applied Physics Letters, Vol. 105, Issue 19
    • DOI: 10.1063/1.4901435

    Strain mapping at nanometer resolution using advanced nano-beam electron diffraction
    journal, June 2015

    • Ozdol, V. B.; Gammer, C.; Jin, X. G.
    • Applied Physics Letters, Vol. 106, Issue 25
    • DOI: 10.1063/1.4922994

    Breaking the icosahedra in boron carbide
    journal, October 2016

    • Xie, Kelvin Y.; An, Qi; Sato, Takanori
    • Proceedings of the National Academy of Sciences, Vol. 113, Issue 43
    • DOI: 10.1073/pnas.1607980113

    Microstructural Characterization of a Commercial Hot-Pressed Boron Carbide Armor Plate
    journal, May 2016

    • Xie, Kelvin Y.; Kuwelkar, Kanak; Haber, Richard A.
    • Journal of the American Ceramic Society, Vol. 99, Issue 8
    • DOI: 10.1111/jace.14295

    Phase, grain structure, stress, and resistivity of sputter-deposited tungsten films
    journal, September 2011

    • Choi, Dooho; Wang, Bincheng; Chung, Suk
    • Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 29, Issue 5
    • DOI: 10.1116/1.3622619

    Residual stress. Part 1 – Measurement techniques
    journal, April 2001


      Figures/Tables have been extracted from DOE-funded journal article accepted manuscripts.