Nanoscale elastic strain mapping of polycrystalline materials
Abstract
Measuring elastic strain with nanoscale resolution has historically been very difficult and required a marriage of simulations and experiments. Nano precession electron diffraction provides excellent strain and spatial resolution but has traditionally only been applied to single-crystalline semiconductors. The present study illustrates that the technique can also be applied to polycrystalline materials. The strain resolution was determined to be 0.15% and 0.10% for polycrystalline copper and boron carbide, respectively. Local strain maps were obtained near grain boundaries in boron carbide and dislocations in magnesium and shown to correlate with expected values, thus demonstrating the efficacy of this technique. This study demonstrates that nano precession electron diffraction can be extended from semiconductor devices to polycrystalline metals and ceramics to map nanoscale elastic strain fields with high strain resolution.
- Publication Date:
- Research Org.:
- Johns Hopkins Univ., Baltimore, MD (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1510472
- Grant/Contract Number:
- FG02-07ER46437
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Materials Research Letters
- Additional Journal Information:
- Journal Volume: 6; Journal Issue: 4; Journal ID: ISSN 2166-3831
- Publisher:
- Taylor and Francis
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE
Citation Formats
Rottmann, Paul F., and Hemker, Kevin J. Nanoscale elastic strain mapping of polycrystalline materials. United States: N. p., 2018.
Web. doi:10.1080/21663831.2018.1436609.
Rottmann, Paul F., & Hemker, Kevin J. Nanoscale elastic strain mapping of polycrystalline materials. United States. https://doi.org/10.1080/21663831.2018.1436609
Rottmann, Paul F., and Hemker, Kevin J. Tue .
"Nanoscale elastic strain mapping of polycrystalline materials". United States. https://doi.org/10.1080/21663831.2018.1436609. https://www.osti.gov/servlets/purl/1510472.
@article{osti_1510472,
title = {Nanoscale elastic strain mapping of polycrystalline materials},
author = {Rottmann, Paul F. and Hemker, Kevin J.},
abstractNote = {Measuring elastic strain with nanoscale resolution has historically been very difficult and required a marriage of simulations and experiments. Nano precession electron diffraction provides excellent strain and spatial resolution but has traditionally only been applied to single-crystalline semiconductors. The present study illustrates that the technique can also be applied to polycrystalline materials. The strain resolution was determined to be 0.15% and 0.10% for polycrystalline copper and boron carbide, respectively. Local strain maps were obtained near grain boundaries in boron carbide and dislocations in magnesium and shown to correlate with expected values, thus demonstrating the efficacy of this technique. This study demonstrates that nano precession electron diffraction can be extended from semiconductor devices to polycrystalline metals and ceramics to map nanoscale elastic strain fields with high strain resolution.},
doi = {10.1080/21663831.2018.1436609},
journal = {Materials Research Letters},
number = 4,
volume = 6,
place = {United States},
year = {Tue Feb 20 00:00:00 EST 2018},
month = {Tue Feb 20 00:00:00 EST 2018}
}
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Cited by: 17 works
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Figures / Tables:
Figure 1: Virtual STEM images and respective ϵyy maps recorded from (a) boron carbide and (b) copper. Diffraction patterns were recorded from highlighted regions in STEM images and strain was calculated relative to horizontal and vertical directions using the central most DP as a strain reference.
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Works referencing / citing this record:
Application of Scanning Precession Electron Diffraction in the Transmission Electron Microscope to the Characterization of Deformation in Wadsleyite and Ringwoodite
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Figures / Tables found in this record:
Figures/Tables have been extracted from DOE-funded journal article accepted manuscripts.