Multimode scanning X-ray diffraction microscopy for diamond anvil cell experiments
Abstract
We have designed and implemented a new experimental system for fast mapping of crystal structures and other structural features of materials under high pressure at the High Pressure Collaborative Access Team, Sector 16 of the Advanced Photon Source. The system utilizes scanning X-ray diffraction microscopy (SXDM) and is optimized for use with diamond anvil cell devices. In SXDM, the X-ray diffraction (XRD) is collected in a forward scattering geometry from points on a two-dimensional grid by fly-scanning the sample with respect to a micro-focused X-ray beam. The recording of XRD is made during the continuous motion of the sample using a fast (millisecond) X-ray area detector in synchrony with the sample positioners, resulting in a highly efficient data collection for SXDM. A new computer program, X-ray Diffractive Imaging (XDI), has been developed with the SXDM system. The XDI program provides a graphical interface for constructing and displaying the SXDM images in several modes: (1) phase mapping based on structural information, (2) pressure visualization based on the equation of state, (3) microstructural features mapping based on peak shape parameters, and (4) grain size and preferred-orientation based on peak shape parameters. The XDI is a standalone program and can be generally usedmore »
- Publication Date:
- Research Org.:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- Sponsoring Org.:
- National Science Foundation (NSF); USDOE National Nuclear Security Administration (NNSA); USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities Division; USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division
- OSTI Identifier:
- 1510322
- Grant/Contract Number:
- AC02-06CH11357
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Review of Scientific Instruments
- Additional Journal Information:
- Journal Volume: 90; Journal Issue: 2; Journal ID: ISSN 0034-6748
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION; diamond anvil cell; high pressure; synchrotron x-ray diffraction; x-ray microscopy
Citation Formats
Hrubiak, Rostislav, Smith, Jesse S., and Shen, Guoyin. Multimode scanning X-ray diffraction microscopy for diamond anvil cell experiments. United States: N. p., 2019.
Web. doi:10.1063/1.5057518.
Hrubiak, Rostislav, Smith, Jesse S., & Shen, Guoyin. Multimode scanning X-ray diffraction microscopy for diamond anvil cell experiments. United States. https://doi.org/10.1063/1.5057518
Hrubiak, Rostislav, Smith, Jesse S., and Shen, Guoyin. Tue .
"Multimode scanning X-ray diffraction microscopy for diamond anvil cell experiments". United States. https://doi.org/10.1063/1.5057518. https://www.osti.gov/servlets/purl/1510322.
@article{osti_1510322,
title = {Multimode scanning X-ray diffraction microscopy for diamond anvil cell experiments},
author = {Hrubiak, Rostislav and Smith, Jesse S. and Shen, Guoyin},
abstractNote = {We have designed and implemented a new experimental system for fast mapping of crystal structures and other structural features of materials under high pressure at the High Pressure Collaborative Access Team, Sector 16 of the Advanced Photon Source. The system utilizes scanning X-ray diffraction microscopy (SXDM) and is optimized for use with diamond anvil cell devices. In SXDM, the X-ray diffraction (XRD) is collected in a forward scattering geometry from points on a two-dimensional grid by fly-scanning the sample with respect to a micro-focused X-ray beam. The recording of XRD is made during the continuous motion of the sample using a fast (millisecond) X-ray area detector in synchrony with the sample positioners, resulting in a highly efficient data collection for SXDM. A new computer program, X-ray Diffractive Imaging (XDI), has been developed with the SXDM system. The XDI program provides a graphical interface for constructing and displaying the SXDM images in several modes: (1) phase mapping based on structural information, (2) pressure visualization based on the equation of state, (3) microstructural features mapping based on peak shape parameters, and (4) grain size and preferred-orientation based on peak shape parameters. The XDI is a standalone program and can be generally used for displaying SXDM images. Two examples of iron and zirconium samples under high pressure are presented to demonstrate the applications of SXDM. Published under license by AIP Publishing.},
doi = {10.1063/1.5057518},
journal = {Review of Scientific Instruments},
number = 2,
volume = 90,
place = {United States},
year = {Tue Feb 19 00:00:00 EST 2019},
month = {Tue Feb 19 00:00:00 EST 2019}
}
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