Correlation between hot spots and 3-D defect structure in single and polycrystalline high-explosive materials
Abstract
This article presents a novel approach that spatially identifies inhomogeneities from microscale (defects, con-formational disorder) to mesoscale (voids, inclusions) using synchrotron x-ray methods: tomography, Lang topography, and micro-diffraction mapping. These techniques provide a non-destructive method for characterization of mm-sized samples prior to shock experiments. These characterization maps can be used to correlate continuum level measurements in shock compression experiments to the mesoscale and microscale structure.
- Authors:
-
- National Security Technologies, Las Vegas, NV (United States)
- Univ. of Nevada, Las Vegas, NV (United States)
- National Security Technologies, Las Vegas, NV (United States); Univ. of Nevada, Las Vegas, NV (United States)
- Advanced Photon Source, Argonne, IL (United States)
- Publication Date:
- Research Org.:
- Nevada National Security Site/National Security Technologies, LLC, Las Vegas, NV (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA), Office of Defense Programs (DP)
- OSTI Identifier:
- 1509740
- Report Number(s):
- DOE/NV/25946-3206
Journal ID: ISSN 1877-7058
- Grant/Contract Number:
- AC52-06NA25946
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Procedia Engineering
- Additional Journal Information:
- Journal Volume: 204; Journal Issue: C; Conference: 14th Hypervelocity Impact Symposium 2017, HVIS2017, Canterbury, Kent (United Kingdom), 24-28 Apr 2017; Related Information: Hawkins, M. Cameron, Fussell, Zachary, Tschauner, Oliver, and Smith, Jesse. Correlation between hot spots and 3-D defect structure in single and polycrystalline high-explosive materials. United States: N. p., 2017. Web. Hawkins, M. Cameron, Tschauner, Oliver, Fussell, Zachary, McClure, Jason, Hooks, Daniel, and Smith, Jesse. Correlation Between Hot Spots and 3-D Defect Structure in Single and Polycrystalline High-Explosive Materials NLV-035-16, Year 3 of 3. United States: N. p., 2018. Web.; Journal ID: ISSN 1877-7058
- Publisher:
- Elsevier
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; tomography; Lang topography; HE materials; x-ray diffraction
Citation Formats
Hawkins, Cameron, Tschauner, Oliver, Fussell, Zachary, and Smith, Jesse. Correlation between hot spots and 3-D defect structure in single and polycrystalline high-explosive materials. United States: N. p., 2017.
Web. doi:10.1016/j.proeng.2017.09.778.
Hawkins, Cameron, Tschauner, Oliver, Fussell, Zachary, & Smith, Jesse. Correlation between hot spots and 3-D defect structure in single and polycrystalline high-explosive materials. United States. https://doi.org/10.1016/j.proeng.2017.09.778
Hawkins, Cameron, Tschauner, Oliver, Fussell, Zachary, and Smith, Jesse. Tue .
"Correlation between hot spots and 3-D defect structure in single and polycrystalline high-explosive materials". United States. https://doi.org/10.1016/j.proeng.2017.09.778. https://www.osti.gov/servlets/purl/1509740.
@article{osti_1509740,
title = {Correlation between hot spots and 3-D defect structure in single and polycrystalline high-explosive materials},
author = {Hawkins, Cameron and Tschauner, Oliver and Fussell, Zachary and Smith, Jesse},
abstractNote = {This article presents a novel approach that spatially identifies inhomogeneities from microscale (defects, con-formational disorder) to mesoscale (voids, inclusions) using synchrotron x-ray methods: tomography, Lang topography, and micro-diffraction mapping. These techniques provide a non-destructive method for characterization of mm-sized samples prior to shock experiments. These characterization maps can be used to correlate continuum level measurements in shock compression experiments to the mesoscale and microscale structure.},
doi = {10.1016/j.proeng.2017.09.778},
journal = {Procedia Engineering},
number = C,
volume = 204,
place = {United States},
year = {2017},
month = {10}
}
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Fig. 1: (a) tomogram of an HE C4 sample (full view of sample surface); (b) tomogram of an HE C4 sample (close up view showing a crack); (c) tomogram of an HE C4 sample (close up view showing an inclusion).
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