Time-Resolved X-Ray Microscopy for Materials Science

Wen, Haidan; Cherukara, Mathew J.; Holt, Martin V.

doi:10.1146/annurev-matsci-070616-124014

Title: Time-Resolved X-Ray Microscopy for Materials Science

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Abstract

X-ray microscopy has been an indispensable tool to image nanoscale properties for materials research. One of its recent advances is extending microscopic studies to the time domain to visualize the dynamics of nanoscale phenomena. Large-scale X-ray facilities have been the powerhouse of time-resolved X-ray microscopy. Their upgrades, including a significant reduction of the X-ray emittance at storage rings (SRs) and fully coherent ultrashort X-ray pulses at free-electron lasers (FELs), will lead to new developments in instrumentation and will open new scientific opportunities for X-ray imaging of nanoscale dynamics with the simultaneous attainment of unprecedentedly high spatial and temporal resolutions. As a result, this review presents recent progress in and the outlook for time-resolved X-ray microscopy in the context of ultrafast nanoscale imaging and its applications to condensed matter physics and materials science.

Authors:

Wen, Haidan ^[1]; Cherukara, Mathew J. ^[1]; Holt, Martin V. ^[1]

Argonne National Lab. (ANL), Argonne, IL (United States)

Publication Date:: 2019-04-05

Research Org.:: Argonne National Lab. (ANL), Argonne, IL (United States)

Sponsoring Org.:: USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division

OSTI Identifier:: 1508386

Grant/Contract Number:: AC02-06CH11357

Resource Type:: Accepted Manuscript

Journal Name:: Annual Review of Materials Research

Additional Journal Information:: Journal Volume: 49; Journal Issue: 1; Journal ID: ISSN 1531-7331

Publisher:: Annual Reviews

Country of Publication:: United States

Language:: English

Subject:: 36 MATERIALS SCIENCE; nanoscale; structural dynamics; time-resolved; x-ray microscopy

Citation Formats


                    Wen, Haidan, Cherukara, Mathew J., and Holt, Martin V.. Time-Resolved X-Ray Microscopy for Materials Science.  United States: N. p., 2019. 
Web.  doi:10.1146/annurev-matsci-070616-124014.

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                    Wen, Haidan, Cherukara, Mathew J., & Holt, Martin V.. Time-Resolved X-Ray Microscopy for Materials Science.  United States.  https://doi.org/10.1146/annurev-matsci-070616-124014

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                    Wen, Haidan, Cherukara, Mathew J., and Holt, Martin V.. Fri .  
"Time-Resolved X-Ray Microscopy for Materials Science".  United States.  https://doi.org/10.1146/annurev-matsci-070616-124014.  https://www.osti.gov/servlets/purl/1508386.

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@article{osti_1508386,

  title        = {Time-Resolved X-Ray Microscopy for Materials Science},

  author       = {Wen, Haidan and Cherukara, Mathew J. and Holt, Martin V.},

  abstractNote = {X-ray microscopy has been an indispensable tool to image nanoscale properties for materials research. One of its recent advances is extending microscopic studies to the time domain to visualize the dynamics of nanoscale phenomena. Large-scale X-ray facilities have been the powerhouse of time-resolved X-ray microscopy. Their upgrades, including a significant reduction of the X-ray emittance at storage rings (SRs) and fully coherent ultrashort X-ray pulses at free-electron lasers (FELs), will lead to new developments in instrumentation and will open new scientific opportunities for X-ray imaging of nanoscale dynamics with the simultaneous attainment of unprecedentedly high spatial and temporal resolutions. As a result, this review presents recent progress in and the outlook for time-resolved X-ray microscopy in the context of ultrafast nanoscale imaging and its applications to condensed matter physics and materials science.},

  doi          = {10.1146/annurev-matsci-070616-124014},

  journal      = {Annual Review of Materials Research},

  number       = 1,

  volume       = 49,

  place        = {United States},

  year         = {2019},

  month        = {4}

}

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