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Title: Time-Resolved X-Ray Microscopy for Materials Science

Abstract

X-ray microscopy has been an indispensable tool to image nanoscale properties for materials research. One of its recent advances is extending microscopic studies to the time domain to visualize the dynamics of nanoscale phenomena. Large-scale X-ray facilities have been the powerhouse of time-resolved X-ray microscopy. Their upgrades, including a significant reduction of the X-ray emittance at storage rings (SRs) and fully coherent ultrashort X-ray pulses at free-electron lasers (FELs), will lead to new developments in instrumentation and will open new scientific opportunities for X-ray imaging of nanoscale dynamics with the simultaneous attainment of unprecedentedly high spatial and temporal resolutions. As a result, this review presents recent progress in and the outlook for time-resolved X-ray microscopy in the context of ultrafast nanoscale imaging and its applications to condensed matter physics and materials science.

Authors:
 [1];  [1];  [1]
  1. Argonne National Lab. (ANL), Argonne, IL (United States)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division
OSTI Identifier:
1508386
Grant/Contract Number:  
AC02-06CH11357
Resource Type:
Accepted Manuscript
Journal Name:
Annual Review of Materials Research
Additional Journal Information:
Journal Volume: 49; Journal Issue: 1; Journal ID: ISSN 1531-7331
Publisher:
Annual Reviews
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; nanoscale; structural dynamics; time-resolved; x-ray microscopy

Citation Formats

Wen, Haidan, Cherukara, Mathew J., and Holt, Martin V. Time-Resolved X-Ray Microscopy for Materials Science. United States: N. p., 2019. Web. doi:10.1146/annurev-matsci-070616-124014.
Wen, Haidan, Cherukara, Mathew J., & Holt, Martin V. Time-Resolved X-Ray Microscopy for Materials Science. United States. doi:10.1146/annurev-matsci-070616-124014.
Wen, Haidan, Cherukara, Mathew J., and Holt, Martin V. Fri . "Time-Resolved X-Ray Microscopy for Materials Science". United States. doi:10.1146/annurev-matsci-070616-124014.
@article{osti_1508386,
title = {Time-Resolved X-Ray Microscopy for Materials Science},
author = {Wen, Haidan and Cherukara, Mathew J. and Holt, Martin V.},
abstractNote = {X-ray microscopy has been an indispensable tool to image nanoscale properties for materials research. One of its recent advances is extending microscopic studies to the time domain to visualize the dynamics of nanoscale phenomena. Large-scale X-ray facilities have been the powerhouse of time-resolved X-ray microscopy. Their upgrades, including a significant reduction of the X-ray emittance at storage rings (SRs) and fully coherent ultrashort X-ray pulses at free-electron lasers (FELs), will lead to new developments in instrumentation and will open new scientific opportunities for X-ray imaging of nanoscale dynamics with the simultaneous attainment of unprecedentedly high spatial and temporal resolutions. As a result, this review presents recent progress in and the outlook for time-resolved X-ray microscopy in the context of ultrafast nanoscale imaging and its applications to condensed matter physics and materials science.},
doi = {10.1146/annurev-matsci-070616-124014},
journal = {Annual Review of Materials Research},
number = 1,
volume = 49,
place = {United States},
year = {2019},
month = {4}
}

Journal Article:
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This content will become publicly available on April 5, 2020
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