Time-Resolved X-Ray Microscopy for Materials Science

Journal Article · 05 April 2019 · Annual Review of Materials Research

DOI: https://doi.org/10.1146/annurev-matsci-070616-124014 · OSTI ID:1508386

Wen, Haidan ^[1]; Cherukara, Mathew J. ^[1]; Holt, Martin V. ^[1]

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1. Argonne National Lab. (ANL), Argonne, IL (United States)

X-ray microscopy has been an indispensable tool to image nanoscale properties for materials research. One of its recent advances is extending microscopic studies to the time domain to visualize the dynamics of nanoscale phenomena. Large-scale X-ray facilities have been the powerhouse of time-resolved X-ray microscopy. Their upgrades, including a significant reduction of the X-ray emittance at storage rings (SRs) and fully coherent ultrashort X-ray pulses at free-electron lasers (FELs), will lead to new developments in instrumentation and will open new scientific opportunities for X-ray imaging of nanoscale dynamics with the simultaneous attainment of unprecedentedly high spatial and temporal resolutions. As a result, this review presents recent progress in and the outlook for time-resolved X-ray microscopy in the context of ultrafast nanoscale imaging and its applications to condensed matter physics and materials science.

• Research Organization: Argonne National Laboratory (ANL), Argonne, IL (United States)
• Sponsoring Organization: USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division
• Grant/Contract Number: AC02-06CH11357
• OSTI ID: 1508386
• Journal Information: Annual Review of Materials Research, Vol. 49, Issue 1; ISSN 1531-7331
• Publisher: Annual ReviewsCopyright Statement
• Country of Publication: United States
• Language: English