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Title: Measuring Changes in Inductance With Microstrip Resonators

Abstract

In this work, we measure the frequency dependence of a niobium microstrip resonator as a function of temperature from 1.4 to 8.4 K. In a 2-micrometer-wide half-wave resonator, we find the frequency of resonance changes by a factor of 7 over this temperature range. From the resonant frequencies, we extract inductance per unit length, characteristic impedance, and propagation velocity (group velocity). We discuss how these results relate to superconducting electronics. Over the 2 K to 6 K temperature range where superconducting electronic circuits operate, inductance shows a 19% change and both impedance and propagation velocity show an 11% change.

Authors:
ORCiD logo [1]; ORCiD logo [1];  [1];  [1];  [1]; ORCiD logo [1]
  1. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1507742
Report Number(s):
SAND-2019-2278J
Journal ID: ISSN 1051-8223; 673034
Grant/Contract Number:  
AC04-94AL85000
Resource Type:
Accepted Manuscript
Journal Name:
IEEE Transactions on Applied Superconductivity
Additional Journal Information:
Journal Volume: 29; Journal Issue: 5; Journal ID: ISSN 1051-8223
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; 42 ENGINEERING

Citation Formats

Lewis, Rupert M., Henry, Michael David, Young, Travis Ryan, Frank, Michael P., Wolak, Matthaus A., and Missert, Nancy A.. Measuring Changes in Inductance With Microstrip Resonators. United States: N. p., 2019. Web. doi:10.1109/TASC.2019.2899867.
Lewis, Rupert M., Henry, Michael David, Young, Travis Ryan, Frank, Michael P., Wolak, Matthaus A., & Missert, Nancy A.. Measuring Changes in Inductance With Microstrip Resonators. United States. doi:10.1109/TASC.2019.2899867.
Lewis, Rupert M., Henry, Michael David, Young, Travis Ryan, Frank, Michael P., Wolak, Matthaus A., and Missert, Nancy A.. Mon . "Measuring Changes in Inductance With Microstrip Resonators". United States. doi:10.1109/TASC.2019.2899867.
@article{osti_1507742,
title = {Measuring Changes in Inductance With Microstrip Resonators},
author = {Lewis, Rupert M. and Henry, Michael David and Young, Travis Ryan and Frank, Michael P. and Wolak, Matthaus A. and Missert, Nancy A.},
abstractNote = {In this work, we measure the frequency dependence of a niobium microstrip resonator as a function of temperature from 1.4 to 8.4 K. In a 2-micrometer-wide half-wave resonator, we find the frequency of resonance changes by a factor of 7 over this temperature range. From the resonant frequencies, we extract inductance per unit length, characteristic impedance, and propagation velocity (group velocity). We discuss how these results relate to superconducting electronics. Over the 2 K to 6 K temperature range where superconducting electronic circuits operate, inductance shows a 19% change and both impedance and propagation velocity show an 11% change.},
doi = {10.1109/TASC.2019.2899867},
journal = {IEEE Transactions on Applied Superconductivity},
number = 5,
volume = 29,
place = {United States},
year = {2019},
month = {2}
}

Journal Article:
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This content will become publicly available on February 18, 2020
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