Benchmarking Gate Fidelities in a Two-Qubit Device
Abstract
We report the first complete characterization of single-qubit and two-qubit gate fidelities in silicon-based spin qubits, including cross talk and error correlations between the two qubits. To do so, we use a combination of standard randomized benchmarking and a recently introduced method called character randomized benchmarking, which allows for more reliable estimates of the two-qubit fidelity in this system, here giving a 92% fidelity estimate for the controlled-Z gate. Interestingly, with character randomized benchmarking, the two-qubit gate fidelity can be obtained by studying the additional decay induced by interleaving the two-qubit gate in a reference sequence of single-qubit gates only. This work sets the stage for further improvements in all the relevant gate fidelities in silicon spin qubits beyond the error threshold for fault-tolerant quantum computation.
- Authors:
- Publication Date:
- Research Org.:
- Univ. of Wisconsin, Madison, WI (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC)
- OSTI Identifier:
- 1507615
- Alternate Identifier(s):
- OSTI ID: 1609468
- Grant/Contract Number:
- FG02-03ER46028
- Resource Type:
- Published Article
- Journal Name:
- Physical Review. X
- Additional Journal Information:
- Journal Name: Physical Review. X Journal Volume: 9 Journal Issue: 2; Journal ID: ISSN 2160-3308
- Publisher:
- American Physical Society
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; Physics; Quantum benchmarking; Quantum gates; Quantum information with solid state qubits; Physical Systems; Double quantum dots; Electron spin resonance; Condensed Matter & Materials Physics; Quantum Information
Citation Formats
Xue, X., Watson, T. F., Helsen, J., Ward, D. R., Savage, D. E., Lagally, M. G., Coppersmith, S. N., Eriksson, M. A., Wehner, S., and Vandersypen, L. M. K. Benchmarking Gate Fidelities in a Si / SiGe Two-Qubit Device. United States: N. p., 2019.
Web. doi:10.1103/PhysRevX.9.021011.
Xue, X., Watson, T. F., Helsen, J., Ward, D. R., Savage, D. E., Lagally, M. G., Coppersmith, S. N., Eriksson, M. A., Wehner, S., & Vandersypen, L. M. K. Benchmarking Gate Fidelities in a Si / SiGe Two-Qubit Device. United States. https://doi.org/10.1103/PhysRevX.9.021011
Xue, X., Watson, T. F., Helsen, J., Ward, D. R., Savage, D. E., Lagally, M. G., Coppersmith, S. N., Eriksson, M. A., Wehner, S., and Vandersypen, L. M. K. Thu .
"Benchmarking Gate Fidelities in a Si / SiGe Two-Qubit Device". United States. https://doi.org/10.1103/PhysRevX.9.021011.
@article{osti_1507615,
title = {Benchmarking Gate Fidelities in a Si / SiGe Two-Qubit Device},
author = {Xue, X. and Watson, T. F. and Helsen, J. and Ward, D. R. and Savage, D. E. and Lagally, M. G. and Coppersmith, S. N. and Eriksson, M. A. and Wehner, S. and Vandersypen, L. M. K.},
abstractNote = {We report the first complete characterization of single-qubit and two-qubit gate fidelities in silicon-based spin qubits, including cross talk and error correlations between the two qubits. To do so, we use a combination of standard randomized benchmarking and a recently introduced method called character randomized benchmarking, which allows for more reliable estimates of the two-qubit fidelity in this system, here giving a 92% fidelity estimate for the controlled-Z gate. Interestingly, with character randomized benchmarking, the two-qubit gate fidelity can be obtained by studying the additional decay induced by interleaving the two-qubit gate in a reference sequence of single-qubit gates only. This work sets the stage for further improvements in all the relevant gate fidelities in silicon spin qubits beyond the error threshold for fault-tolerant quantum computation.},
doi = {10.1103/PhysRevX.9.021011},
journal = {Physical Review. X},
number = 2,
volume = 9,
place = {United States},
year = {2019},
month = {4}
}
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1103/PhysRevX.9.021011
https://doi.org/10.1103/PhysRevX.9.021011
Other availability
Search WorldCat to find libraries that may hold this journal
Cited by: 18 works
Citation information provided by
Web of Science
Web of Science
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.
Works referenced in this record:
Gatemon Benchmarking and Two-Qubit Operations
journal, April 2016
- Casparis, L.; Larsen, T. W.; Olsen, M. S.
- Physical Review Letters, Vol. 116, Issue 15
Self-consistent quantum process tomography
journal, June 2013
- Merkel, Seth T.; Gambetta, Jay M.; Smolin, John A.
- Physical Review A, Vol. 87, Issue 6
Efficient controlled-phase gate for single-spin qubits in quantum dots
journal, March 2011
- Meunier, T.; Calado, V. E.; Vandersypen, L. M. K.
- Physical Review B, Vol. 83, Issue 12
Simultaneous Spin-Charge Relaxation in Double Quantum Dots
journal, May 2013
- Srinivasa, V.; Nowack, K. C.; Shafiei, M.
- Physical Review Letters, Vol. 110, Issue 19
What Randomized Benchmarking Actually Measures
journal, September 2017
- Proctor, Timothy; Rudinger, Kenneth; Young, Kevin
- Physical Review Letters, Vol. 119, Issue 13
From randomized benchmarking experiments to gate-set circuit fidelity: how to interpret randomized benchmarking decay parameters
journal, September 2018
- Carignan-Dugas, Arnaud; Boone, Kristine; Wallman, Joel J.
- New Journal of Physics, Vol. 20, Issue 9
Randomized benchmarking of quantum gates
journal, January 2008
- Knill, E.; Leibfried, D.; Reichle, R.
- Physical Review A, Vol. 77, Issue 1
Qubit Architecture with High Coherence and Fast Tunable Coupling
journal, November 2014
- Chen, Yu; Neill, C.; Roushan, P.
- Physical Review Letters, Vol. 113, Issue 22
A fault-tolerant addressable spin qubit in a natural silicon quantum dot
journal, August 2016
- Takeda, Kenta; Kamioka, Jun; Otsuka, Tomohiro
- Science Advances, Vol. 2, Issue 8
Electrically driven single-electron spin resonance in a slanting Zeeman field
journal, August 2008
- Pioro-Ladrière, M.; Obata, T.; Tokura, Y.
- Nature Physics, Vol. 4, Issue 10
NMR techniques for quantum control and computation
journal, January 2005
- Vandersypen, L. M. K.; Chuang, I. L.
- Reviews of Modern Physics, Vol. 76, Issue 4
A programmable two-qubit quantum processor in silicon
journal, February 2018
- Watson, T. F.; Philips, S. G. J.; Kawakami, E.
- Nature, Vol. 555, Issue 7698
Interfacing spin qubits in quantum dots and donors—hot, dense, and coherent
journal, September 2017
- Vandersypen, L. M. K.; Bluhm, H.; Clarke, J. S.
- npj Quantum Information, Vol. 3, Issue 1
Scalable and Robust Randomized Benchmarking of Quantum Processes
journal, May 2011
- Magesan, Easwar; Gambetta, J. M.; Emerson, Joseph
- Physical Review Letters, Vol. 106, Issue 18
Randomized benchmarking with gate-dependent noise
journal, January 2018
- Wallman, Joel J.
- Quantum, Vol. 2
Resonantly driven CNOT gate for electron spins
journal, December 2017
- Zajac, D. M.; Sigillito, A. J.; Russ, M.
- Science, Vol. 359, Issue 6374
Demonstration of Entanglement of Electrostatically Coupled Singlet-Triplet Qubits
journal, April 2012
- Shulman, M. D.; Dial, O. E.; Harvey, S. P.
- Science, Vol. 336, Issue 6078, p. 202-205
Randomized Benchmarking of Multiqubit Gates
journal, June 2012
- Gaebler, J. P.; Meier, A. M.; Tan, T. R.
- Physical Review Letters, Vol. 108, Issue 26
Scalable randomised benchmarking of non-Clifford gates
journal, April 2016
- Cross, Andrew W.; Magesan, Easwar; Bishop, Lev S.
- npj Quantum Information, Vol. 2, Issue 1
Randomized Benchmarking and Process Tomography for Gate Errors in a Solid-State Qubit
journal, March 2009
- Chow, J. M.; Gambetta, J. M.; Tornberg, L.
- Physical Review Letters, Vol. 102, Issue 9
Efficient Measurement of Quantum Gate Error by Interleaved Randomized Benchmarking
journal, August 2012
- Magesan, Easwar; Gambetta, Jay M.; Johnson, B. R.
- Physical Review Letters, Vol. 109, Issue 8
Noise Suppression Using Symmetric Exchange Gates in Spin Qubits
journal, March 2016
- Martins, Frederico; Malinowski, Filip K.; Nissen, Peter D.
- Physical Review Letters, Vol. 116, Issue 11
Quantum Process Tomography of a Controlled-NOT Gate
journal, August 2004
- O'Brien, J. L.; Pryde, G. J.; Gilchrist, A.
- Physical Review Letters, Vol. 93, Issue 8
Symmetrized Characterization of Noisy Quantum Processes
journal, September 2007
- Emerson, J.; Silva, M.; Moussa, O.
- Science, Vol. 317, Issue 5846
Real Randomized Benchmarking
journal, August 2018
- Hashagen, A. K.; Flammia, S. T.; Gross, D.
- Quantum, Vol. 2
Characterizing quantum gates via randomized benchmarking
journal, April 2012
- Magesan, Easwar; Gambetta, Jay M.; Emerson, Joseph
- Physical Review A, Vol. 85, Issue 4
Reduced Sensitivity to Charge Noise in Semiconductor Spin Qubits via Symmetric Operation
journal, March 2016
- Reed, M. D.; Maune, B. M.; Andrews, R. W.
- Physical Review Letters, Vol. 116, Issue 11
Characterization of Addressability by Simultaneous Randomized Benchmarking
journal, December 2012
- Gambetta, Jay M.; Córcoles, A. D.; Merkel, S. T.
- Physical Review Letters, Vol. 109, Issue 24
Process verification of two-qubit quantum gates by randomized benchmarking
journal, March 2013
- Córcoles, A. D.; Gambetta, Jay M.; Chow, Jerry M.
- Physical Review A, Vol. 87, Issue 3
A two-qubit logic gate in silicon
journal, October 2015
- Veldhorst, M.; Yang, C. H.; Hwang, J. C. C.
- Nature, Vol. 526, Issue 7573, p. 410-414
Prescription for experimental determination of the dynamics of a quantum black box
journal, November 1997
- Chuang, Isaac L.; Nielsen, M. A.
- Journal of Modern Optics, Vol. 44, Issue 11-12
Silicon quantum electronics
journal, July 2013
- Zwanenburg, Floris A.; Dzurak, Andrew S.; Morello, Andrea
- Reviews of Modern Physics, Vol. 85, Issue 3
Single-shot read-out of an individual electron spin in a quantum dot
journal, July 2004
- Elzerman, J. M.; Hanson, R.; Willems van Beveren, L. H.
- Nature, Vol. 430, Issue 6998