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Title: Ultrafast spectroscopy of shift-current in ferroelectric semiconductor Sn 2 P 2 S 6

Authors:
 [1] ; ORCiD logo [2] ;  [3] ;  [4] ;  [1] ;  [5] ;  [6] ;  [7] ;  [7] ;  [7] ;  [2]
  1. RIKEN Center for Emergent Matter Science (CEMS), Wako 351-0198, Japan
  2. RIKEN Center for Emergent Matter Science (CEMS), Wako 351-0198, Japan, PRESTO, Japan Science and Technology Agency (JST), Kawaguchi 332-0012, Japan
  3. PRESTO, Japan Science and Technology Agency (JST), Kawaguchi 332-0012, Japan, Department of Applied Physics and Quantum Phase Electronics Center (QPEC), University of Tokyo, Tokyo 113-8656, Japan
  4. Department of Applied Physics and Quantum Phase Electronics Center (QPEC), University of Tokyo, Tokyo 113-8656, Japan
  5. Department of Physics, University of California, Berkeley, California 94720, USA
  6. Max Planck Institute for Chemical Physics of Solids, 01187 Dresden, Germany, Leibniz Institute for Solid State and Materials Research, 01069 Dresden, Germany
  7. RIKEN Center for Emergent Matter Science (CEMS), Wako 351-0198, Japan, Department of Applied Physics and Quantum Phase Electronics Center (QPEC), University of Tokyo, Tokyo 113-8656, Japan
Publication Date:
Grant/Contract Number:
AC02-05CH11231
Type:
Publisher's Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Name: Applied Physics Letters Journal Volume: 114 Journal Issue: 15; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
OSTI Identifier:
1507186

Sotome, M., Nakamura, M., Fujioka, J., Ogino, M., Kaneko, Y., Morimoto, T., Zhang, Y., Kawasaki, M., Nagaosa, N., Tokura, Y., and Ogawa, N.. Ultrafast spectroscopy of shift-current in ferroelectric semiconductor Sn 2 P 2 S 6. United States: N. p., Web. doi:10.1063/1.5087960.
Sotome, M., Nakamura, M., Fujioka, J., Ogino, M., Kaneko, Y., Morimoto, T., Zhang, Y., Kawasaki, M., Nagaosa, N., Tokura, Y., & Ogawa, N.. Ultrafast spectroscopy of shift-current in ferroelectric semiconductor Sn 2 P 2 S 6. United States. doi:10.1063/1.5087960.
Sotome, M., Nakamura, M., Fujioka, J., Ogino, M., Kaneko, Y., Morimoto, T., Zhang, Y., Kawasaki, M., Nagaosa, N., Tokura, Y., and Ogawa, N.. 2019. "Ultrafast spectroscopy of shift-current in ferroelectric semiconductor Sn 2 P 2 S 6". United States. doi:10.1063/1.5087960.
@article{osti_1507186,
title = {Ultrafast spectroscopy of shift-current in ferroelectric semiconductor Sn 2 P 2 S 6},
author = {Sotome, M. and Nakamura, M. and Fujioka, J. and Ogino, M. and Kaneko, Y. and Morimoto, T. and Zhang, Y. and Kawasaki, M. and Nagaosa, N. and Tokura, Y. and Ogawa, N.},
abstractNote = {},
doi = {10.1063/1.5087960},
journal = {Applied Physics Letters},
number = 15,
volume = 114,
place = {United States},
year = {2019},
month = {4}
}

Works referenced in this record:

Control over topological insulator photocurrents with light polarization
journal, December 2011
  • McIver, J. W.; Hsieh, D.; Steinberg, H.
  • Nature Nanotechnology, Vol. 7, Issue 2, p. 96-100
  • DOI: 10.1038/nnano.2011.214