Cryogenic characterization of titanium nitride thin films
- Publication Date:
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1505675
- Grant/Contract Number:
- SC0007117
- Resource Type:
- Published Article
- Journal Name:
- Optical Materials Express
- Additional Journal Information:
- Journal Name: Optical Materials Express Journal Volume: 9 Journal Issue: 5; Journal ID: ISSN 2159-3930
- Publisher:
- Optical Society of America
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Vertchenko, Larissa, Leandro, Lorenzo, Shkondin, Evgeniy, Takayama, Osamu, Bondarev, Igor V., Akopian, Nika, and Lavrinenko, Andrei V. Cryogenic characterization of titanium nitride thin films. United States: N. p., 2019.
Web. doi:10.1364/OME.9.002117.
Vertchenko, Larissa, Leandro, Lorenzo, Shkondin, Evgeniy, Takayama, Osamu, Bondarev, Igor V., Akopian, Nika, & Lavrinenko, Andrei V. Cryogenic characterization of titanium nitride thin films. United States. https://doi.org/10.1364/OME.9.002117
Vertchenko, Larissa, Leandro, Lorenzo, Shkondin, Evgeniy, Takayama, Osamu, Bondarev, Igor V., Akopian, Nika, and Lavrinenko, Andrei V. Mon .
"Cryogenic characterization of titanium nitride thin films". United States. https://doi.org/10.1364/OME.9.002117.
@article{osti_1505675,
title = {Cryogenic characterization of titanium nitride thin films},
author = {Vertchenko, Larissa and Leandro, Lorenzo and Shkondin, Evgeniy and Takayama, Osamu and Bondarev, Igor V. and Akopian, Nika and Lavrinenko, Andrei V.},
abstractNote = {},
doi = {10.1364/OME.9.002117},
journal = {Optical Materials Express},
number = 5,
volume = 9,
place = {United States},
year = {Mon Apr 08 00:00:00 EDT 2019},
month = {Mon Apr 08 00:00:00 EDT 2019}
}
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https://doi.org/10.1364/OME.9.002117
https://doi.org/10.1364/OME.9.002117
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