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Title: Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers

Abstract

For LCLS-II, a fluorescence intensity monitor for the non-invasive, pulse-by-pulse normalization of experiments has been developed. A prototype diagnostic was constructed with a microchannel plate assembly and two photodiodes. The diagnostic was then installed in the LCLS SXR instrument Kirkpatrick–Baez mirror chamber with the detectors located above the vertically reflecting mirror. The linearity, noise and position sensitivity of the detectors have been characterized. The photodiode responsivity is suitable for high pulse energies. The microchannel plate detector shows sufficient responsivity over a wide range of pulse energies. The relative signal from the two photodiodes provides a sensitive measure of the X-ray beam position. The fluorescence intensity monitor provides intensity normalization while being compatible with high incident power, a 0.93 MHz repetition rate and ultra-high vacuum.

Authors:
 [1];  [1];  [1];  [1]
  1. SLAC National Accelerator Lab., Menlo Park, CA (United States)
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1505632
Grant/Contract Number:  
AC02-76SF00515
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Synchrotron Radiation (Online)
Additional Journal Information:
Journal Name: Journal of Synchrotron Radiation (Online); Journal Volume: 26; Journal Issue: 2; Journal ID: ISSN 1600-5775
Publisher:
International Union of Crystallography
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; X-ray intensity monitor; diagnostics; X-ray free-electron laser

Citation Formats

Heimann, Philip, Reid, Alexander, Feng, Yiping, and Fritz, David. Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers. United States: N. p., 2019. Web. doi:10.1107/s1600577519001802.
Heimann, Philip, Reid, Alexander, Feng, Yiping, & Fritz, David. Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers. United States. doi:10.1107/s1600577519001802.
Heimann, Philip, Reid, Alexander, Feng, Yiping, and Fritz, David. Fri . "Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers". United States. doi:10.1107/s1600577519001802. https://www.osti.gov/servlets/purl/1505632.
@article{osti_1505632,
title = {Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers},
author = {Heimann, Philip and Reid, Alexander and Feng, Yiping and Fritz, David},
abstractNote = {For LCLS-II, a fluorescence intensity monitor for the non-invasive, pulse-by-pulse normalization of experiments has been developed. A prototype diagnostic was constructed with a microchannel plate assembly and two photodiodes. The diagnostic was then installed in the LCLS SXR instrument Kirkpatrick–Baez mirror chamber with the detectors located above the vertically reflecting mirror. The linearity, noise and position sensitivity of the detectors have been characterized. The photodiode responsivity is suitable for high pulse energies. The microchannel plate detector shows sufficient responsivity over a wide range of pulse energies. The relative signal from the two photodiodes provides a sensitive measure of the X-ray beam position. The fluorescence intensity monitor provides intensity normalization while being compatible with high incident power, a 0.93 MHz repetition rate and ultra-high vacuum.},
doi = {10.1107/s1600577519001802},
journal = {Journal of Synchrotron Radiation (Online)},
number = 2,
volume = 26,
place = {United States},
year = {2019},
month = {2}
}

Journal Article:
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