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Title: Direct imaging of sketched conductive nanostructures at the LaAlO 3/SrTiO 3 interface

Nanoscale control of the quasi-two-dimensional electron gas at the LaAlO 3/SrTiO 3 (LAO/STO) interface by a conductive probe tip has triggered the development of a number of electronic devices. While the spatial distribution of the conductance is crucial for such devices, it is challenging to directly visualize the local electrical properties at the buried interface. Here, we demonstrate conductivity imaging of sketched nanostructures at the LAO/STO interface by microwave impedance microscopy (MIM) with a lateral resolution on the order of 100 nm. The sheet conductance extracted from the MIM data agrees with the transport measurement. The tip-induced insulator-to-metal transition is observed above a threshold voltage of +4 V. Our work paves the way for studying emergent phenomena at oxide interfaces by probing nanoscale conductance distribution.
Authors:
ORCiD logo [1] ;  [1] ;  [2] ;  [2] ; ORCiD logo [3] ;  [4] ;  [2] ;  [3] ;  [1]
  1. Univ. of Texas, Austin, TX (United States)
  2. Univ. of Wisconsin, Madison, WI (United States)
  3. Univ. of Pittsburgh, PA (United States); Pittsburgh Quantum Inst., PA (United States)
  4. Univ. of Pittsburgh, PA (United States); Pittsburgh Quantum Inst., PA (United States); Univ. of Science and Technology of China, Hefei (China)
Publication Date:
Grant/Contract Number:
SC0010308
Type:
Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 111; Journal Issue: 23; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Research Org:
Univ. of Texas, Austin, TX (United States)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE
OSTI Identifier:
1505558

Jiang, Zhanzhi, Wu, Xiaoyu, Lee, Hyungwoo, Lee, Jung-Woo, Li, Jianan, Cheng, Guanglei, Eom, Chang-Beom, Levy, Jeremy, and Lai, Keji. Direct imaging of sketched conductive nanostructures at the LaAlO3/SrTiO3 interface. United States: N. p., Web. doi:10.1063/1.5005917.
Jiang, Zhanzhi, Wu, Xiaoyu, Lee, Hyungwoo, Lee, Jung-Woo, Li, Jianan, Cheng, Guanglei, Eom, Chang-Beom, Levy, Jeremy, & Lai, Keji. Direct imaging of sketched conductive nanostructures at the LaAlO3/SrTiO3 interface. United States. doi:10.1063/1.5005917.
Jiang, Zhanzhi, Wu, Xiaoyu, Lee, Hyungwoo, Lee, Jung-Woo, Li, Jianan, Cheng, Guanglei, Eom, Chang-Beom, Levy, Jeremy, and Lai, Keji. 2017. "Direct imaging of sketched conductive nanostructures at the LaAlO3/SrTiO3 interface". United States. doi:10.1063/1.5005917. https://www.osti.gov/servlets/purl/1505558.
@article{osti_1505558,
title = {Direct imaging of sketched conductive nanostructures at the LaAlO3/SrTiO3 interface},
author = {Jiang, Zhanzhi and Wu, Xiaoyu and Lee, Hyungwoo and Lee, Jung-Woo and Li, Jianan and Cheng, Guanglei and Eom, Chang-Beom and Levy, Jeremy and Lai, Keji},
abstractNote = {Nanoscale control of the quasi-two-dimensional electron gas at the LaAlO3/SrTiO3 (LAO/STO) interface by a conductive probe tip has triggered the development of a number of electronic devices. While the spatial distribution of the conductance is crucial for such devices, it is challenging to directly visualize the local electrical properties at the buried interface. Here, we demonstrate conductivity imaging of sketched nanostructures at the LAO/STO interface by microwave impedance microscopy (MIM) with a lateral resolution on the order of 100 nm. The sheet conductance extracted from the MIM data agrees with the transport measurement. The tip-induced insulator-to-metal transition is observed above a threshold voltage of +4 V. Our work paves the way for studying emergent phenomena at oxide interfaces by probing nanoscale conductance distribution.},
doi = {10.1063/1.5005917},
journal = {Applied Physics Letters},
number = 23,
volume = 111,
place = {United States},
year = {2017},
month = {12}
}

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