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Title: Grains and Strains from Cepstral Analysis of 4D-STEM Nano-Diffraction Datasets

Abstract

We report the availability of fast, high dynamic range pixel array detectors makes scanning convergent beam electron diffraction (CBED) a powerful tool for rapid, spatially resolved characterization of lattice structure over a wide range of length scales. However, to extract useful structural information from the large 4-dimensional datasets, especially for complex, 3D specimens, we must confront challenges with CBED intensity variations due to crystal mistilts and multiple scattering as well as challenges with precisely localizing diffracted disk centers.

Authors:
 [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1]
  1. Cornell Univ., Ithaca, NY (United States)
Publication Date:
Research Org.:
General Motors, Detroit, MI (United States)
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Fuel Cell Technologies Office (EE-3F)
OSTI Identifier:
1504943
Grant/Contract Number:  
EE0007271
Resource Type:
Accepted Manuscript
Journal Name:
Microscopy and Microanalysis
Additional Journal Information:
Journal Volume: 24; Journal Issue: S1; Journal ID: ISSN 1431-9276
Publisher:
Microscopy Society of America (MSA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 42 ENGINEERING

Citation Formats

Padgett, Elliot, Cueva, Paul, Holtz, Megan E., Langenberg, Eric, Ren, Dong, Abruna, Hector D., Schlom, Darrell, and Muller, David A. Grains and Strains from Cepstral Analysis of 4D-STEM Nano-Diffraction Datasets. United States: N. p., 2018. Web. doi:10.1017/S1431927618003227.
Padgett, Elliot, Cueva, Paul, Holtz, Megan E., Langenberg, Eric, Ren, Dong, Abruna, Hector D., Schlom, Darrell, & Muller, David A. Grains and Strains from Cepstral Analysis of 4D-STEM Nano-Diffraction Datasets. United States. doi:10.1017/S1431927618003227.
Padgett, Elliot, Cueva, Paul, Holtz, Megan E., Langenberg, Eric, Ren, Dong, Abruna, Hector D., Schlom, Darrell, and Muller, David A. Wed . "Grains and Strains from Cepstral Analysis of 4D-STEM Nano-Diffraction Datasets". United States. doi:10.1017/S1431927618003227. https://www.osti.gov/servlets/purl/1504943.
@article{osti_1504943,
title = {Grains and Strains from Cepstral Analysis of 4D-STEM Nano-Diffraction Datasets},
author = {Padgett, Elliot and Cueva, Paul and Holtz, Megan E. and Langenberg, Eric and Ren, Dong and Abruna, Hector D. and Schlom, Darrell and Muller, David A.},
abstractNote = {We report the availability of fast, high dynamic range pixel array detectors makes scanning convergent beam electron diffraction (CBED) a powerful tool for rapid, spatially resolved characterization of lattice structure over a wide range of length scales. However, to extract useful structural information from the large 4-dimensional datasets, especially for complex, 3D specimens, we must confront challenges with CBED intensity variations due to crystal mistilts and multiple scattering as well as challenges with precisely localizing diffracted disk centers.},
doi = {10.1017/S1431927618003227},
journal = {Microscopy and Microanalysis},
number = S1,
volume = 24,
place = {United States},
year = {2018},
month = {8}
}

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Works referenced in this record:

Cepstrum Pitch Determination
journal, February 1967

  • Noll, A. Michael
  • The Journal of the Acoustical Society of America, Vol. 41, Issue 2
  • DOI: 10.1121/1.1910339

High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy
journal, January 2016

  • Tate, Mark W.; Purohit, Prafull; Chamberlain, Darol
  • Microscopy and Microanalysis, Vol. 22, Issue 1
  • DOI: 10.1017/S1431927615015664