Title: Advanced denoising for X-ray ptychography

Abstract

The success of ptychographic imaging experiments strongly depends on achieving high signal-to-noise ratio. This is particularly important in nanoscale imaging experiments when diffraction signals are very weak and the experiments are accompanied by significant parasitic scattering (background), outliers or correlated noise sources. It is also critical when rare events, such as cosmic rays, or bad frames caused by electronic glitches or shutter timing malfunction take place. In this paper, we propose a novel iterative algorithm with rigorous analysis that exploits the direct forward model for parasitic noise and sample smoothness to achieve a thorough characterization and removal of structured and random noise. We present a formal description of the proposed algorithm and prove its convergence under mild conditions. Numerical experiments from simulations and real data (both soft and hard X-ray beamlines) demonstrate that the proposed algorithms produce better results when compared to state-of-the-art methods.

Authors:

Chang, Huibin ;

• Search DOE PAGES for author "Chang, Huibin"
• Search DOE PAGES for ORCID "0000-0002-8833-8940"
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Enfedaque, Pablo; Zhang, Jie; Reinhardt, Juliane; Enders, Bjoern; Yu, Young-Sang; Shapiro, David; Schroer, Christian G.; Zeng, Tieyong; Marchesini, Stefano

• Search DOE PAGES for author "Marchesini, Stefano"
• Search DOE PAGES for ORCID "0000-0002-6798-2913"
• Search orcid.org for ORCID "0000-0002-6798-2913"

Publication Date:

2019-04-01

Research Org.:

Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)

Sponsoring Org.:

USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)

OSTI Identifier:

1504305

Alternate Identifier(s):

OSTI ID: 1564021

Grant/Contract Number:  

AC02-05CH11231

Resource Type:

Published Article

Journal Name:

Optics Express

Additional Journal Information:

Journal Name: Optics Express Journal Volume: 27 Journal Issue: 8; Journal ID: ISSN 1094-4087

Publisher:

Optical Society of America

Country of Publication:

United States

Language:

English

Subject:

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