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Title: Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distance

Authors:
 [1]; ORCiD logo [2]
  1. Department of Mechanical Engineering and Materials Science, Yale University, New Haven, Connecticut 06520, USA
  2. Department of Mechanical Engineering and Materials Science, Yale University, New Haven, Connecticut 06520, USA, Department of Chemical and Environmental Engineering, Yale University, New Haven, Connecticut 06520, USA
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1503913
Grant/Contract Number:  
SC0016179
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Name: Review of Scientific Instruments Journal Volume: 90 Journal Issue: 3; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English

Citation Formats

Dagdeviren, Omur E., and Schwarz, Udo D.. Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distance. United States: N. p., 2019. Web. doi:10.1063/1.5089634.
Dagdeviren, Omur E., & Schwarz, Udo D.. Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distance. United States. doi:10.1063/1.5089634.
Dagdeviren, Omur E., and Schwarz, Udo D.. Fri . "Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distance". United States. doi:10.1063/1.5089634.
@article{osti_1503913,
title = {Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distance},
author = {Dagdeviren, Omur E. and Schwarz, Udo D.},
abstractNote = {},
doi = {10.1063/1.5089634},
journal = {Review of Scientific Instruments},
number = 3,
volume = 90,
place = {United States},
year = {2019},
month = {3}
}

Journal Article:
Free Publicly Available Full Text
This content will become publicly available on March 28, 2020
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