DOE PAGES title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distance

Abstract

Atomic force microscopy (AFM) is a versatile surface characterization method that can map a sample’s topography with high spatial resolution while simultaneously interrogating its surface chemistry through the site-specific high-resolution quantification of the forces acting between the sample and the probe tip. Thanks to considerable advances in AFM measurement technology, such local measurements of chemical properties have gained much popularity in recent years. To this end, dynamic AFM methodologies are implemented where either the oscillation frequency or the oscillation amplitude and phase of the vibrating cantilever are recorded as a function of tip-sample distance and subsequently converted to reflect tip-sample forces or interaction potentials. Such conversion has, however, been shown to produce non-negligible errors when applying the most commonly used mathematical conversion procedures if oscillation amplitudes are of the order of the decay length of the interaction. Extending on these earlier findings, the computational study presented in this paper reveals that the degree of divergence from actual values may also critically depend on both the overall strength of tip-sample interaction and the distance at which the interaction is obtained. These systematic errors can, however, be effectively eliminated by using oscillation amplitudes that are sufficiently larger than the decay length ofmore » the interaction potential.« less

Authors:
 [1]; ORCiD logo [1]
  1. Yale Univ., New Haven, CT (United States)
Publication Date:
Research Org.:
Yale Univ., New Haven, CT (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1612413
Alternate Identifier(s):
OSTI ID: 1503913
Grant/Contract Number:  
SC0016179
Resource Type:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 90; Journal Issue: 3; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; Instruments & Instrumentation; Physics; Tuning forks; Frequency modulation spectroscopy; Surface and interface chemistry; Force spectroscopy; Frequency measurement; Scanning probe microscopy; Atomic force microscopy; Harmonic oscillator; Electrical properties and parameters

Citation Formats

Dagdeviren, Omur E., and Schwarz, Udo D. Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distance. United States: N. p., 2019. Web. doi:10.1063/1.5089634.
Dagdeviren, Omur E., & Schwarz, Udo D. Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distance. United States. https://doi.org/10.1063/1.5089634
Dagdeviren, Omur E., and Schwarz, Udo D. Fri . "Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distance". United States. https://doi.org/10.1063/1.5089634. https://www.osti.gov/servlets/purl/1612413.
@article{osti_1612413,
title = {Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distance},
author = {Dagdeviren, Omur E. and Schwarz, Udo D.},
abstractNote = {Atomic force microscopy (AFM) is a versatile surface characterization method that can map a sample’s topography with high spatial resolution while simultaneously interrogating its surface chemistry through the site-specific high-resolution quantification of the forces acting between the sample and the probe tip. Thanks to considerable advances in AFM measurement technology, such local measurements of chemical properties have gained much popularity in recent years. To this end, dynamic AFM methodologies are implemented where either the oscillation frequency or the oscillation amplitude and phase of the vibrating cantilever are recorded as a function of tip-sample distance and subsequently converted to reflect tip-sample forces or interaction potentials. Such conversion has, however, been shown to produce non-negligible errors when applying the most commonly used mathematical conversion procedures if oscillation amplitudes are of the order of the decay length of the interaction. Extending on these earlier findings, the computational study presented in this paper reveals that the degree of divergence from actual values may also critically depend on both the overall strength of tip-sample interaction and the distance at which the interaction is obtained. These systematic errors can, however, be effectively eliminated by using oscillation amplitudes that are sufficiently larger than the decay length of the interaction potential.},
doi = {10.1063/1.5089634},
journal = {Review of Scientific Instruments},
number = 3,
volume = 90,
place = {United States},
year = {Fri Mar 29 00:00:00 EDT 2019},
month = {Fri Mar 29 00:00:00 EDT 2019}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record

Citation Metrics:
Cited by: 6 works
Citation information provided by
Web of Science

Save / Share:

Works referenced in this record:

Force reconstruction from tapping mode force microscopy experiments
journal, April 2015


Three-dimensional imaging of short-range chemical forces with picometre resolution
journal, April 2009

  • Albers, Boris J.; Schwendemann, Todd C.; Baykara, Mehmet Z.
  • Nature Nanotechnology, Vol. 4, Issue 5
  • DOI: 10.1038/nnano.2009.57

Accurate formulas for interaction force and energy in frequency modulation force spectroscopy
journal, March 2004

  • Sader, John E.; Jarvis, Suzanne P.
  • Applied Physics Letters, Vol. 84, Issue 10
  • DOI: 10.1063/1.1667267

Atomic force microscopy and spectroscopy
journal, December 2007


An alternative to the Maugis model of adhesion between elastic spheres
journal, November 1998


Theory of phase-modulation atomic force microscopy with constant-oscillation amplitude
journal, March 2008

  • Hölscher, Hendrik
  • Journal of Applied Physics, Vol. 103, Issue 6
  • DOI: 10.1063/1.2896450

Quantitative force versus distance measurements in amplitude modulation AFM: a novel force inversion technique
journal, April 2009


Advances in Atomic Force Microscopy
text, January 2003


Atomic Resolution with Atomic Force Microscope
journal, June 1987


Imaging physical phenomena with local probes: From electrons to photons
journal, September 2012


Atomic Resolution of the Silicon (111)-(7x7) Surface by Atomic Force Microscopy
journal, January 1995


Amplitude Modulation Atomic Force Microscopy
book, October 2010


Interpretation of force curves in force microscopy
journal, April 1993


Relations between interaction force and frequency shift in large-amplitude dynamic force microscopy
journal, July 1999


Robust high-resolution imaging and quantitative force measurement with tuned-oscillator atomic force microscopy
journal, January 2016


Frequency response of cantilever beams immersed in viscous fluids with applications to the atomic force microscope
journal, July 1998

  • Sader, John Elie
  • Journal of Applied Physics, Vol. 84, Issue 1
  • DOI: 10.1063/1.368002

The Chemical Structure of a Molecule Resolved by Atomic Force Microscopy
journal, August 2009


Atomic Force Microscope. [原子間力顕微鏡]
journal, January 1991

  • Tsuda, Nobuhiro
  • Journal of the Japan Society for Precision Engineering, Vol. 57, Issue 7
  • DOI: 10.2493/jjspe.57.1159

Quantifying Tip-Sample Interactions in Vacuum Using Cantilever-Based Sensors: An Analysis
journal, April 2018


Theory of amplitude modulation atomic force microscopy with and without Q-Control
journal, May 2007


Interaction imaging with amplitude-dependence force spectroscopy
journal, January 2013

  • Platz, Daniel; Forchheimer, Daniel; Tholén, Erik A.
  • Nature Communications, Vol. 4, Issue 1
  • DOI: 10.1038/ncomms2365

Exploring site-specific chemical interactions at surfaces: a case study on highly ordered pyrolytic graphite
journal, November 2016


Frequency modulation detection using high‐ Q cantilevers for enhanced force microscope sensitivity
journal, January 1991

  • Albrecht, T. R.; Grütter, P.; Horne, D.
  • Journal of Applied Physics, Vol. 69, Issue 2
  • DOI: 10.1063/1.347347

High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork
journal, December 1998

  • Giessibl, Franz J.
  • Applied Physics Letters, Vol. 73, Issue 26
  • DOI: 10.1063/1.122948

Quantitative force measurements using frequency modulation atomic force microscopy?theoretical foundations
journal, January 2005


Reversal of atomic contrast in scanning probe microscopy on (111) metal surfaces
journal, February 2012


Measuring the Charge State of an Adatom with Noncontact Atomic Force Microscopy
journal, June 2009


Atomic resolution with atomic force microscope
journal, October 1987


Interplay of the tip–sample junction stability and image contrast reversal on a Cu(111) surface revealed by the 3D force field
journal, January 2012


Numerical performance analysis of quartz tuning fork-based force sensors
journal, December 2016


Forces and frequency shifts in atomic-resolution dynamic-force microscopy
text, January 1997


Advances in Atomic Force Microscopy.
journal, January 1996


Atomic Resolution of the Silicon (111 )-(7x 7) Surface by Atomic Force Microscopy
text, January 1995