In situ nanobeam electron diffraction strain mapping of planar slip in stainless steel

doi:10.1016/j.scriptamat.2017.11.005

This content will become publicly available on November 20, 2019

Title: In situ nanobeam electron diffraction strain mapping of planar slip in stainless steel

Full Record
Other Related Research

Authors:

Pekin, Thomas C.; Gammer, Christoph; Ciston, Jim;

; Minor, Andrew M.

Publication Date:: 2018-03-01

Sponsoring Org.:: USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)

OSTI Identifier:: 1496395

Grant/Contract Number:: AC02-05CH11231

Resource Type:: Publisher's Accepted Manuscript

Journal Name:: Scripta Materialia

Additional Journal Information:: Journal Name: Scripta Materialia Journal Volume: 146 Journal Issue: C; Journal ID: ISSN 1359-6462

Publisher:: Elsevier

Country of Publication:: United States

Language:: English

Citation Formats


                    Pekin, Thomas C., Gammer, Christoph, Ciston, Jim, Ophus, Colin, and Minor, Andrew M. In situ nanobeam electron diffraction strain mapping of planar slip in stainless steel.  United States: N. p., 2018. 
        Web.  doi:10.1016/j.scriptamat.2017.11.005.

Copy to clipboard


                    Pekin, Thomas C., Gammer, Christoph, Ciston, Jim, Ophus, Colin, & Minor, Andrew M. In situ nanobeam electron diffraction strain mapping of planar slip in stainless steel.  United States.  doi:10.1016/j.scriptamat.2017.11.005.

Copy to clipboard


                    Pekin, Thomas C., Gammer, Christoph, Ciston, Jim, Ophus, Colin, and Minor, Andrew M. Thu .  
        "In situ nanobeam electron diffraction strain mapping of planar slip in stainless steel".  United States.  doi:10.1016/j.scriptamat.2017.11.005.

Copy to clipboard


                    
@article{osti_1496395,

  title        = {In situ nanobeam electron diffraction strain mapping of planar slip in stainless steel},

  author       = {Pekin, Thomas C. and Gammer, Christoph and Ciston, Jim and Ophus, Colin and Minor, Andrew M.},

  abstractNote = {},

  doi          = {10.1016/j.scriptamat.2017.11.005},

  journal      = {Scripta Materialia},

  number       = C,

  volume       = 146,

  place        = {United States},

  year         = {2018},

  month        = {3}

}

Copy to clipboard

Journal Article:

Free Publicly Available Full Text

This content will become publicly available on November 20, 2019

Publisher's Version of Record

DOI: 10.1016/j.scriptamat.2017.11.005

Other availability

Search WorldCat to find libraries that may hold this journal

Save / Share:

Export Metadata

Save to My Library

Similar Records in DOE PAGES and OSTI.GOV collections:

Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping

Journal Article Pekin, Thomas C. ; Gammer, Christoph ; Ciston, Jim ; ... - Ultramicroscopy
Cited by 7
DOI: 10.1016/j.ultramic.2016.12.021
Orientation mapping of semicrystalline polymers using scanning electron nanobeam diffraction

Journal Article Panova, Ouliana ; Chen, X. Chelsea ; Bustillo, Karen C. ; ... - Micron
DOI: 10.1016/j.micron.2016.05.008
High precision two-dimensional strain mapping in semiconductor devices using nanobeam electron diffraction in the transmission electron microscope

Journal Article Baumann, Frieder H., E-mail: fhbauman@us.ibm.com - Applied Physics Letters

A classical method used to characterize the strain in modern semiconductor devices is nanobeam diffraction (NBD) in the transmission electron microscope. One challenge for this method lies in the fact that the smaller the beam becomes, the more difficult it becomes to analyze the resulting diffraction spot pattern. We show that a carefully designed fitting algorithm enables us to reduce the sampling area for the diffraction patterns on the camera chip dramatically (∼1/16) compared to traditional settings without significant loss of precision. The resulting lower magnification of the spot pattern permits the presence of an annular dark field detector, whichmore »« less
DOI: 10.1063/1.4886137
Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping

Journal Article Pekin, Thomas C. ; Gammer, Christoph ; Ciston, Jim ; ... - Ultramicroscopy

Scanning nanobeam electron diffraction strain mapping is a technique by which the positions of diffracted disks sampled at the nanoscale over a crystalline sample can be used to reconstruct a strain map over a large area. However, it is important that the disk positions are measured accurately, as their positions relative to a reference are directly used to calculate strain. Here in this study, we compare several correlation methods using both simulated and experimental data in order to directly probe susceptibility to measurement error due to non-uniform diffracted disk illumination structure. We found that prefiltering the diffraction patterns with amore »« less
Cited by 7
DOI: 10.1016/j.ultramic.2016.12.021

Full Text Available
Strain mapping at nanometer resolution using advanced nano-beam electron diffraction

Journal Article Ozdol, V. B. ; Gammer, C. ; Jin, X. G. ; ... - Applied Physics Letters
Cited by 19
DOI: 10.1063/1.4922994

Similar Records