In situ nanobeam electron diffraction strain mapping of planar slip in stainless steel

Pekin, Thomas C.; Gammer, Christoph; Ciston, Jim; Ophus, Colin; Minor, Andrew M.

doi:10.1016/j.scriptamat.2017.11.005

Title: In situ nanobeam electron diffraction strain mapping of planar slip in stainless steel

Full Record
Other Related Research

Authors:

Pekin, Thomas C.; Gammer, Christoph; Ciston, Jim;

; Minor, Andrew M.

Publication Date:: 2018-03-01

Sponsoring Org.:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

OSTI Identifier:: 1496395

Grant/Contract Number:: AC02-05CH11231

Resource Type:: Publisher's Accepted Manuscript

Journal Name:: Scripta Materialia

Additional Journal Information:: Journal Name: Scripta Materialia Journal Volume: 146 Journal Issue: C; Journal ID: ISSN 1359-6462

Publisher:: Elsevier

Country of Publication:: United States

Language:: English

Citation Formats


                    Pekin, Thomas C., Gammer, Christoph, Ciston, Jim, Ophus, Colin, and Minor, Andrew M. In situ nanobeam electron diffraction strain mapping of planar slip in stainless steel.  United States: N. p., 2018. 
Web.  doi:10.1016/j.scriptamat.2017.11.005.

Copy to clipboard


                    Pekin, Thomas C., Gammer, Christoph, Ciston, Jim, Ophus, Colin, & Minor, Andrew M. In situ nanobeam electron diffraction strain mapping of planar slip in stainless steel.  United States.  https://doi.org/10.1016/j.scriptamat.2017.11.005

Copy to clipboard


                    Pekin, Thomas C., Gammer, Christoph, Ciston, Jim, Ophus, Colin, and Minor, Andrew M. Thu .  
"In situ nanobeam electron diffraction strain mapping of planar slip in stainless steel".  United States.  https://doi.org/10.1016/j.scriptamat.2017.11.005.

Copy to clipboard


                    
@article{osti_1496395,

  title        = {In situ nanobeam electron diffraction strain mapping of planar slip in stainless steel},

  author       = {Pekin, Thomas C. and Gammer, Christoph and Ciston, Jim and Ophus, Colin and Minor, Andrew M.},

  abstractNote = {},

  doi          = {10.1016/j.scriptamat.2017.11.005},

  journal      = {Scripta Materialia},

  number       = C,

  volume       = 146,

  place        = {United States},

  year         = {2018},

  month        = {3}

}

Copy to clipboard

Journal Article:

Free Publicly Available Full Text

Accepted Manuscript (Publisher)

Publisher's Version of Record
https://doi.org/10.1016/j.scriptamat.2017.11.005

Other availability

Search WorldCat to find libraries that may hold this journal

Citation Metrics:

Cited by: 10 works

Citation information provided by
Web of Science

Save / Share:

Export Metadata

Save to My Library

Similar Records in DOE PAGES and OSTI.GOV collections:

Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping

Journal Article Pekin, Thomas C. ; Gammer, Christoph ; Ciston, Jim ; ... - Ultramicroscopy

Scanning nanobeam electron diffraction strain mapping is a technique by which the positions of diffracted disks sampled at the nanoscale over a crystalline sample can be used to reconstruct a strain map over a large area. However, it is important that the disk positions are measured accurately, as their positions relative to a reference are directly used to calculate strain. Here in this study, we compare several correlation methods using both simulated and experimental data in order to directly probe susceptibility to measurement error due to non-uniform diffracted disk illumination structure. We found that prefiltering the diffraction patterns with amore »« less
Cited by 8
https://doi.org/10.1016/j.ultramic.2016.12.021

Full Text Available
High precision two-dimensional strain mapping in semiconductor devices using nanobeam electron diffraction in the transmission electron microscope

Journal Article Baumann, Frieder H., E-mail: fhbauman@us.ibm.com - Applied Physics Letters

A classical method used to characterize the strain in modern semiconductor devices is nanobeam diffraction (NBD) in the transmission electron microscope. One challenge for this method lies in the fact that the smaller the beam becomes, the more difficult it becomes to analyze the resulting diffraction spot pattern. We show that a carefully designed fitting algorithm enables us to reduce the sampling area for the diffraction patterns on the camera chip dramatically (∼1/16) compared to traditional settings without significant loss of precision. The resulting lower magnification of the spot pattern permits the presence of an annular dark field detector, whichmore »« less
https://doi.org/10.1063/1.4886137
The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision

Journal Article Padgett, Elliot ; Holtz, Megan E. ; Cueva, Paul ; ... - Ultramicroscopy

Scanning nanobeam electron diffraction (NBED) with fast pixelated detectors is a valuable technique for rapid, spatially resolved mapping of lattice structure over a wide range of length scales. However, intensity variations caused by dynamical diffraction and sample mistilts can hinder the measurement of diffracted disk centers as necessary for quantification. Robust data processing techniques are needed to provide accurate and precise measurements for complex samples and non-ideal conditions. Here we present an approach to address these challenges using a transform, called the exit wave power cepstrum (EWPC), inspired by cepstral analysis in audio signal processing. The EWPC transforms NBED patternsmore »« less
https://doi.org/10.1016/j.ultramic.2020.112994

Full Text Available
Orientation mapping of semicrystalline polymers using scanning electron nanobeam diffraction

Journal Article Panova, Ouliana ; Chen, X. Chelsea ; Bustillo, Karen C. ; ... - Micron
https://doi.org/10.1016/j.micron.2016.05.008
Tensile behavior and microstructural evolution of a Fe-25Ni-20Cr austenitic stainless steel (alloy 709) from room to elevated temperatures through in-situ synchrotron X-ray diffraction characterization and transmission electron microscopy

Journal Article Zhao, Yuchen ; Cinbiz, Mahmut N. ; Park, Jun-Sang ; ... - Journal of Nuclear Materials

Uniaxial tensile tests were done on Fe-25Ni-20Cr Austenitic Stainless Steel (Alloy 709) along with in-situ synchrotron measurement at different temperatures (25 degrees C, 500 degrees C, 700 degrees C and 900 degrees C). The X-Ray diffraction data was collected in-situ in order to follow the phases present as well as to derive the dislocation density as a function of strain through peak broadening analysis based on the modified Williamson-Hall method and see how trends are affected as a function of temperature. The XRD data were complemented by TEM and STEM-EDX characterization done on the post-experiment samples to observe the deformedmore »« less
https://doi.org/10.1016/j.jnucmat.2020.152367

Full Text Available

Similar Records