Channeling analysis in studying ion irradiation damage in materials containing various types of defects

Jin, Ke; Velisa, Gihan; Xue, Haizhou; Yang, Taini; Bei, Hongbin; Weber, William; Wang, Lumin; Zhang, Yanwen

doi:10.1016/j.jnucmat.2019.01.033

Title: Channeling analysis in studying ion irradiation damage in materials containing various types of defects

Journal Article · 21 January 2019 · Journal of Nuclear Materials

DOI: https://doi.org/10.1016/j.jnucmat.2019.01.033 · OSTI ID:1495945

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^[1]; Xue, Haizhou ^[2]; Yang, Taini ^[3];

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^[4]; Wang, Lumin ^[3];

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Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Univ. of Tennessee, Knoxville, TN (United States)
Univ. of Michigan, Ann Arbor, MI (United States)
Univ. of Tennessee, Knoxville, TN (United States); Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Univ. of Tennessee, Knoxville, TN (United States)

We present that ion channeling is a powerful quantitative technique for studying ion-irradiation induced defect evolution in single crystalline materials. An iterative procedure to determine dechanneling yields has been developed for decades, serving as a major method for analyzing experimental channeling data. The applicability of such procedure is, however, generally limited to the crystalline damage with only point defects and local amorphous domains. For the other cases, such as irradiated metals, the assumption of direct-backscattering free has usually been made. In the present study, Ni, TiAl, MgO, and SrTiO₃ single crystals are selected as four model materials, representing metals, intermetallic alloys, and ceramic compounds with different defect evolution processes under irradiation, to investigate the fidelity of applying dechanneling analysis on various types of defects. The pure dechanneling assumption is shown oversimplified in Ni irradiated with low fluence self-ions and may result in error on the derived damage profile. Moreover, the iterative procedure of dechanneling analysis is shown valid for more general situations than the randomly distributed atoms, including those not exhibiting a peak in channeling spectra. The disappearance of damage peak in channeling spectra is attributed to the combined effects of small (but non-zero) scattering factor, long-range damage effects, and non-ignorable damage level in pristine crystals. Furthermore, the ratio of direct backscattering to dechanneling areas provides information on defect configurations in the materials containing a well-defined damage peak in channeling spectra. Finally, the contribution from dechanneling sources increases from SrTiO₃, TiAl, to MgO, according to the derived scattering and dechanneling factors.

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Research Organization:: Energy Frontier Research Centers (EFRC) (United States). Energy Dissipation to Defect Evolution (EDDE); Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE; USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1495945

Journal Information:: Journal of Nuclear Materials, Journal Name: Journal of Nuclear Materials Journal Issue: C Vol. 517; ISSN 0022-3115

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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Cited By (2)

Monte Carlo simulations of ion channeling in crystals containing dislocations and randomly displaced atoms Jozwik, Przemyslaw; Nowicki, Lech; Ratajczak, Renata Journal of Applied Physics, Vol. 126, Issue 19 https://doi.org/10.1063/1.5111619	journal	November 2019
A new approach for electronic heat conduction in molecular dynamics simulations Ullah, Mohammad W.; Ponga, Mauricio Modelling and Simulation in Materials Science and Engineering, Vol. 27, Issue 7 https://doi.org/10.1088/1361-651x/ab309f	journal	August 2019

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36 MATERIALS SCIENCE
Damage accumulation
Dechanneling
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Ion irradiation
RBS

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