Multivariate analysis of x-ray scattering using a stochastic source

Zohar, Sioan; Turner, Joshua J.

doi:10.1364/ol.44.000243

Title: Multivariate analysis of x-ray scattering using a stochastic source

Journal Article · 03 January 2019 · Optics Letters

DOI: https://doi.org/10.1364/ol.44.000243 · OSTI ID:1493444

Zohar, Sioan ^[1]; Turner, Joshua J. ^[2]

SLAC National Accelerator Lab., Menlo Park, CA (United States)
SLAC National Accelerator Lab., Menlo Park, CA (United States); Stanford Univ., Stanford, CA (United States)

The normalization of scattered intensity by incident flux is a crucial step in analyzing data from stochastic x-ray free electron laser sources and is complicated by non-linearities traditionally attributed to detector saturation. Here we show that such non-linearities can also arise when the sample spectra are non-uniform within the monochromator bandwidth. A method for modeling and removing this non-linearity using multivariate regression with shot-by-shot x-ray photon energy as an independent variable is presented. In conclusion, this approach demonstrates the benefit of event building and will allow for a reconsideration of data which has proven challenging to normalize.

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Research Organization:: SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)

Sponsoring Organization:: USDOE

Grant/Contract Number:: AC02-76SF00515

OSTI ID:: 1493444

Journal Information:: Optics Letters, Journal Name: Optics Letters Journal Issue: 2 Vol. 44; ISSN 0146-9592; ISSN OPLEDP

Publisher:: Optical Society of America (OSA)Copyright Statement

Country of Publication:: United States

Language:: English

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