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Title: Cadmium zinc telluride pixel detectors for high-intensity x-ray imaging at free electron lasers

Journal Article · · Journal of Physics. D, Applied Physics
ORCiD logo [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [2];  [3];  [3];  [3];  [4];  [4] more »;  [4];  [4] « less
  1. Rutherford Appleton Lab., Oxfordshire (United Kingdom)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States); SLAC National Accelerator Lab., Menlo Park, CA (United States)
  3. SLAC National Accelerator Lab., Menlo Park, CA (United States)
  4. Redlen Technologies, Saanichton, BC (Canada)

Here, this paper reports the first demonstration of high-intensity x-ray imaging using cadmium zinc telluride (CdZnTe) pixel detectors at a free electron laser (FEL). Prototype detectors were produced using the STFC large pixel detector (LPD) ASIC and sensors fabricated from a novel high-intensity-capable CdZnTe material produced by Redlen Technologies. Characterisation of the performance of this sensor material was completed at the Linac Coherent Light Source (LCLS) FEL. The detectors were operated at a frame rate of 1 MHz with 9.5 keV x-ray pulses delivered at a rate of 120 Hz. Measurements successfully demonstrated the linear response of the CdZnTe material to increasing numbers of x-rays up to a fluence of 8 GeV mm–2 per pulse, the limit of the dynamic range of the LPD ASIC.

Research Organization:
SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)
Sponsoring Organization:
USDOE
Grant/Contract Number:
AC02-76SF00515
OSTI ID:
1493442
Alternate ID(s):
OSTI ID: 23011369
Journal Information:
Journal of Physics. D, Applied Physics, Journal Name: Journal of Physics. D, Applied Physics Journal Issue: 8 Vol. 52; ISSN 0022-3727
Publisher:
IOP PublishingCopyright Statement
Country of Publication:
United States
Language:
English

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