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Title: Influence of Plasmonic Cu x S Interfacing Layer on Photovoltaic Performance of CIZS Quantum Dot Sensitized Solar Cells

Authors:
; ; ; ORCiD logo
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1491418
Grant/Contract Number:  
FC02-04ER15533
Resource Type:
Published Article
Journal Name:
Journal of the Electrochemical Society
Additional Journal Information:
Journal Name: Journal of the Electrochemical Society Journal Volume: 166 Journal Issue: 5; Journal ID: ISSN 0013-4651
Publisher:
The Electrochemical Society
Country of Publication:
United States
Language:
English

Citation Formats

Muthu, Senthilkumar, Zaiats, Gary, Sridharan, Moorthy Babu, and Kamat, Prashant V. Influence of Plasmonic Cu x S Interfacing Layer on Photovoltaic Performance of CIZS Quantum Dot Sensitized Solar Cells. United States: N. p., 2019. Web. doi:10.1149/2.0221905jes.
Muthu, Senthilkumar, Zaiats, Gary, Sridharan, Moorthy Babu, & Kamat, Prashant V. Influence of Plasmonic Cu x S Interfacing Layer on Photovoltaic Performance of CIZS Quantum Dot Sensitized Solar Cells. United States. doi:10.1149/2.0221905jes.
Muthu, Senthilkumar, Zaiats, Gary, Sridharan, Moorthy Babu, and Kamat, Prashant V. Sat . "Influence of Plasmonic Cu x S Interfacing Layer on Photovoltaic Performance of CIZS Quantum Dot Sensitized Solar Cells". United States. doi:10.1149/2.0221905jes.
@article{osti_1491418,
title = {Influence of Plasmonic Cu x S Interfacing Layer on Photovoltaic Performance of CIZS Quantum Dot Sensitized Solar Cells},
author = {Muthu, Senthilkumar and Zaiats, Gary and Sridharan, Moorthy Babu and Kamat, Prashant V.},
abstractNote = {},
doi = {10.1149/2.0221905jes},
journal = {Journal of the Electrochemical Society},
number = 5,
volume = 166,
place = {United States},
year = {2019},
month = {1}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1149/2.0221905jes

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Works referenced in this record:

Determination of the Electron Lifetime in Nanocrystalline Dye Solar Cells by Open-Circuit Voltage Decay Measurements
journal, August 2003

  • Zaban, Arie; Greenshtein, Miri; Bisquert, Juan
  • ChemPhysChem, Vol. 4, Issue 8, p. 859-864
  • DOI: 10.1002/cphc.200200615