Amorphization kinetics in strontium titanate at 16 and 300 K under argon ion irradiation
Here, the accumulation of irradiation-induced disorder in SrTiO3 single crystals irradiated at 16 K with 200 keV Ar ions has been investigated using Rutherford backscattering spectrometry along the < 100 > channeling direction and compared with previous results obtained at 300 K under identical irradiation conditions. As expected, amorphization at 16 K occurs at a much lower fluence than at 300 K due to dynamic recovery of irradiation-induced defects at 300 K. Utilizing a comprehensive damage accumulation model for analysis of the data, irradiation at 16 K results only in the formation of point defects and amorphous pockets, while defect clusters are also formed at 300 K. High defect mobility under irradiation at 300 K tends to promote recombination and clustering of point defects. These results suggest that defect diffusion processes in SrTiO3 are not thermally active at 16 K.
- Research Organization:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
- Grant/Contract Number:
- AC05-00OR22725
- OSTI ID:
- 1491330
- Journal Information:
- Journal of Materials Science, Journal Name: Journal of Materials Science Journal Issue: 8 Vol. 54; ISSN 0022-2461
- Publisher:
- SpringerCopyright Statement
- Country of Publication:
- United States
- Language:
- English
Controlling spontaneous emission via electronic correlations and temperature in transparent oxides
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journal | December 2019 |
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