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Title: Extending the depth of field for ptychography using complex-valued wavelets

Abstract

Ptychography is a scanning variation of the coherent diffractive imaging method for providing high-resolution quantitative images from specimen with extended dimensions. Its capability of achieving diffraction-limited spatial resolution can be compromised by the sample thickness, which is generally required to be thinner than the depth of field of the imaging system. In this Letter, we present a method to extend the depth of field for ptychography by numerically generating the focus stack from reconstructions with propagated illumination wavefronts and combining the in-focus features to a single sharp image using an algorithm based on the complex-valued discrete wavelet transform. Furthermore, this approach does not require repeated measurements by translating the sample along the optical axis as in the conventional focus stacking method, and offers a computation-efficient alternative to obtain high-resolution images with extended depth of fields, complementary to the multi-slice ptychography.

Authors:
 [1];  [1];  [2];  [1]
  1. Brookhaven National Lab. (BNL), Upton, NY (United States)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States); Univ. College London, London (United Kingdom)
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1490907
Alternate Identifier(s):
OSTI ID: 1491133
Report Number(s):
BNL-210884-2019-JAAM
Journal ID: ISSN 0146-9592; OPLEDP
Grant/Contract Number:  
SC0012704
Resource Type:
Published Article
Journal Name:
Optics Letters
Additional Journal Information:
Journal Volume: 44; Journal Issue: 3; Journal ID: ISSN 0146-9592
Publisher:
Optical Society of America (OSA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Huang, Xiaojing, Yan, Hanfei, Robinson, Ian K., and Chu, Yong S. Extending the depth of field for ptychography using complex-valued wavelets. United States: N. p., 2019. Web. doi:10.1364/OL.44.000503.
Huang, Xiaojing, Yan, Hanfei, Robinson, Ian K., & Chu, Yong S. Extending the depth of field for ptychography using complex-valued wavelets. United States. doi:10.1364/OL.44.000503.
Huang, Xiaojing, Yan, Hanfei, Robinson, Ian K., and Chu, Yong S. Wed . "Extending the depth of field for ptychography using complex-valued wavelets". United States. doi:10.1364/OL.44.000503.
@article{osti_1490907,
title = {Extending the depth of field for ptychography using complex-valued wavelets},
author = {Huang, Xiaojing and Yan, Hanfei and Robinson, Ian K. and Chu, Yong S.},
abstractNote = {Ptychography is a scanning variation of the coherent diffractive imaging method for providing high-resolution quantitative images from specimen with extended dimensions. Its capability of achieving diffraction-limited spatial resolution can be compromised by the sample thickness, which is generally required to be thinner than the depth of field of the imaging system. In this Letter, we present a method to extend the depth of field for ptychography by numerically generating the focus stack from reconstructions with propagated illumination wavefronts and combining the in-focus features to a single sharp image using an algorithm based on the complex-valued discrete wavelet transform. Furthermore, this approach does not require repeated measurements by translating the sample along the optical axis as in the conventional focus stacking method, and offers a computation-efficient alternative to obtain high-resolution images with extended depth of fields, complementary to the multi-slice ptychography.},
doi = {10.1364/OL.44.000503},
journal = {Optics Letters},
number = 3,
volume = 44,
place = {United States},
year = {2019},
month = {1}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1364/OL.44.000503

Citation Metrics:
Cited by: 1 work
Citation information provided by
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Figures / Tables:

Fig. 1 Fig. 1: Schematic experimental setup for a ptychography experiment. The depth of field in the reconstructed image is defined by the signal with the maximum scattering angle collected by the detector, which is typically narrower than the depth of focus defined by the focusing optics. The right panel shows amore » representative far-field diffraction amplitude using a x-ray beam focused by MLLs. The green and red boxes illustrate the numerical apertures determined by detection and focusing optics, respectively.« less

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Works referenced in this record:

Phase retrieval with transverse translation diversity: a nonlinear optimization approach
journal, January 2008

  • Guizar-Sicairos, Manuel; Fienup, James R.
  • Optics Express, Vol. 16, Issue 10
  • DOI: 10.1364/OE.16.007264

Three-dimensional iterative multislice reconstruction for ptychographic X-ray computed tomography
journal, January 2018

  • Shimomura, Kei; Hirose, Makoto; Higashino, Takaya
  • Optics Express, Vol. 26, Issue 24
  • DOI: 10.1364/OE.26.031199

Phase recovery and lensless imaging by iterative methods in optical, X-ray and electron diffraction
journal, May 2002

  • Spence, J. C. H.; Weierstall, U.; Howells, M.
  • Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences, Vol. 360, Issue 1794
  • DOI: 10.1098/rsta.2001.0972

Multi-slice ptychographic tomography
journal, February 2018


Precession x-ray ptychography with multislice approach
journal, June 2015


Reaching the third dimension
journal, January 2017

  • Robinson, Ian; Huang, Xiaojing
  • Nature Materials, Vol. 16, Issue 2
  • DOI: 10.1038/nmat4845

Ptychographic transmission microscopy in three dimensions using a multi-slice approach
journal, January 2012

  • Maiden, A. M.; Humphry, M. J.; Rodenburg, J. M.
  • Journal of the Optical Society of America A, Vol. 29, Issue 8
  • DOI: 10.1364/JOSAA.29.001606

Ptychographic microscope for three-dimensional imaging
journal, January 2014

  • Godden, T. M.; Suman, R.; Humphry, M. J.
  • Optics Express, Vol. 22, Issue 10
  • DOI: 10.1364/OE.22.012513

An improved ptychographical phase retrieval algorithm for diffractive imaging
journal, September 2009


Optimization of overlap uniformness for ptychography
journal, January 2014

  • Huang, Xiaojing; Yan, Hanfei; Harder, Ross
  • Optics Express, Vol. 22, Issue 10
  • DOI: 10.1364/OE.22.012634

The dual-tree complex wavelet transform
journal, November 2005

  • Selesnick, I. W.; Baraniuk, R. G.; Kingsbury, N. C.
  • IEEE Signal Processing Magazine, Vol. 22, Issue 6
  • DOI: 10.1109/MSP.2005.1550194

Influence of the overlap parameter on the convergence of the ptychographical iterative engine
journal, April 2008


Artifact mitigation of ptychography integrated with on-the-fly scanning probe microscopy
journal, July 2017

  • Huang, Xiaojing; Yan, Hanfei; Ge, Mingyuan
  • Applied Physics Letters, Vol. 111, Issue 2
  • DOI: 10.1063/1.4993744

A theory for multiresolution signal decomposition: the wavelet representation
journal, July 1989

  • Mallat, S. G.
  • IEEE Transactions on Pattern Analysis and Machine Intelligence, Vol. 11, Issue 7
  • DOI: 10.1109/34.192463

Multi-slice ptychography with large numerical aperture multilayer Laue lenses
journal, January 2018


Complex wavelets for extended depth-of-field: A new method for the fusion of multichannel microscopy images
journal, January 2004

  • Forster, Brigitte; Van De Ville, Dimitri; Berent, Jesse
  • Microscopy Research and Technique, Vol. 65, Issue 1-2
  • DOI: 10.1002/jemt.20092

Relaxation of the Crowther criterion in multislice tomography
journal, January 2018


Efficient subpixel image registration algorithms
journal, January 2008

  • Guizar-Sicairos, Manuel; Thurman, Samuel T.; Fienup, James R.
  • Optics Letters, Vol. 33, Issue 2
  • DOI: 10.1364/OL.33.000156

Orthonormal bases of compactly supported wavelets
journal, October 1988

  • Daubechies, Ingrid
  • Communications on Pure and Applied Mathematics, Vol. 41, Issue 7
  • DOI: 10.1002/cpa.3160410705

Complex Wavelets for Shift Invariant Analysis and Filtering of Signals
journal, May 2001


A review of wavelets in biomedical applications
journal, April 1996

  • Unser, M.; Aldroubi, A.
  • Proceedings of the IEEE, Vol. 84, Issue 4
  • DOI: 10.1109/5.488704

X-ray ptychography with extended depth of field
journal, January 2016

  • Tsai, Esther H. R.; Usov, Ivan; Diaz, Ana
  • Optics Express, Vol. 24, Issue 25
  • DOI: 10.1364/OE.24.029089

Extended depth of focus for transmission x-ray microscope
journal, January 2012


Sampling in x-ray ptychography
journal, May 2013


High-Resolution Scanning X-ray Diffraction Microscopy
journal, July 2008


Simple denoising algorithm using wavelet transform
journal, November 1999

  • Roy, Manojit; Kumar, V. Ravi; Kulkarni, B. D.
  • AIChE Journal, Vol. 45, Issue 11
  • DOI: 10.1002/aic.690451120

Extended Depth of Field for High-Resolution Scanning Transmission Electron Microscopy
journal, December 2010

  • Hovden, Robert; Xin, Huolin L.; Muller, David A.
  • Microscopy and Microanalysis, Vol. 17, Issue 1
  • DOI: 10.1017/S1431927610094171

Pushing the limits: an instrument for hard X-ray imaging below 20 nm
journal, January 2015


On the extended depth of focus algorithms for bright field microscopy
journal, August 2001


Image processing with complex wavelets
journal, September 1999

  • Kingsbury, Nick
  • Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences, Vol. 357, Issue 1760
  • DOI: 10.1098/rsta.1999.0447

Design and performance of an X-ray scanning microscope at the Hard X-ray Nanoprobe beamline of NSLS-II
journal, October 2017


The scattering of electrons by atoms and crystals. I. A new theoretical approach
journal, October 1957


Hard-X-Ray Lensless Imaging of Extended Objects
journal, January 2007


Merlin: a fast versatile readout system for Medipix3
journal, January 2013


Depth sectioning of individual dopant atoms with aberration-corrected scanning transmission electron microscopy
journal, January 2008

  • Xin, Huolin L.; Intaraprasonk, Varat; Muller, David A.
  • Applied Physics Letters, Vol. 92, Issue 1
  • DOI: 10.1063/1.2828990

Numerical evaluations of N -beam wave functions in electron scattering by the multi-slice method
journal, March 1974


Propagation uniqueness in three-dimensional coherent diffractive imaging
journal, June 2011


High-Resolution Multislice X-Ray Ptychography of Extended Thick Objects
journal, February 2014


Reconstruction of a yeast cell from X-ray diffraction data
journal, June 2006

  • Thibault, Pierre; Elser, Veit; Jacobsen, Chris
  • Acta Crystallographica Section A Foundations of Crystallography, Vol. 62, Issue 4
  • DOI: 10.1107/S0108767306016515

    Figures/Tables have been extracted from DOE-funded journal article accepted manuscripts.